{"id":"https://openalex.org/W2112832628","doi":"https://doi.org/10.1109/vts.2011.5783752","title":"Expedited response compaction for scan power reduction","display_name":"Expedited response compaction for scan power reduction","publication_year":2011,"publication_date":"2011-05-01","ids":{"openalex":"https://openalex.org/W2112832628","doi":"https://doi.org/10.1109/vts.2011.5783752","mag":"2112832628"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2011.5783752","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2011.5783752","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"29th VLSI Test Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081952251","display_name":"Samah Mohamed Saeed","orcid":"https://orcid.org/0000-0002-8107-3644"},"institutions":[{"id":"https://openalex.org/I90965887","display_name":"SUNY Polytechnic Institute","ror":"https://ror.org/000fxgx19","country_code":"US","type":"education","lineage":["https://openalex.org/I90965887"]},{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Samah Mohamed Saeed","raw_affiliation_strings":["Computer Science Department, Polytechnic Institute, New York University, USA","Computer Science Department, New York University - Polytechnic Institute, USA"],"affiliations":[{"raw_affiliation_string":"Computer Science Department, Polytechnic Institute, New York University, USA","institution_ids":["https://openalex.org/I90965887","https://openalex.org/I57206974"]},{"raw_affiliation_string":"Computer Science Department, New York University - Polytechnic Institute, USA","institution_ids":["https://openalex.org/I57206974"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059987567","display_name":"Ozgur Sinanoglu","orcid":"https://orcid.org/0000-0003-0782-0397"},"institutions":[{"id":"https://openalex.org/I120250893","display_name":"New York University Abu Dhabi","ror":"https://ror.org/00e5k0821","country_code":"AE","type":"education","lineage":["https://openalex.org/I120250893","https://openalex.org/I57206974"]},{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["AE","US"],"is_corresponding":false,"raw_author_name":"Ozgur Sinanoglu","raw_affiliation_strings":["Computer Engineering Department, New York University Institute, Abu Dhabi, UAE","Computer Eng. Department, New York University, Abu Dhabi, USA"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, New York University Institute, Abu Dhabi, UAE","institution_ids":["https://openalex.org/I57206974"]},{"raw_affiliation_string":"Computer Eng. Department, New York University, Abu Dhabi, USA","institution_ids":["https://openalex.org/I120250893"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5081952251"],"corresponding_institution_ids":["https://openalex.org/I57206974","https://openalex.org/I90965887"],"apc_list":null,"apc_paid":null,"fwci":1.0074,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.78312333,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"40","last_page":"45"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.7764468789100647},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.738736629486084},{"id":"https://openalex.org/keywords/compaction","display_name":"Compaction","score":0.6005553603172302},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5127716660499573},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4933258593082428},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4597494900226593},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4361025094985962},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.32574233412742615},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24203205108642578},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.165461927652359},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09742739796638489},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09689012169837952}],"concepts":[{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.7764468789100647},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.738736629486084},{"id":"https://openalex.org/C196715460","wikidata":"https://www.wikidata.org/wiki/Q1414356","display_name":"Compaction","level":2,"score":0.6005553603172302},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5127716660499573},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4933258593082428},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4597494900226593},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4361025094985962},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.32574233412742615},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24203205108642578},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.165461927652359},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09742739796638489},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09689012169837952},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C187320778","wikidata":"https://www.wikidata.org/wiki/Q1349130","display_name":"Geotechnical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2011.5783752","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2011.5783752","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"29th