{"id":"https://openalex.org/W2126157463","doi":"https://doi.org/10.1109/vtest.2004.1299223","title":"A statistical fault coverage metric for realistic path delay faults","display_name":"A statistical fault coverage metric for realistic path delay faults","publication_year":2004,"publication_date":"2004-01-01","ids":{"openalex":"https://openalex.org/W2126157463","doi":"https://doi.org/10.1109/vtest.2004.1299223","mag":"2126157463"},"language":"en","primary_location":{"id":"doi:10.1109/vtest.2004.1299223","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2004.1299223","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"22nd IEEE VLSI Test Symposium, 2004. Proceedings.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5026748165","display_name":"Wangqi Qiu","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Wangqi Qiu","raw_affiliation_strings":["Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA","Department of Computer Science, Texas A&M University, College Station, TX, USA"],"affiliations":[{"raw_affiliation_string":"Dept. of Comput. Sci., Texas A&M Univ., College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Department of Computer Science, Texas A&M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084907779","display_name":"Xiang L\u00fc","orcid":"https://orcid.org/0000-0001-7169-7771"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiang Lu","raw_affiliation_strings":["Department of Electrical Engineering, Texas A and M University, College Station, TX, USA","[Department of Electrical Engineering, Texas A and M University, College Station, TX, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"[Department of Electrical Engineering, Texas A and M University, College Station, TX, USA]","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100378632","display_name":"Jing Wang","orcid":"https://orcid.org/0000-0003-0182-0353"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Jing Wang","raw_affiliation_strings":["Department of Computer Science, Texas A and M University, College Station, TX, USA","Dept. of Comput. Sci., Texas A & M Univ., College Station, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Dept. of Comput. Sci., Texas A & M Univ., College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010176022","display_name":"Zhuo Li","orcid":"https://orcid.org/0000-0002-4345-5764"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhuo Li","raw_affiliation_strings":["Department of Electrical Engineering, Texas A and M University, College Station, TX, USA","[Department of Electrical Engineering, Texas A and M University, College Station, TX, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"[Department of Electrical Engineering, Texas A and M University, College Station, TX, USA]","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027337337","display_name":"D.M.H. Walker","orcid":"https://orcid.org/0000-0002-4839-3830"},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"D.M.H. Walker","raw_affiliation_strings":["Department of Computer Science, Texas A and M University, College Station, TX, USA","Dept. of Comput. Sci., Texas A & M Univ., College Station, TX, USA"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"Dept. of Comput. Sci., Texas A & M Univ., College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100899003","display_name":"Weiping Shi","orcid":null},"institutions":[{"id":"https://openalex.org/I91045830","display_name":"Texas A&M University","ror":"https://ror.org/01f5ytq51","country_code":"US","type":"education","lineage":["https://openalex.org/I91045830"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Weiping Shi","raw_affiliation_strings":["Department of Electrical Engineering, Texas A and M University, College Station, TX, USA","[Department of Electrical Engineering, Texas A and M University, College Station, TX, USA]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, Texas A and M University, College Station, TX, USA","institution_ids":["https://openalex.org/I91045830"]},{"raw_affiliation_string":"[Department of Electrical Engineering, Texas A and M University, College Station, TX, USA]","institution_ids":["https://openalex.org/I91045830"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5026748165"],"corresponding_institution_ids":["https://openalex.org/I91045830"],"apc_list":null,"apc_paid":null,"fwci":2.6409,"has_fulltext":false,"cited_by_count":32,"citation_normalized_percentile":{"value":0.89155892,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"37","last_page":"42"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9940000176429749,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6880098581314087},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.67676842212677},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.6630920171737671},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5881420373916626},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.580674409866333},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.535273015499115},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.46260368