{"id":"https://openalex.org/W2122868642","doi":"https://doi.org/10.1109/vts.2011.5783738","title":"Multi Domain Test: Novel test strategy to reduce the Cost of Test","display_name":"Multi Domain Test: Novel test strategy to reduce the Cost of Test","publication_year":2011,"publication_date":"2011-05-01","ids":{"openalex":"https://openalex.org/W2122868642","doi":"https://doi.org/10.1109/vts.2011.5783738","mag":"2122868642"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2011.5783738","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2011.5783738","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"29th VLSI Test Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043735152","display_name":"Yasuhiro Takahashi","orcid":"https://orcid.org/0000-0002-1653-8425"},"institutions":[{"id":"https://openalex.org/I3130890911","display_name":"Kunitachi College of Music","ror":"https://ror.org/056gdnv76","country_code":"JP","type":"education","lineage":["https://openalex.org/I3130890911"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Yasuhiro Takahashi","raw_affiliation_strings":["S&S Professional Service, Verigy Japan K. K., Hachioji, Tokyo, Japan","S&S Professional Service, Verigy Japan K.K., 9-1, Takakura-cho, Hachioji, Tokyo 192-0023 Japan"],"affiliations":[{"raw_affiliation_string":"S&S Professional Service, Verigy Japan K. K., Hachioji, Tokyo, Japan","institution_ids":["https://openalex.org/I3130890911"]},{"raw_affiliation_string":"S&S Professional Service, Verigy Japan K.K., 9-1, Takakura-cho, Hachioji, Tokyo 192-0023 Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109226600","display_name":"A. Maeda","orcid":null},"institutions":[{"id":"https://openalex.org/I4210098225","display_name":"Accretech (Japan)","ror":"https://ror.org/011p1an89","country_code":"JP","type":"company","lineage":["https://openalex.org/I4210098225"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akinori Maeda","raw_affiliation_strings":["Center of Experts, Verigy Japan K. K., Hachioji, Tokyo, Japan","Center Of Experts, Verigy Japan K.K., 9-1, Takakura-cho, Hachioji, Tokyo 192-0023 Japan"],"affiliations":[{"raw_affiliation_string":"Center of Experts, Verigy Japan K. K., Hachioji, Tokyo, Japan","institution_ids":["https://openalex.org/I4210098225"]},{"raw_affiliation_string":"Center Of Experts, Verigy Japan K.K., 9-1, Takakura-cho, Hachioji, Tokyo 192-0023 Japan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5043735152"],"corresponding_institution_ids":["https://openalex.org/I3130890911"],"apc_list":null,"apc_paid":null,"fwci":0.2518,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.57827415,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"303","last_page":"308"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.8423586487770081},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6399052739143372},{"id":"https://openalex.org/keywords/test-management-approach","display_name":"Test Management Approach","score":0.5754137635231018},{"id":"https://openalex.org/keywords/test-harness","display_name":"Test harness","score":0.5378986597061157},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.49964451789855957},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.49786829948425293},{"id":"https://openalex.org/keywords/test-strategy","display_name":"Test strategy","score":0.4860427975654602},{"id":"https://openalex.org/keywords/test-suite","display_name":"Test suite","score":0.4693656265735626},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.40720194578170776},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3592328727245331},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16690507531166077},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.11287012696266174},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.06823107600212097},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.06473416090011597}],"concepts":[{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.8423586487770081},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6399052739143372},{"id":"https://openalex.org/C7435765","wikidata":"https://www.wikidata.org/wiki/Q7705776","display_name":"Test Management Approach","level":5,"score":0.5754137635231018},{"id":"https://openalex.org/C109852812","wikidata":"https://www.wikidata.org/wiki/Q2406355","display_name":"Test harness","level":5,"score":0.5378986597061157},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.49964451789855957},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.49786829948425293},{"id":"https://openalex.org/C188598960","wikidata":"https://www.wikidata.org/wiki/Q7705805","display_name":"Test strategy","level":3,"score":0.4860427975654602},{"id":"https://openalex.org/C151552104","wikidata":"https://www.wikidata.org/wiki/Q7705809","display_name":"Test suite","level":4,"score":0.4693656265735626},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.40720194578170776},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3592328727245331},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16690507531166077},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.11287012696266174},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.06823107600212097},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.06473416090011597},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C149091818","wikidata":"https://www.wikidata.org/wiki/Q2429814","display_name":"Software system","level":3,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2011.5783738","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2011.5783738","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"29th VLSI Test Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1516422828","https://openalex.org/W1884658820","https://openalex.org/W2055037451","https://openalex.org/W2138645566"],"related_works":["https://openalex.org/W2588043699","https://openalex.org/W2243231242","https://openalex.org/W2387651257","https://openalex.org/W3114223219","https://openalex.org/W4389236635","https://openalex.org/W2497772001","https://openalex.org/W3175215928","https://openalex.org/W2236654242","https://openalex.org/W2122987706","https://openalex.org/W2049871268"],"abstract_inverted_index":{"The":[0],"Multi-Domain-Test":[1],"is":[2,53],"the":[3,13,16,32,36,50],"new":[4],"test":[5,21,23],"strategy":[6],"to":[7,29],"resolve":[8],"problems":[9],"and":[10,15],"limitations":[11],"of":[12,31,39],"Multi-Site-Test":[14,51],"Concurrent-Test.":[17],"By":[18],"this":[19],"novel":[20],"strategy,":[22],"time":[24],"can":[25,46],"be":[26,47],"reduced":[27],"down":[28],"50%":[30],"Single-Site-Test":[33],"with":[34],"almost":[35],"same":[37],"amount":[38],"tester":[40],"resources.":[41],"Cost":[42],"Of":[43],"Test":[44],"(COT)":[45],"lower":[48],"than":[49],"that":[52],"well":[54],"used":[55],"at":[56],"productions.":[57]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}