VLSI Test Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":55,"referenced_works":["https://openalex.org/W1491971472","https://openalex.org/W1557475698","https://openalex.org/W1557977552","https://openalex.org/W1568407911","https://openalex.org/W1660272255","https://openalex.org/W1823875934","https://openalex.org/W1900996732","https://openalex.org/W1924975623","https://openalex.org/W1952314933","https://openalex.org/W1966348745","https://openalex.org/W1972925785","https://openalex.org/W1992910892","https://openalex.org/W2079150276","https://openalex.org/W2080510479","https://openalex.org/W2095752765","https://openalex.org/W2098233999","https://openalex.org/W2100123663","https://openalex.org/W2102168889","https://openalex.org/W2106303764","https://openalex.org/W2110232289","https://openalex.org/W2112129823","https://openalex.org/W2112651657","https://openalex.org/W2125734620","https://openalex.org/W2126641963","https://openalex.org/W2130439920","https://openalex.org/W2133640956","https://openalex.org/W2135615172","https://openalex.org/W2136567303","https://openalex.org/W2136680550","https://openalex.org/W2139009001","https://openalex.org/W2139356796","https://openalex.org/W2144888713","https://openalex.org/W2146893269","https://openalex.org/W2148192475","https://openalex.org/W2150448461","https://openalex.org/W2152683841","https://openalex.org/W2154471868","https://openalex.org/W2160843080","https://openalex.org/W2165516518","https://openalex.org/W2166163625","https://openalex.org/W2168419390","https://openalex.org/W2169839635","https://openalex.org/W2888824071","https://openalex.org/W3035062237","https://openalex.org/W3152022554","https://openalex.org/W4231670536","https://openalex.org/W4232226371","https://openalex.org/W6638566545","https://openalex.org/W6639759450","https://openalex.org/W6641769569","https://openalex.org/W6675468346","https://openalex.org/W6678830865","https://openalex.org/W6680497249","https://openalex.org/W6682699350","https://openalex.org/W6684123354"],"related_works":["https://openalex.org/W3013719031","https://openalex.org/W3140187064","https://openalex.org/W2028550458","https://openalex.org/W2378755530","https://openalex.org/W585895904","https://openalex.org/W2347486132","https://openalex.org/W2004528270","https://openalex.org/W2620506035","https://openalex.org/W2485606874","https://openalex.org/W2168810991"],"abstract_inverted_index":{"Transitions":[0],"embedded":[1],"in":[2,17,28,67,109,134,137,142,162,179],"between":[3],"consecutive":[4],"stimulus/response":[5],"bits":[6],"toggle":[7],"scan":[8,19,51,74],"cells":[9],"during":[10,53,73,92,116],"shift":[11,54,97,119],"operations.":[12,75],"The":[13,145],"consequent":[14],"switching":[15],"activity":[16],"the":[18,24,36,39,45,48,83,93,106,117,166,173,176],"chains":[20,52],"further":[21],"propagate":[22],"into":[23],"combinational":[25],"logic,":[26],"resulting":[27],"elevated":[29],"power":[30,71,113,150,182],"dissipation":[31,72],"levels,":[32],"and":[33,58,136],"thus,":[34],"endangering":[35],"reliability":[37],"of":[38,50,96,175],"chip":[40],"being":[41],"tested.":[42],"Based":[43],"on":[44],"observation":[46],"that":[47],"content":[49],"operations":[55,80],"is":[56,114,124],"irrelevant":[57],"unimportant,":[59],"we":[60],"propose":[61],"an":[62],"expedited":[63],"response":[64,86],"compaction":[65,79],"technique":[66,178],"order":[68],"to":[69,104,153,159],"reduce":[70],"Parallelized":[76],"(and":[77],"expedited)":[78],"help":[81],"compress":[82],"entire":[84],"capture":[85],"onto":[87],"a":[88,100,130],"single":[89],"reference":[90],"chain":[91],"first":[94],"portion":[95],"cycles,":[98],"enabling":[99,155],"simultaneous":[101],"constant-0":[102],"feed":[103],"all":[105],"remaining":[107],"chains,":[108],"which":[110],"no":[111],"scan-out":[112],"dissipated":[115],"subsequent":[118],"cycles.":[120],"This":[121],"DfT-based":[122],"approach":[123],"nonintrusive":[125],"for":[126],"design":[127],"flow,":[128],"requires":[129],"very":[131],"minor":[132],"investment":[133],"area,":[135],"turn":[138],"delivers":[139],"significant":[140],"savings":[141],"test":[143,149,181],"power.":[144],"proposed":[146,177],"solution":[147],"reduces":[148],"without":[151],"resorting":[152],"x-filling,":[154],"orthogonal":[156],"x-filling":[157],"techniques":[158],"be":[160],"applied":[161],"conjunction,":[163],"while":[164],"retaining":[165],"observed":[167],"responses":[168],"intact.":[169],"Experimental":[170],"results":[171],"justify":[172],"efficacy":[174],"attaining":[180],"reductions.":[183]},"counts_by_year":[{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2014,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}