{"id":"https://openalex.org/W2144428190","doi":"https://doi.org/10.1109/vts.2002.1011165","title":"Power supply transient signal analysis under real process and test hardware models","display_name":"Power supply transient signal analysis under real process and test hardware models","publication_year":2003,"publication_date":"2003-06-25","ids":{"openalex":"https://openalex.org/W2144428190","doi":"https://doi.org/10.1109/vts.2002.1011165","mag":"2144428190"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2002.1011165","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2002.1011165","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5059412977","display_name":"A.K. Singh","orcid":"https://orcid.org/0000-0002-1536-9594"},"institutions":[{"id":"https://openalex.org/I79272384","display_name":"University of Maryland, Baltimore County","ror":"https://ror.org/02qskvh78","country_code":"US","type":"education","lineage":["https://openalex.org/I79272384"]},{"id":"https://openalex.org/I126744593","display_name":"University of Maryland, Baltimore","ror":"https://ror.org/04rq5mt64","country_code":"US","type":"education","lineage":["https://openalex.org/I126744593"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"A. Singh","raw_affiliation_strings":["CSEE, University of Maryland, Baltimore, USA","CSEE, Univ. of Maryland Baltimore County, MD, USA"],"affiliations":[{"raw_affiliation_string":"CSEE, University of Maryland, Baltimore, USA","institution_ids":["https://openalex.org/I126744593"]},{"raw_affiliation_string":"CSEE, Univ. of Maryland Baltimore County, MD, USA","institution_ids":["https://openalex.org/I79272384"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029774084","display_name":"Jim Plusquellic","orcid":"https://orcid.org/0000-0002-1876-117X"},"institutions":[{"id":"https://openalex.org/I126744593","display_name":"University of Maryland, Baltimore","ror":"https://ror.org/04rq5mt64","country_code":"US","type":"education","lineage":["https://openalex.org/I126744593"]},{"id":"https://openalex.org/I79272384","display_name":"University of Maryland, Baltimore County","ror":"https://ror.org/02qskvh78","country_code":"US","type":"education","lineage":["https://openalex.org/I79272384"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Plusquellic","raw_affiliation_strings":["CSEE, University of Maryland, Baltimore, USA","CSEE, Univ. of Maryland Baltimore County, MD, USA"],"affiliations":[{"raw_affiliation_string":"CSEE, University of Maryland, Baltimore, USA","institution_ids":["https://openalex.org/I126744593"]},{"raw_affiliation_string":"CSEE, Univ. of Maryland Baltimore County, MD, USA","institution_ids":["https://openalex.org/I79272384"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026865205","display_name":"Anne Gattiker","orcid":null},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]},{"id":"https://openalex.org/I4210156936","display_name":"IBM Research - Austin","ror":"https://ror.org/05gjbbg60","country_code":"US","type":"facility","lineage":["https://openalex.org/I1341412227","https://openalex.org/I4210114115","https://openalex.org/I4210156936"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Gattiker","raw_affiliation_strings":["IBM Austin Research Laboratory, USA","IBM-Austin Research Labs"],"affiliations":[{"raw_affiliation_string":"IBM Austin Research Laboratory, USA","institution_ids":["https://openalex.org/I4210156936"]},{"raw_affiliation_string":"IBM-Austin Research Labs","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5059412977"],"corresponding_institution_ids":["https://openalex.org/I126744593","https://openalex.org/I79272384"],"apc_list":null,"apc_paid":null,"fwci":2.767,"has_fulltext":false,"cited_by_count":14,"citation_normalized_percentile":{"value":0.90784218,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"357","last_page":"362"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6947020888328552},{"id":"https://openalex.org/keywords/skew","display_name":"Skew","score":0.6885719299316406},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.6728086471557617},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6613530516624451},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5832251310348511},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5700571537017822},{"id":"https://openalex.org/keywords/power-integrity","display_name":"Power integrity","score":0.5604239106178284},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5223337411880493},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5066881775856018},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4690437912940979},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.46419987082481384},{"id":"https://openalex.org/keywords/automatic-test-equipment","display_name":"Automatic test equipment","score":0.42392539978027344},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3002001643180847},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2778654992580414},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.227752685546875},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.20019036531448364},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.15757977962493896}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6947020888328552},{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.6885719299316406},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6728086471557617},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6613530516624451},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5832251310348511},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5700571537017822},{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.5604239106178284},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5223337411880493},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5066881775856018},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4690437912940979},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.46419987082481384},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.42392539978027344},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3002001643180847},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2778654992580414},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.227752685546875},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.20019036531448364},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.15757977962493896},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2002.1011165","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2002.1011165","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6299999952316284,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1581259538","https://openalex.org/W1750005981","https://openalex.org/W2003654230","https://openalex.org/W2125671371","https://openalex.org/W2133866340","https://openalex.org/W2144061903","https://openalex.org/W2144440997","https://openalex.org/W2145419015","https://openalex.org/W2197000251","https://openalex.org/W6681202723"],"related_works":["https://openalex.org/W2965410099","https://openalex.org/W4235454973","https://openalex.org/W4386105410","https://openalex.org/W2250058922","https://openalex.org/W1987899475","https://openalex.org/W2148913576","https://openalex.org/W3097351224","https://openalex.org/W4250319866","https://openalex.org/W2385649681","https://openalex.org/W4312198714"],"abstract_inverted_index":{"A":[0],"device":[1],"testing":[2,18,88],"method":[3],"called":[4],"Transient":[5],"Signal":[6],"Analysis":[7],"(TSA)":[8],"is":[9,63],"subjected":[10],"to":[11,27,65],"elements":[12,85],"of":[13,31,38,45,86,100,104],"a":[14,39,87,98],"real":[15,40],"process":[16,32,71],"and":[17,56],"environment":[19,89],"in":[20,47,108],"this":[21],"paper.":[22],"Simulation":[23],"experiments":[24],"are":[25,94],"designed":[26,64],"determine":[28],"the":[29,43,91,102],"effects":[30,103],"skew":[33],"(obtained":[34],"from":[35,51],"measured":[36],"parameters":[37,76],"process)":[41],"on":[42],"accuracy":[44],"TSA":[46,67],"estimating":[48],"path":[49],"delays":[50],"power":[52],"supply":[53],"I/sub":[54],"DDT/":[55,58],"V/sub":[57,80],"waveforms.":[59],"The":[60],"circuit":[61],"model":[62],"test":[66],"under":[68],"deep":[69],"submicron":[70],"models":[72],"that":[73],"incorporate":[74],"advanced":[75],"such":[77],"as":[78,97],"transistor":[79],"t/":[81],"width":[82],"dependencies.":[83],"Modeling":[84],"including":[90],"probe":[92],"card":[93],"subsequently":[95],"introduced":[96],"means":[99],"evaluating":[101],"tester":[105],"measurement":[106],"noise":[107],"an":[109],"actual":[110],"implementation.":[111]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}