{"id":"https://openalex.org/W2115785325","doi":"https://doi.org/10.1109/vtest.2004.1299248","title":"System-level testing of RF transmitter specifications using optimized periodic bitstreams","display_name":"System-level testing of RF transmitter specifications using optimized periodic bitstreams","publication_year":2004,"publication_date":"2004-06-10","ids":{"openalex":"https://openalex.org/W2115785325","doi":"https://doi.org/10.1109/vtest.2004.1299248","mag":"2115785325"},"language":"en","primary_location":{"id":"doi:10.1109/vtest.2004.1299248","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2004.1299248","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"22nd IEEE VLSI Test Symposium, 2004. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5055709845","display_name":"S. Bhattacharya","orcid":"https://orcid.org/0000-0002-8767-2584"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"S. Bhattacharya","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology, Atlanta, GA, USA","Sch. of Electr. & Comput. Eng.,, Georgia Inst. of Technol., Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Sch. of Electr. & Comput. Eng.,, Georgia Inst. of Technol., Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":null,"display_name":"G. Srinivasan","orcid":null},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"G. Srinivasan","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology, Atlanta, GA, USA","Sch. of Electr. & Comput. Eng.,, Georgia Inst. of Technol., Atlanta, GA, USA"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Sch. of Electr. & Comput. Eng.,, Georgia Inst. of Technol., Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053712861","display_name":"S. Cherubal","orcid":null},"institutions":[{"id":"https://openalex.org/I74760111","display_name":"Texas Instruments (United States)","ror":"https://ror.org/03vsmv677","country_code":"US","type":"company","lineage":["https://openalex.org/I74760111"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Cherubal","raw_affiliation_strings":["Texas Instruments, Inc., Dallas, TX, USA","Texas Instruments Dallas, TX"],"affiliations":[{"raw_affiliation_string":"Texas Instruments, Inc., Dallas, TX, USA","institution_ids":["https://openalex.org/I74760111"]},{"raw_affiliation_string":"Texas Instruments Dallas, TX","institution_ids":["https://openalex.org/I74760111"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067831800","display_name":"Arnab Halder","orcid":"https://orcid.org/0000-0003-3606-3532"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Halder","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology, Atlanta, GA, USA","Georgia Institute of Technology , Atlanta#TAB#"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology , Atlanta#TAB#","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103180343","display_name":"A. Chatterjee","orcid":"https://orcid.org/0000-0002-2856-0160"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"A. Chatterjee","raw_affiliation_strings":["School of ECE, Georgia Institute of Technology, Atlanta, GA, USA","Georgia Institute of Technology , Atlanta#TAB#"],"affiliations":[{"raw_affiliation_string":"School of ECE, Georgia Institute of Technology, Atlanta, GA, USA","institution_ids":["https://openalex.org/I130701444"]},{"raw_affiliation_string":"Georgia Institute of Technology , Atlanta#TAB#","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5055709845"],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":3.4436,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":{"value":0.92155425,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"229","last_page":"234"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11248","display_name":"Advanced Power Amplifier Design","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transmitter","display_name":"Transmitter","score":0.7882078886032104},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6101606488227844},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.573573887348175},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.5506812334060669},{"id":"https://openalex.org/keywords/bitstream","display_name":"Bitstream","score":0.45525607466697693},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.41253039240837097},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.39624202251434326},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3068872094154358},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.17930364608764648},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17869612574577332},{"id":"https://openalex.org/keywords/decoding-methods","display_name":"Decoding methods","score":0.09418556094169617}],"concepts":[{"id":"https://openalex.org/C47798520","wikidata":"https://www.wikidata.org/wiki/Q190157","display_name":"Transmitter","level":3,"score":0.7882078886032104},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6101606488227844},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.573573887348175},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.5506812334060669},{"id":"https://openalex.org/C136695289","wikidata":"https://www.wikidata.org/wiki/Q415568","display_name":"Bitstream","level":3,"score":0.45525607466697693},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.41253039240837097},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.39624202251434326},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3068872094154358},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.17930364608764648},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17869612574577332},{"id":"https://openalex.org/C57273362","wikidata":"https://www.wikidata.org/wiki/Q576722","display_name":"Decoding methods","level":2,"score":0.09418556094169617}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vtest.2004.1299248","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2004.1299248","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"22nd IEEE VLSI Test Symposium, 2004. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1766888123","https://openalex.org/W2006683603","https://openalex.org/W2102201073","https://openalex.org/W2128438455","https://openalex.org/W2340429540","https://openalex.org/W2478884216","https://openalex.org/W2984428336","https://openalex.org/W3015302834"],"related_works":["https://openalex.org/W2119626116","https://openalex.org/W1994765432","https://openalex.org/W4393107225","https://openalex.org/W2005006301","https://openalex.org/W2352380146","https://openalex.org/W2037887240","https://openalex.org/W2130100961","https://openalex.org/W2186699851","https://openalex.org/W2502435347","https://openalex.org/W2059628469"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,50,121,150],"novel":[4],"algorithm":[5],"has":[6],"been":[7],"proposed":[8,128],"to":[9,84,149],"measure":[10],"system":[11,42],"specifications":[12,28,68,145],"of":[13,21,26,36,69,102,104,115,123,134,153,156],"an":[14,55,132],"integrated":[15],"transmitter,":[16],"which":[17],"capture":[18],"the":[19,22,34,40,67,91,100,105,127,143,157],"non-linearities":[20],"system-under-test.":[23],"The":[24,113],"measurement":[25],"these":[27,32],"is":[29],"important,":[30],"as":[31],"determine":[33],"amount":[35],"\"interference\"":[37],"created":[38],"by":[39,98,120],"transmitting":[41,47],"in":[43,49,111,137],"adjacent":[44],"channels":[45],"while":[46,142],"data":[48],"specific":[51],"channel.":[52],"By":[53],"using":[54,126],"optimized":[56],"periodic":[57],"bit":[58],"stream,":[59],"with":[60],"energy":[61],"concentrated":[62],"at":[63],"fewer":[64,75],"frequencies,":[65],"all":[66],"interest":[70],"are":[71],"measured.":[72],"This":[73],"requires":[74],"measurements":[76,117],"and":[77],"hence,":[78],"significantly":[79],"reduced":[80,96,119],"test":[81,86,92,116,138],"time":[82,93,139],"compared":[83],"standard":[85],"techniques.":[87],"Studies":[88],"show":[89],"that":[90],"can":[94],"be":[95],"considerably":[97],"changing":[99],"number":[101,114],"periods":[103],"optimum":[106],"bit-sequence":[107],"without":[108],"losing":[109],"accuracy":[110,152],"measurement.":[112],"was":[118,140],"factor":[122],"two.":[124],"Overall,":[125],"approach,":[129],"more":[130],"than":[131],"order":[133],"magnitude":[135],"reduction":[136],"achieved,":[141],"different":[144],"were":[146],"measured":[147],"up":[148],"maximum":[151],"/spl":[154],"plusmn/0.2%":[155],"actual":[158],"value.":[159]},"counts_by_year":[{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-04-16T08:26:57.006410","created_date":"2025-10-10T00:00:00"}