{"id":"https://openalex.org/W2163977230","doi":"https://doi.org/10.1109/vts.2002.1011164","title":"Measuring stray capacitance on tester hardware","display_name":"Measuring stray capacitance on tester hardware","publication_year":2002,"publication_date":"2002-01-01","ids":{"openalex":"https://openalex.org/W2163977230","doi":"https://doi.org/10.1109/vts.2002.1011164","mag":"2163977230"},"language":"en","primary_location":{"id":"doi:10.1109/vts.2002.1011164","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2002.1011164","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067831800","display_name":"Arnab Halder","orcid":"https://orcid.org/0000-0003-3606-3532"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Halder","raw_affiliation_strings":["Georgia Institute of Technology, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108228322","display_name":"P.N. Variyam","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. Variyam","raw_affiliation_strings":["Texas Instruments, Inc., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., USA","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Chatterjee","raw_affiliation_strings":["Georgia Institute of Technology, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Institute of Technology, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016592315","display_name":"John Ridley","orcid":"https://orcid.org/0000-0002-2722-7390"},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. Ridley","raw_affiliation_strings":["Texas Instruments, Inc., USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., USA","institution_ids":["https://openalex.org/I74760111"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.2312557,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":94,"max":96},"biblio":{"volume":"3","issue":null,"first_page":"351","last_page":"356"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/parasitic-capacitance","display_name":"Parasitic capacitance","score":0.8990747928619385},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.8683446645736694},{"id":"https://openalex.org/keywords/electrical-capacitance-tomography","display_name":"Electrical capacitance tomography","score":0.5196745991706848},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5170824527740479},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4881058633327484},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4762042760848999},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.4740590453147888},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4490887224674225},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3897475004196167},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38266557455062866},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.106326162815094}],"concepts":[{"id":"https://openalex.org/C154318817","wikidata":"https://www.wikidata.org/wiki/Q2157249","display_name":"Parasitic capacitance","level":4,"score":0.8990747928619385},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.8683446645736694},{"id":"https://openalex.org/C2777418626","wikidata":"https://www.wikidata.org/wiki/Q2584887","display_name":"Electrical capacitance tomography","level":4,"score":0.5196745991706848},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5170824527740479},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4881058633327484},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4762042760848999},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.4740590453147888},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4490887224674225},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3897475004196167},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38266557455062866},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.106326162815094},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vts.2002.1011164","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vts.2002.1011164","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1511183853","https://openalex.org/W2074589780","https://openalex.org/W2084128131","https://openalex.org/W2160260236","https://openalex.org/W2539694288","https://openalex.org/W2981451160","https://openalex.org/W6630731722","https://openalex.org/W6683476367"],"related_works":["https://openalex.org/W2056641994","https://openalex.org/W2065013354","https://openalex.org/W1974831921","https://openalex.org/W2362942457","https://openalex.org/W2009640073","https://openalex.org/W1973400749","https://openalex.org/W2364971604","https://openalex.org/W1971900134","https://openalex.org/W2393881606","https://openalex.org/W2390661837"],"abstract_inverted_index":{"Parasitic":[0],"capacitance":[1,28,54,81,89],"in":[2,100],"test":[3,11,56],"hardware":[4,57,103],"can":[5],"affect":[6],"the":[7,26,76,111],"performance":[8],"of":[9,55,75,113],"a":[10,42,67,72],"and":[12,61,71,85,97,107],"lead":[13],"to":[14,51,95],"poor":[15],"fault":[16],"coverage":[17],"and/or":[18],"yield":[19],"loss.":[20],"In":[21,37],"an":[22],"ATE":[23,77],"setup,":[24],"characterizing":[25],"stray":[27,53,80],"using":[29],"external":[30],"instruments":[31],"is":[32,92],"difficult":[33],"for":[34,78],"practical":[35],"reasons.":[36],"this":[38,114],"paper,":[39],"we":[40],"present":[41],"single":[43],"probe":[44],"technique":[45,91,115],"that":[46],"uses":[47,66],"available":[48],"tester":[49,102],"resources":[50],"measure":[52],"with":[58],"high":[59],"accuracy":[60],"precision.":[62],"The":[63],"proposed":[64],"method":[65],"time":[68],"measurement":[69,90],"sub-system":[70],"current":[73],"source":[74],"measuring":[79],"from":[82],"their":[83],"charging":[84],"discharging":[86],"characteristics.":[87],"This":[88],"also":[93],"used":[94],"detect":[96],"diagnose":[98],"faults":[99],"different":[101],"components.":[104],"Measurement":[105],"results":[106],"case":[108],"studies":[109],"on":[110],"application":[112],"are":[116],"presented.":[117]},"counts_by_year":[{"year":2014,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}