{"id":"https://openalex.org/W2160343175","doi":"https://doi.org/10.1109/vts.2011.5783731","title":"Revival of partial scan: Test cube analysis driven conversion of flip-flops","display_name":"Revival of partial scan: Test cube analysis driven conversion of flip-flops","publication_year":2011,"publication_date":"2011-05-01","ids":{"openalex":"https://openalex.org/W2160343175","doi":"https://doi.org/10.1109/vts.2011.5783731","mag":"2160343175"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2011.5783731","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2011.5783731","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"29th VLSI Test Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5023092571","display_name":"Nader Alawadhi","orcid":null},"institutions":[{"id":"https://openalex.org/I36721946","display_name":"Kuwait University","ror":"https://ror.org/021e5j056","country_code":"KW","type":"education","lineage":["https://openalex.org/I36721946"]}],"countries":["KW"],"is_corresponding":true,"raw_author_name":"Nader Alawadhi","raw_affiliation_strings":["[Computer Science Dept, Kuwait University, Kuwait]"],"affiliations":[{"raw_affiliation_string":"[Computer Science Dept, Kuwait University, Kuwait]","institution_ids":["https://openalex.org/I36721946"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059987567","display_name":"Ozgur Sinanoglu","orcid":"https://orcid.org/0000-0003-0782-0397"},"institutions":[{"id":"https://openalex.org/I57206974","display_name":"New York University","ror":"https://ror.org/0190ak572","country_code":"US","type":"education","lineage":["https://openalex.org/I57206974"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ozgur Sinanoglu","raw_affiliation_strings":["Computer Engineering Department, New York University Abu Dhabi, USA"],"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, New York University Abu Dhabi, USA","institution_ids":["https://openalex.org/I57206974"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5023092571"],"corresponding_institution_ids":["https://openalex.org/I36721946"],"apc_list":null,"apc_paid":null,"fwci":1.5112,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.84442111,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"260","last_page":"265"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.8751670718193054},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.7655601501464844},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.7258127927780151},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5926440358161926},{"id":"https://openalex.org/keywords/observability","display_name":"Observability","score":0.5769614577293396},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5490973591804504},{"id":"https://openalex.org/keywords/cube","display_name":"Cube (algebra)","score":0.4787016212940216},{"id":"https://openalex.org/keywords/flops","display_name":"FLOPS","score":0.4427473247051239},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.43656620383262634},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4292066991329193},{"id":"https://openalex.org/keywords/sequential-logic","display_name":"Sequential logic","score":0.4163203537464142},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.2456912398338318},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.23564288020133972},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20922422409057617},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.19955086708068848},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.19489982724189758},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1795363426208496}],"concepts":[{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.8751670718193054},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.7655601501464844},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.7258127927780151},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5926440358161926},{"id":"https://openalex.org/C36299963","wikidata":"https://www.wikidata.org/wiki/Q1369844","display_name":"Observability","level":2,"score":0.5769614577293396},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5490973591804504},{"id":"https://openalex.org/C53051483","wikidata":"https://www.wikidata.org/wiki/Q861555","display_name":"Cube (algebra)","level":2,"score":0.4787016212940216},{"id":"https://openalex.org/C3826847","wikidata":"https://www.wikidata.org/wiki/Q188768","display_name":"FLOPS","level":2,"score":0.4427473247051239},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.43656620383262634},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4292066991329193},{"id":"https://openalex.org/C187075797","wikidata":"https://www.wikidata.org/wiki/Q173245","display_name":"Sequential