{"id":"https://openalex.org/W2130785928","doi":"https://doi.org/10.1109/vtest.2004.1299254","title":"Feature extraction based built-in alternate test of RF components using a noise reference","display_name":"Feature extraction based built-in alternate test of RF components using a noise reference","publication_year":2004,"publication_date":"2004-06-10","ids":{"openalex":"https://openalex.org/W2130785928","doi":"https://doi.org/10.1109/vtest.2004.1299254","mag":"2130785928"},"language":"en","primary_location":{"id":"doi:10.1109/vtest.2004.1299254","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2004.1299254","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"22nd IEEE VLSI Test Symposium, 2004. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040842842","display_name":"S. Sermet Akbay","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S.S. Akbay","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA","Sch. of Electr. & Comput. Eng.,, Georgia Inst. of Technol., Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Sch. of Electr. & Comput. Eng.,, Georgia Inst. of Technol., Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Chatterjee","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA","Sch. of Electr. & Comput. Eng.,, Georgia Inst. of Technol., Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Sch. of Electr. & Comput. Eng.,, Georgia Inst. of Technol., Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5040842842"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":6.5826,"has_fulltext":false,"cited_by_count":42,"citation_normalized_percentile":{"value":0.97155161,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"273","last_page":"278"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/undersampling","display_name":"Undersampling","score":0.6462494134902954},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6454710960388184},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5880664587020874},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.5345657467842102},{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"Low-noise amplifier","score":0.4962542653083801},{"id":"https://openalex.org/keywords/bandwidth","display_name":"Bandwidth (computing)","score":0.45885756611824036},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.35937073826789856},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2932831048965454},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.14150014519691467},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.13524934649467468}],"concepts":[{"id":"https://openalex.org/C136536468","wikidata":"https://www.wikidata.org/wiki/Q1225894","display_name":"Undersampling","level":2,"score":0.6462494134902954},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6454710960388184},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5880664587020874},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.5345657467842102},{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.4962542653083801},{"id":"https://openalex.org/C2776257435","wikidata":"https://www.wikidata.org/wiki/Q1576430","display_name":"Bandwidth (computing)","level":2,"score":0.45885756611824036},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.35937073826789856},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2932831048965454},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.14150014519691467},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.13524934649467468}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vtest.2004.1299254","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2004.1299254","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"22nd IEEE VLSI Test Symposium, 2004. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.4399999976158142}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1591509466","https://openalex.org/W1667165204","https://openalex.org/W1672819356","https://openalex.org/W1839443115","https://openalex.org/W1996021349","https://openalex.org/W2018742520","https://openalex.org/W2028504835","https://openalex.org/W2034714147","https://openalex.org/W2036488048","https://openalex.org/W2046245205","https://openalex.org/W2102201073","https://openalex.org/W2102771100","https://openalex.org/W2116080338","https://openalex.org/W2116915114","https://openalex.org/W2118479728","https://openalex.org/W2129463449","https://openalex.org/W2131610230","https://openalex.org/W2135742206","https://openalex.org/W2146842127","https://openalex.org/W2156213538","https://openalex.org/W2162674845","https://openalex.org/W2167896761","https://openalex.org/W2270294147","https://openalex.org/W2563824095","https://openalex.org/W4232477441"],"related_works":["https://openalex.org/W2109073422","https://openalex.org/W2887783772","https://openalex.org/W2101754595","https://openalex.org/W4249381695","https://openalex.org/W2534887053","https://openalex.org/W2026172757","https://openalex.org/W2080076470","https://openalex.org/W4389292014","https://openalex.org/W2394059563","https://openalex.org/W2017942469"],"abstract_inverted_index":{"This":[0],"paper":[1],"addresses":[2],"the":[3,77,110,118],"cost,":[4],"signal":[5,41],"integrity":[6],"and":[7,44,72,94,117,144],"I/O":[8],"bandwidth":[9],"problems":[10],"in":[11,35],"radio-frequency":[12,32],"testing":[13],"by":[14],"proposing":[15],"a":[16,36,62,113,121,139,145],"feature":[17],"extraction":[18],"based":[19],"built-in":[20,29,51],"alternate":[21,70],"test":[22,52,71],"scheme.":[23],"The":[24,66,99,135],"scheme":[25,101],"is":[26],"suitable":[27],"for":[28,54,112,124,131,138],"self-test":[30],"of":[31,104,120,153,157],"components":[33],"embedded":[34],"system":[37],"with":[38],"available":[39],"digital":[40,64],"processing":[42],"resources,":[43],"can":[45],"also":[46],"be":[47],"extended":[48],"to":[49,61,80,108,129],"implement":[50],"solutions":[53],"individual":[55],"RF":[56],"devices":[57],"that":[58],"have":[59],"access":[60],"low-end":[63],"tester.":[65],"process":[67],"applies":[68],"an":[69,151],"automatically":[73],"extracts":[74],"features":[75],"from":[76],"component":[78],"response":[79],"predict":[81],"specifications":[82,158],"like":[83],"third":[84],"order":[85],"intercept":[86],"point,":[87,90],"1dB":[88],"compression":[89],"noise":[91,122],"figure,":[92],"gain":[93],"power":[95],"supply":[96],"rejection":[97],"ratio.":[98],"proposed":[100],"makes":[102,126],"use":[103,119],"low-speed":[105],"low-resolution":[106],"undersampling":[107],"eliminate":[109],"need":[111],"bulky":[114],"analog-to-digital":[115],"converter":[116],"reference":[123],"comparison":[125],"it":[127],"possible":[128],"compensate":[130],"imperfect":[132],"stimulus":[133],"generation.":[134],"simulation":[136],"results":[137],"1":[140],"GHz":[141],"downconversion":[142],"mixer":[143],"900":[146],"MHz":[147],"low-noise":[148],"amplifier":[149],"present":[150],"average":[152],"97.3%":[154],"prediction":[155],"accuracy":[156],"under":[159],"test.":[160]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}