{"id":"https://openalex.org/W2112146416","doi":"https://doi.org/10.1109/vts.2002.1011166","title":"Layout analysis to extract open nets caused by systematic failure mechanisms","display_name":"Layout analysis to extract open nets caused by systematic failure mechanisms","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2112146416","doi":"https://doi.org/10.1109/vts.2002.1011166","mag":"2112146416"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2002.1011166","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2002.1011166","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5087206490","display_name":"S. Chakravarty","orcid":"https://orcid.org/0000-0002-3682-2060"},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Chakravarty","raw_affiliation_strings":["Intel Corporation, Santa Clara, CA, USA","Intel Corp., Santa Clara, CA, , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp., Santa Clara, CA, , USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5031818900","display_name":"K. Komeyli","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"K. Komeyli","raw_affiliation_strings":["Intel Corporation, Santa Clara, CA, USA","Intel Corp., Santa Clara, CA, , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp., Santa Clara, CA, , USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075025030","display_name":"E.W. Savage","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E.W. Savage","raw_affiliation_strings":["Intel Corporation, Santa Clara, CA, USA","Intel Corp., Santa Clara, CA, , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp., Santa Clara, CA, , USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077681881","display_name":"M.J. Carruthers","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"M.J. Carruthers","raw_affiliation_strings":["Intel Corporation, Santa Clara, CA, USA","Intel Corp., Santa Clara, CA, , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp., Santa Clara, CA, , USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078368254","display_name":"B.T. Stastny","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"B.T. Stastny","raw_affiliation_strings":["Intel Corporation, Santa Clara, CA, USA","Intel Corp., Santa Clara, CA, , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp., Santa Clara, CA, , USA","institution_ids":["https://openalex.org/I1343180700"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016040904","display_name":"S.T. Zachariah","orcid":null},"institutions":[{"id":"https://openalex.org/I1343180700","display_name":"Intel (United States)","ror":"https://ror.org/01ek73717","country_code":"US","type":"company","lineage":["https://openalex.org/I1343180700"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S.T. Zachariah","raw_affiliation_strings":["Intel Corporation, Santa Clara, CA, USA","Intel Corp., Santa Clara, CA, , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Intel Corporation, Santa Clara, CA, USA","institution_ids":["https://openalex.org/I1343180700"]},{"raw_affiliation_string":"Intel Corp., Santa Clara, CA, , USA","institution_ids":["https://openalex.org/I1343180700"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I1343180700"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"367","last_page":"372"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6142188906669617},{"id":"https://openalex.org/keywords/net","display_name":"Net (polyhedron)","score":0.6008803844451904},{"id":"https://openalex.org/keywords/class","display_name":"Class (philosophy)","score":0.5300400257110596},{"id":"https://openalex.org/keywords/open-source","display_name":"Open source","score":0.4193105101585388},{"id":"https://openalex.org/keywords/plug-and-play","display_name":"Plug and play","score":0.4176045060157776},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3769066333770752},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3752252161502838},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.2811434268951416},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19640636444091797},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.16141340136528015},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.1548999845981598},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.13464030623435974},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.08078506588935852}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6142188906669617},{"id":"https://openalex.org/C14166107","wikidata":"https://www.wikidata.org/wiki/Q253829","display_name":"Net (polyhedron)","level":2,"score":0.6008803844451904},{"id":"https://openalex.org/C2777212361","wikidata":"https://www.wikidata.org/wiki/Q5127848","display_name":"Class (philosophy)","level":2,"score":0.5300400257110596},{"id":"https://openalex.org/C3018397939","wikidata":"https://www.wikidata.org/wiki/Q3644502","display_name":"Open source","level":3,"score":0.4193105101585388},{"id":"https://openalex.org/C2780070844","wikidata":"https://www.wikidata.org/wiki/Q857815","display_name":"Plug and play","level":2,"score":0.4176045060157776},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3769066333770752},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3752252161502838},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.2811434268951416},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19640636444091797},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.16141340136528015},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.1548999845981598},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.13464030623435974},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.08078506588935852},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2002.1011166","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2002.1011166","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1775604791","https://openalex.org/W1908637464","https://openalex.org/W1958909498","https://openalex.org/W2097651365","https://openalex.org/W2107180895","https://openalex.org/W2109768518","https://openalex.org/W2121147757","https://openalex.org/W2129212061","https://openalex.org/W2133741188","https://openalex.org/W2138223068","https://openalex.org/W2154418718","https://openalex.org/W2155701360","https://openalex.org/W2172010278","https://openalex.org/W6676248284"],"related_works":["https://openalex.org/W2912321008","https://openalex.org/W1998607122","https://openalex.org/W2324368075","https://openalex.org/W2972124131","https://openalex.org/W338149487","https://openalex.org/W4403012196","https://openalex.org/W2972032537","https://openalex.org/W150363521","https://openalex.org/W3154107650","https://openalex.org/W2029283450"],"abstract_inverted_index":{"Previously":[0],"published":[1],"work":[2],"has":[3],"pointed":[4],"out":[5],"that":[6,59,67],"open":[7,70],"defects":[8],"are":[9,24],"escaping":[10],"test":[11],"screens.":[12],"To":[13],"plug":[14],"this":[15,79],"hole,":[16],"tests":[17],"directed":[18],"at":[19],"nets":[20,28],"susceptible":[21,29],"to":[22,30,33,69,74,91],"opens":[23,31],"required,":[25],"and,":[26],"therefore,":[27],"need":[32],"be":[34],"identified.":[35],"Opens":[36],"caused":[37],"by":[38],"random":[39],"particles":[40],"have":[41,50,92],"been":[42,51],"modeled":[43],"using":[44,78],"weighted":[45],"critical":[46],"area":[47],"(WCA)":[48],"and":[49],"previously":[52],"studied.":[53],"Here,":[54],"we":[55],"present":[56],"a":[57,61],"model":[58,80],"abstracts":[60],"class":[62],"of":[63],"systematic":[64],"failure":[65],"mechanisms":[66],"leads":[68],"nets.":[71],"An":[72],"algorithm":[73,90],"calculate":[75],"net":[76],"scores":[77],"is":[81],"presented.":[82],"Experimental":[83],"results":[84],"on":[85],"industrial":[86],"designs":[87],"show":[88],"the":[89],"reasonable":[93],"performance.":[94]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}