logic","level":3,"score":0.4163203537464142},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.2456912398338318},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.23564288020133972},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20922422409057617},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.19955086708068848},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.19489982724189758},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1795363426208496},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2011.5783731","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2011.5783731","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"29th VLSI Test Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5699999928474426}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":38,"referenced_works":["https://openalex.org/W1570685651","https://openalex.org/W1788992564","https://openalex.org/W1822961975","https://openalex.org/W1910876692","https://openalex.org/W1969130484","https://openalex.org/W1972173228","https://openalex.org/W1983621102","https://openalex.org/W1989255534","https://openalex.org/W2032997462","https://openalex.org/W2047986181","https://openalex.org/W2072555249","https://openalex.org/W2097844290","https://openalex.org/W2098300587","https://openalex.org/W2102559735","https://openalex.org/W2106669085","https://openalex.org/W2108161550","https://openalex.org/W2108376128","https://openalex.org/W2108561948","https://openalex.org/W2111667834","https://openalex.org/W2116254096","https://openalex.org/W2119691242","https://openalex.org/W2134283834","https://openalex.org/W2134626087","https://openalex.org/W2135129887","https://openalex.org/W2135627440","https://openalex.org/W2135665388","https://openalex.org/W2140826730","https://openalex.org/W2140868550","https://openalex.org/W2149483871","https://openalex.org/W2155487883","https://openalex.org/W2156643581","https://openalex.org/W2160162958","https://openalex.org/W2162765824","https://openalex.org/W2164296477","https://openalex.org/W2170457429","https://openalex.org/W4285719527","https://openalex.org/W6638020508","https://openalex.org/W6680184922"],"related_works":["https://openalex.org/W2789883751","https://openalex.org/W2147986372","https://openalex.org/W1979305473","https://openalex.org/W2274367941","https://openalex.org/W2075356617","https://openalex.org/W2074302528","https://openalex.org/W2092894550","https://openalex.org/W2019719714","https://openalex.org/W2105463797","https://openalex.org/W4233954302"],"abstract_inverted_index":{"Increasing":[0],"complexity":[1],"of":[2,56,74,79,86,90,101,130,139,155],"integrated":[3],"circuits":[4],"has":[5],"forced":[6],"the":[7,50,54,57,61,72,84,102,107,113,117,124,128,137,140,145],"industry":[8],"to":[9,23,59,67,96,109,119],"abandon":[10],"partial":[11,37,68,156,164],"scan,":[12,69],"which":[13,188],"necessitates":[14],"a":[15,36,42,87,98],"computationally":[16,43],"demanding":[17],"and":[18,22,63,70,150,169,184],"unaffordable":[19],"sequential":[20],"ATPG,":[21],"rather":[24],"adopt":[25],"full":[26,131],"scan":[27,38,91,114,165],"despite":[28],"its":[29],"costs.":[30],"In":[31],"this":[32],"paper,":[33],"we":[34],"propose":[35],"scheme":[39,135,166],"driven":[40,163],"by":[41],"efficient":[44],"test":[45,80,103,148,151,160,175,181,185],"cube":[46,81,161],"analysis.":[47],"We":[48],"tackle":[49],"challenges":[51],"associated":[52],"with":[53,71,144,173],"identification":[55,85],"conditions":[58,76],"restore":[60],"controllability":[62],"observability":[64],"compromised":[65],"due":[66],"formulation":[73],"these":[75],"in":[77,192],"terms":[78],"operations.":[82],"Upon":[83],"maximal-sized":[88],"set":[89],"flip-flops":[92],"that":[93],"are":[94],"converted":[95],"non-scan,":[97],"simple":[99],"post-processing":[100],"cubes":[104],"helps":[105],"compute":[106],"values":[108],"be":[110,190],"loaded":[111],"into":[112],"flip-flops,":[115],"eliminating":[116],"need":[118],"re-run":[120],"ATPG":[121,142],"while":[122],"at":[123],"same":[125],"time":[126],"ensuring":[127],"quality":[129],"scan.":[132,157],"The":[133,158],"proposed":[134,159],"combines":[136],"simplicity":[138],"conventional":[141],"flow":[143],"area,":[146],"performance,":[147],"time,":[149],"power":[152,186],"reduction":[153,177],"benefits":[154],"analysis":[162],"is":[167],"orthogonal":[168],"thus":[170],"fully":[171],"compatible":[172],"other":[174],"cost":[176],"techniques,":[178],"such":[179],"as":[180],"data":[182],"compression":[183],"reduction,":[187],"can":[189],"applied":[191],"conjunction.":[193]},"counts_by_year":[{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}