{"id":"https://openalex.org/W2105182837","doi":"https://doi.org/10.1109/vtest.2004.1299228","title":"Changing the scan enable during shift","display_name":"Changing the scan enable during shift","publication_year":2004,"publication_date":"2004-06-10","ids":{"openalex":"https://openalex.org/W2105182837","doi":"https://doi.org/10.1109/vtest.2004.1299228","mag":"2105182837"},"language":"en","primary_location":{"id":"doi:10.1109/vtest.2004.1299228","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2004.1299228","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"22nd IEEE VLSI Test Symposium, 2004. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020461594","display_name":"N. Sitchinava","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"N. Sitchinava","raw_affiliation_strings":["Synopsys, Inc., Mountain View, CA, USA","Synopsys, Inc. Mountain View, CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]},{"raw_affiliation_string":"Synopsys, Inc. Mountain View, CA USA","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075292776","display_name":"Samitha Samaranayake","orcid":"https://orcid.org/0000-0002-5459-3898"},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"S. Samaranayake","raw_affiliation_strings":["Synopsys, Inc., Mountain View, CA, USA","Synopsys, Inc. Mountain View, CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]},{"raw_affiliation_string":"Synopsys, Inc. Mountain View, CA USA","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113108497","display_name":"R. Kapur","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"R. Kapur","raw_affiliation_strings":["Synopsys, Inc., Mountain View, CA, USA","Synopsys, Inc. Mountain View, CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]},{"raw_affiliation_string":"Synopsys, Inc. Mountain View, CA USA","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007706124","display_name":"Emil Gizdarski","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"E. Gizdarski","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA","Synopsys, Inc. Mountain View, CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]},{"raw_affiliation_string":"Synopsys, Inc. Mountain View, CA USA","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072452862","display_name":"F. Neuveux","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"F. Neuveux","raw_affiliation_strings":["Synopsys, Inc., Mountain View, CA, USA","Synopsys, Inc. Mountain View, CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]},{"raw_affiliation_string":"Synopsys, Inc. Mountain View, CA USA","institution_ids":["https://openalex.org/I1335490905"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109761500","display_name":"T.W. Williams","orcid":null},"institutions":[{"id":"https://openalex.org/I1335490905","display_name":"Synopsys (Switzerland)","ror":"https://ror.org/03mb54f81","country_code":"CH","type":"company","lineage":["https://openalex.org/I1335490905","https://openalex.org/I4210088951"]},{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["CH","US"],"is_corresponding":false,"raw_author_name":"T.W. Williams","raw_affiliation_strings":["Synopsys, Inc., Mountain View, CA, USA","Synopsys, Inc. Mountain View, CA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]},{"raw_affiliation_string":"Synopsys, Inc. Mountain View, CA USA","institution_ids":["https://openalex.org/I1335490905"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":4.5051,"has_fulltext":false,"cited_by_count":72,"citation_normalized_percentile":{"value":0.94406448,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"73","last_page":"78"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.8817514181137085},{"id":"https://openalex.org/keywords/boundary-scan","display_name":"Boundary scan","score":0.7723514437675476},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6839417219161987},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.5764825940132141},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.5606724619865417},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.5568535923957825},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.4908231198787689},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.45863378047943115},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.39431506395339966},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1978432536125183},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.1933123767375946},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12722048163414001},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.11082625389099121},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07966423034667969}],"concepts":[{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.8817514181137085},{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.7723514437675476},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6839417219161987},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5764825940132141},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.5606724619865417},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.5568535923957825},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4908231198787689},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.45863378047943115},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.39431506395339966},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1978432536125183},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.1933123767375946},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12722048163414001},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.11082625389099121},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07966423034667969},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vtest.2004.1299228","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2004.1299228","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"22nd IEEE VLSI Test Symposium, 2004. Proceedings.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5199999809265137,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1763985980","https://openalex.org/W1863819993","https://openalex.org/W1953724919","https://openalex.org/W2094594388","https://openalex.org/W2107800433","https://openalex.org/W2123172689","https://openalex.org/W2129679288","https://openalex.org/W2130149750","https://openalex.org/W2134998505","https://openalex.org/W2164719222","https://openalex.org/W6678547431"],"related_works":["https://openalex.org/W2117171289","https://openalex.org/W1852363244","https://openalex.org/W2127184179","https://openalex.org/W1974621628","https://openalex.org/W1501621551","https://openalex.org/W2001654810","https://openalex.org/W2172250424","https://openalex.org/W3088373974","https://openalex.org/W2012436574","https://openalex.org/W2105536286"],"abstract_inverted_index":{"This":[0,74],"paper":[1,78],"extends":[2],"the":[3,17,25,35,40,47,59,71,76,84,94],"reconfigurable":[4],"shared":[5],"scan-in":[6],"architecture":[7],"(RSSA)":[8],"to":[9,13,69],"provide":[10],"additional":[11],"ability":[12],"change":[14],"values":[15],"on":[16,28,104],"scan":[18,26,41,72,85,95],"configuration":[19],"signals":[20],"(scan":[21],"enable":[22,86],"signals)":[23],"during":[24,93],"operation":[27,96],"a":[29,63,89,98],"per-shift":[30],"basis.":[31],"We":[32],"show":[33],"that":[34,82],"extra":[36],"flexibility":[37],"of":[38,49,79,97],"reconfiguring":[39],"chains":[42],"every":[43],"shift":[44],"cycle":[45],"reduces":[46],"number":[48],"different":[50],"configurations":[51],"required":[52],"by":[53],"RSSA":[54],"while":[55],"keeping":[56],"test":[57,90,99],"coverage":[58],"same.":[60],"In":[61],"addition":[62],"simpler":[64],"analysis":[65],"can":[66],"be":[67],"used":[68],"construct":[70],"chains.":[73],"is":[75],"first":[77],"its":[80],"kind":[81],"treats":[83],"signal":[87,92],"as":[88,107,109],"data":[91],"pattern.":[100],"Results":[101],"are":[102],"presented":[103],"some":[105],"ISCAS":[106],"well":[108],"industrial":[110],"circuits.":[111]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":3},{"year":2012,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}