824005127},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3889201283454895},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3705374300479889},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.326924592256546},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.2439664602279663},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.16209223866462708},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.08548140525817871},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.06101378798484802}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6880098581314087},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.67676842212677},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.6630920171737671},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5881420373916626},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.580674409866333},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.535273015499115},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.46260368824005127},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3889201283454895},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3705374300479889},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.326924592256546},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.2439664602279663},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.16209223866462708},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.08548140525817871},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.06101378798484802},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/vtest.2004.1299223","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2004.1299223","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"22nd IEEE VLSI Test Symposium, 2004. Proceedings.","raw_type":"proceedings-article"},{"id":"pmh:oai:CiteSeerX.psu:10.1.1.219.3352","is_oa":false,"landing_page_url":"http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.219.3352","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://www.cs.tamu.edu/faculty/walker/5yrPapers/VTS_DelayCov_042004.pdf","raw_type":"text"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":33,"referenced_works":["https://openalex.org/W13277579","https://openalex.org/W63318650","https://openalex.org/W1761424569","https://openalex.org/W1951549801","https://openalex.org/W1968835137","https://openalex.org/W1991398325","https://openalex.org/W2005319125","https://openalex.org/W2051282887","https://openalex.org/W2061946964","https://openalex.org/W2097410912","https://openalex.org/W2099882073","https://openalex.org/W2113101477","https://openalex.org/W2115483211","https://openalex.org/W2126324865","https://openalex.org/W2126949806","https://openalex.org/W2129021480","https://openalex.org/W2131692902","https://openalex.org/W2131924443","https://openalex.org/W2135802341","https://openalex.org/W2137012712","https://openalex.org/W2138317689","https://openalex.org/W2149602237","https://openalex.org/W2149966432","https://openalex.org/W2166294071","https://openalex.org/W2168517735","https://openalex.org/W2169295286","https://openalex.org/W4233515289","https://openalex.org/W4246680480","https://openalex.org/W4254271670","https://openalex.org/W6600530048","https://openalex.org/W6602516640","https://openalex.org/W6674503701","https://openalex.org/W6679109355"],"related_works":["https://openalex.org/W2051500795","https://openalex.org/W1986800855","https://openalex.org/W2024194466","https://openalex.org/W3148663848","https://openalex.org/W2278517150","https://openalex.org/W4256030018","https://openalex.org/W3150960233","https://openalex.org/W2061946964","https://openalex.org/W2147400189","https://openalex.org/W2157545815"],"abstract_inverted_index":{"The":[0],"path":[1,28,61,92,131],"delay":[2,11,22,29,62,93,118,132],"fault":[3,23,30,39,63,94,128,133],"model":[4,9],"is":[5,47,54,72,97,110],"the":[6,15,50,59,100,126],"most":[7],"realistic":[8,91],"for":[10,69],"faults.":[12],"Testing":[13],"all":[14],"paths":[16,46],"in":[17,36,112,123],"a":[18,43,88],"circuit":[19,70,78],"achieves":[20],"100%":[21],"coverage":[24,31,40,64,95,134],"according":[25],"to":[26,74],"traditional":[27,60,130],"metrics.":[32,135],"These":[33],"metrics":[34],"result":[35],"unrealistically":[37],"low":[38],"if":[41],"only":[42],"subset":[44],"of":[45,65,83,102,114],"tested,":[48],"and":[49,90,116,129],"real":[51],"test":[52,68,105],"quality":[53,101],"not":[55],"reflected.":[56],"For":[57],"example,":[58],"any":[66],"practical":[67],"c6288":[71],"close":[73],"0":[75],"because":[76],"this":[77,86,121],"has":[79],"an":[80],"exponential":[81],"number":[82],"paths.":[84],"In":[85],"paper,":[87],"statistical":[89],"metric":[96],"presented.":[98],"Then":[99],"several":[103],"existing":[104],"sets":[106],"(path":[107],"selection":[108],"methods)":[109],"evaluated":[111],"terms":[113],"local":[115],"global":[117],"faults":[119],"using":[120],"metric,":[122],"comparison":[124],"with":[125],"transition":[127]},"counts_by_year":[{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":3}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}