{"id":"https://openalex.org/W2122877993","doi":"https://doi.org/10.1109/vtest.2003.1197637","title":"DSP-based statistical self test of on-chip converters","display_name":"DSP-based statistical self test of on-chip converters","publication_year":2003,"publication_date":"2003-10-31","ids":{"openalex":"https://openalex.org/W2122877993","doi":"https://doi.org/10.1109/vtest.2003.1197637","mag":"2122877993"},"language":"en","primary_location":{"id":"doi:10.1109/vtest.2003.1197637","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2003.1197637","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 21st VLSI Test Symposium, 2003.","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111875390","display_name":"Hak-soo Yu","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Hak-soo Yu","raw_affiliation_strings":["Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA","Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112799931","display_name":"Sungbae Hwang","orcid":null},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sungbae Hwang","raw_affiliation_strings":["Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA","Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5068070739","display_name":"Jacob A. Abraham","orcid":"https://orcid.org/0000-0002-5336-5631"},"institutions":[{"id":"https://openalex.org/I86519309","display_name":"The University of Texas at Austin","ror":"https://ror.org/00hj54h04","country_code":"US","type":"education","lineage":["https://openalex.org/I86519309"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J.A. Abraham","raw_affiliation_strings":["Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA","Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Research Center, University of Texas, Austin, Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]},{"raw_affiliation_string":"Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA","institution_ids":["https://openalex.org/I86519309"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I86519309"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"83","last_page":"88"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.9207965135574341},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.6648041009902954},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5966426730155945},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5253645181655884},{"id":"https://openalex.org/keywords/parametric-statistics","display_name":"Parametric statistics","score":0.4842343330383301},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4826653301715851},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.46152180433273315},{"id":"https://openalex.org/keywords/delta-sigma-modulation","display_name":"Delta-sigma modulation","score":0.46045923233032227},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.37330362200737},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13022387027740479},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.12751802802085876},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1264120638370514},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.09583213925361633}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.9207965135574341},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.6648041009902954},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5966426730155945},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5253645181655884},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.4842343330383301},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4826653301715851},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.46152180433273315},{"id":"https://openalex.org/C68754193","wikidata":"https://www.wikidata.org/wiki/Q1184820","display_name":"Delta-sigma modulation","level":3,"score":0.46045923233032227},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.37330362200737},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13022387027740479},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.12751802802085876},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1264120638370514},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.09583213925361633},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vtest.2003.1197637","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2003.1197637","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 21st VLSI Test Symposium, 2003.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1494738794","https://openalex.org/W1531446014","https://openalex.org/W1857383444","https://openalex.org/W1995265485","https://openalex.org/W2043443884","https://openalex.org/W2098778494","https://openalex.org/W2101752872","https://openalex.org/W2104554794","https://openalex.org/W2109911518","https://openalex.org/W2128726980","https://openalex.org/W2134605754","https://openalex.org/W2184277408","https://openalex.org/W6649170871"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W4313452936","https://openalex.org/W2097026685","https://openalex.org/W2480068220","https://openalex.org/W2102542442","https://openalex.org/W2103861456","https://openalex.org/W3183433566","https://openalex.org/W1541346708","https://openalex.org/W4240663242","https://openalex.org/W1527371844"],"abstract_inverted_index":{"We":[0,43,66],"propose":[1],"a":[2,28,32,45],"DSP-based":[3],"statistical":[4],"self":[5],"test":[6,76],"approach":[7],"for":[8,47],"testing":[9,48],"on-chip":[10,69],"data":[11],"converters.":[12],"Analog":[13],"to":[14,20,74,114],"digital":[15,19,70],"converters":[16,22,49,111],"(ADCs)":[17],"and":[18],"analog":[21],"(DACs)":[23],"can":[24],"be":[25],"tested":[26],"in":[27,50],"loop-back":[29,51],"mode,":[30],"providing":[31],"go/no-go":[33],"result;":[34],"however":[35],"such":[36],"tests":[37],"focus":[38],"on":[39,90],"catastrophic":[40,63],"fault":[41,64],"coverage.":[42,65],"develop":[44],"technique":[46],"mode":[52],"which":[53,94],"is":[54,83,95],"simple,":[55],"but":[56],"has":[57],"good":[58],"parametric":[59],"as":[60,62],"well":[61],"use":[67,87],"the":[68,81,86,91,116,119],"signal":[71],"processing":[72],"unit":[73,93],"generate":[75],"stimuli.":[77],"The":[78],"analysis":[79],"of":[80,88,97,106,118],"results":[82],"done":[84],"through":[85],"software":[89],"DSP":[92],"capable":[96],"monitoring":[98],"primary":[99],"inputs,":[100],"outputs":[101],"and/or":[102],"internal":[103],"nodes.":[104],"Characterization":[105],"actual":[107],"/spl":[108],"Delta//spl":[109],"Sigma/":[110],"was":[112],"performed":[113],"show":[115],"feasibility":[117],"proposed":[120],"method.":[121]},"counts_by_year":[{"year":2024,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}