{"id":"https://openalex.org/W2129808596","doi":"https://doi.org/10.1109/vtest.2004.1299253","title":"A scalable on-chip jitter extraction technique","display_name":"A scalable on-chip jitter extraction technique","publication_year":2004,"publication_date":"2004-06-10","ids":{"openalex":"https://openalex.org/W2129808596","doi":"https://doi.org/10.1109/vtest.2004.1299253","mag":"2129808596"},"language":"en","primary_location":{"id":"doi:10.1109/vtest.2004.1299253","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2004.1299253","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"22nd IEEE VLSI Test Symposium, 2004. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082664384","display_name":"Chee-Kian Ong","orcid":null},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Chee-Kian Ong","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078128275","display_name":"Dongwoo Hong","orcid":"https://orcid.org/0000-0002-8553-4276"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dongwoo Hong","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077687075","display_name":"Kwang\u2010Ting Cheng","orcid":"https://orcid.org/0000-0002-3885-4912"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kwang-Ting Cheng","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100369642","display_name":"Li-C. Wang","orcid":"https://orcid.org/0000-0003-4851-8004"},"institutions":[{"id":"https://openalex.org/I154570441","display_name":"University of California, Santa Barbara","ror":"https://ror.org/02t274463","country_code":"US","type":"education","lineage":["https://openalex.org/I154570441"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"L.-C. Wang","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of California, Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]},{"raw_affiliation_string":"Dept. of Electr. & Comput. Eng., California Univ. Santa Barbara, CA, USA","institution_ids":["https://openalex.org/I154570441"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5082664384"],"corresponding_institution_ids":["https://openalex.org/I154570441"],"apc_list":null,"apc_paid":null,"fwci":2.3041,"has_fulltext":false,"cited_by_count":11,"citation_normalized_percentile":{"value":0.88403482,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"4","issue":null,"first_page":"267","last_page":"272"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11429","display_name":"Semiconductor Lasers and Optical Devices","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/jitter","display_name":"Jitter","score":0.8748076558113098},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.6897271871566772},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6785626411437988},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.6164671182632446},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.59542316198349},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5436673760414124},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5235016942024231},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.5122355818748474},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3561747670173645},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1274668574333191},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1075839102268219},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.08166208863258362}],"concepts":[{"id":"https://openalex.org/C134652429","wikidata":"https://www.wikidata.org/wiki/Q1052698","display_name":"Jitter","level":2,"score":0.8748076558113098},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.6897271871566772},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6785626411437988},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.6164671182632446},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.59542316198349},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5436673760414124},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5235016942024231},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5122355818748474},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3561747670173645},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1274668574333191},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1075839102268219},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.08166208863258362},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/vtest.2004.1299253","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2004.1299253","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"22nd IEEE VLSI Test Symposium, 2004. Proceedings.","raw_type":"proceedings-article"},{"id":"pmh:oai:repository.hkust.edu.hk:1783.1-77817","is_oa":false,"landing_page_url":"http://repository.hkust.edu.hk/ir/Record/1783.1-77817","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Conference paper"},{"id":"pmh:oai:repository.ust.hk:1783.1-77817","is_oa":false,"landing_page_url":"http://repository.ust.hk/ir/Record/1783.1-77817","pdf_url":null,"source":{"id":"https://openalex.org/S4306401796","display_name":"Rare & Special e-Zone (The Hong Kong University of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I200769079","host_organization_name":"Hong Kong University of Science and Technology","host_organization_lineage":["https://openalex.org/I200769079"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference paper"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":35,"referenced_works":["https://openalex.org/W53803208","https://openalex.org/W1490491299","https://openalex.org/W1537447520","https://openalex.org/W1564182845","https://openalex.org/W1714506282","https://openalex.org/W1865455350","https://openalex.org/W1870817321","https://openalex.org/W1891123279","https://openalex.org/W1971886777","https://openalex.org/W1991013228","https://openalex.org/W2021145888","https://openalex.org/W2045058214","https://openalex.org/W2102972772","https://openalex.org/W2106743564","https://openalex.org/W2112803887","https://openalex.org/W2116954913","https://openalex.org/W2118803820","https://openalex.org/W2121955149","https://openalex.org/W2124283149","https://openalex.org/W2126574816","https://openalex.org/W2127383597","https://openalex.org/W2130122989","https://openalex.org/W2132989621","https://openalex.org/W2140391578","https://openalex.org/W2140609219","https://openalex.org/W2144401740","https://openalex.org/W2147922245","https://openalex.org/W2162364319","https://openalex.org/W2164594991","https://openalex.org/W2169485688","https://openalex.org/W2169790941","https://openalex.org/W2987221203","https://openalex.org/W4232276540","https://openalex.org/W6633837627","https://openalex.org/W6643003162"],"related_works":["https://openalex.org/W2121182846","https://openalex.org/W2155789024","https://openalex.org/W2315668284","https://openalex.org/W3213608175","https://openalex.org/W2109491806","https://openalex.org/W3117675750","https://openalex.org/W2141743053","https://openalex.org/W2037276323","https://openalex.org/W3095633856","https://openalex.org/W2058044441"],"abstract_inverted_index":{"In":[0],"this":[1,108],"paper,":[2],"we":[3],"propose":[4],"a":[5,13,59,62,72,119],"method":[6,18,86,109],"for":[7,40,81],"extracting":[8],"the":[9,30,36,48,56,76,113],"spectral":[10,41],"information":[11],"of":[12,32,35,50,58,118],"multi-gigahertz":[14,37,120],"jittery":[15],"signal.":[16,74,121],"This":[17,85],"utilizes":[19],"existing":[20,99],"on-chip":[21],"single-shot":[22],"period":[23,31,49,57],"measurement":[24,65,97],"techniques":[25],"to":[26,70],"sample":[27],"and":[28,115],"measure":[29,71],"multiple":[33,51],"cycles":[34],"periodic":[38],"signal":[39],"analysis.":[42],"Since":[43],"measurements":[44],"are":[45],"made":[46],"on":[47,55,104],"cycles,":[52],"but":[53],"not":[54,88],"single":[60],"cycle,":[61],"lower-speed":[63],"timing":[64],"circuitry":[66],"can":[67,110],"be":[68],"used":[69],"higher-speed":[73,83],"Therefore,":[75],"proposed":[77],"solution":[78],"is":[79],"scalable":[80],"even":[82],"signals.":[84],"does":[87],"require":[89],"an":[90],"external":[91],"sampling":[92],"clock,":[93],"nor":[94],"any":[95],"additional":[96],"beyond":[98],"techniques.":[100],"Experimental":[101],"results":[102],"based":[103],"simulation":[105],"show":[106],"that":[107],"accurately":[111],"estimate":[112],"sinusoidal":[114],"random":[116],"jitters":[117]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}