{"id":"https://openalex.org/W2123172689","doi":"https://doi.org/10.1109/vtest.2003.1197627","title":"A reconfigurable shared scan-in architecture","display_name":"A reconfigurable shared scan-in architecture","publication_year":2003,"publication_date":"2003-10-31","ids":{"openalex":"https://openalex.org/W2123172689","doi":"https://doi.org/10.1109/vtest.2003.1197627","mag":"2123172689"},"language":"en","primary_location":{"id":"doi:10.1109/vtest.2003.1197627","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2003.1197627","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 21st VLSI Test Symposium, 2003.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/1721.1/87890","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075292776","display_name":"Samitha Samaranayake","orcid":"https://orcid.org/0000-0002-5459-3898"},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"S. Samaranayake","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007706124","display_name":"Emil Gizdarski","orcid":null},"institutions":[{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"E. Gizdarski","raw_affiliation_strings":["Synopsys, Inc., Mountain View, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020461594","display_name":"N. Sitchinava","orcid":null},"institutions":[{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"N. Sitchinava","raw_affiliation_strings":["Synopsys, Inc., Mountain View, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072452862","display_name":"F. Neuveux","orcid":null},"institutions":[{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"F. Neuveux","raw_affiliation_strings":["Synopsys, Inc., Mountain View, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113108497","display_name":"R. Kapur","orcid":null},"institutions":[{"id":"https://openalex.org/I63966007","display_name":"Massachusetts Institute of Technology","ror":"https://ror.org/042nb2s44","country_code":"US","type":"education","lineage":["https://openalex.org/I63966007"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"R. Kapur","raw_affiliation_strings":["Massachusetts Institute of Technology, Cambridge, MA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Massachusetts Institute of Technology, Cambridge, MA, USA","institution_ids":["https://openalex.org/I63966007"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109761500","display_name":"T.W. Williams","orcid":null},"institutions":[{"id":"https://openalex.org/I4210088951","display_name":"Synopsys (United States)","ror":"https://ror.org/013by2m91","country_code":"US","type":"company","lineage":["https://openalex.org/I4210088951"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"T.W. Williams","raw_affiliation_strings":["Synopsys, Inc., Mountain View, CA, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Synopsys, Inc., Mountain View, CA, USA","institution_ids":["https://openalex.org/I4210088951"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":6.4414,"has_fulltext":false,"cited_by_count":88,"citation_normalized_percentile":{"value":0.96856287,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"9","last_page":"14"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/control-reconfiguration","display_name":"Control reconfiguration","score":0.7423465251922607},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.7367112636566162},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6669654846191406},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.6251153945922852},{"id":"https://openalex.org/keywords/architecture","display_name":"Architecture","score":0.6147761940956116},{"id":"https://openalex.org/keywords/compatibility","display_name":"Compatibility (geochemistry)","score":0.5866035223007202},{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.5139951109886169},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4323365092277527},{"id":"https://openalex.org/keywords/test-data","display_name":"Test data","score":0.42476287484169006},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.3998066186904907},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3806281089782715},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.35597407817840576},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.33631956577301025},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.24589687585830688},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.17605486512184143},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.16183170676231384}],"concepts":[{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.7423465251922607},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.7367112636566162},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6669654846191406},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.6251153945922852},{"id":"https://openalex.org/C123657996","wikidata":"https://www.wikidata.org/wiki/Q12271","display_name":"Architecture","level":2,"score":0.6147761940956116},{"id":"https://openalex.org/C2778648169","wikidata":"https://www.wikidata.org/wiki/Q967768","display_name":"Compatibility (geochemistry)","level":2,"score":0.5866035223007202},{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.5139951109886169},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4323365092277527},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.42476287484169006},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.3998066186904907},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3806281089782715},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.35597407817840576},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.33631956577301025},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.24589687585830688},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.17605486512184143},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.16183170676231384},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C42360764","wikidata":"https://www.wikidata.org/wiki/Q83588","display_name":"Chemical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/vtest.2003.1197627","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtest.2003.1197627","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings. 21st VLSI Test Symposium, 2003.","raw_type":"proceedings-article"},{"id":"pmh:oai:dspace.mit.edu:1721.1/87890","is_oa":true,"landing_page_url":"http://hdl.handle.net/1721.1/87890","pdf_url":null,"source":{"id":"https://openalex.org/S4306400425","display_name":"DSpace@MIT (Massachusetts Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63966007","host_organization_name":"Massachusetts Institute of Technology","host_organization_lineage":["https://openalex.org/I63966007"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Thesis"}],"best_oa_location":{"id":"pmh:oai:dspace.mit.edu:1721.1/87890","is_oa":true,"landing_page_url":"http://hdl.handle.net/1721.1/87890","pdf_url":null,"source":{"id":"https://openalex.org/S4306400425","display_name":"DSpace@MIT (Massachusetts Institute of Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I63966007","host_organization_name":"Massachusetts Institute of Technology","host_organization_lineage":["https://openalex.org/I63966007"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Thesis"},"sustainable_development_goals":[{"score":0.550000011920929,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W187540573","https://openalex.org/W1554885925","https://openalex.org/W1763985980","https://openalex.org/W1838570031","https://openalex.org/W1854778394","https://openalex.org/W1863819993","https://openalex.org/W1945071860","https://openalex.org/W1985440524","https://openalex.org/W2004437077","https://openalex.org/W2043949919","https://openalex.org/W2066974842","https://openalex.org/W2071316512","https://openalex.org/W2094594388","https://openalex.org/W2099814124","https://openalex.org/W2105282021","https://openalex.org/W2107800433","https://openalex.org/W2111761265","https://openalex.org/W2117154146","https://openalex.org/W2118562464","https://openalex.org/W2123887421","https://openalex.org/W2129679288","https://openalex.org/W2130149750","https://openalex.org/W2134470583","https://openalex.org/W2134998505","https://openalex.org/W2138127140","https://openalex.org/W2138530143","https://openalex.org/W2140283778","https://openalex.org/W2153705063","https://openalex.org/W2162223996","https://openalex.org/W2164719222","https://openalex.org/W2165132030","https://openalex.org/W3152051615","https://openalex.org/W6607550507","https://openalex.org/W6638804629"],"related_works":["https://openalex.org/W2789883751","https://openalex.org/W2147986372","https://openalex.org/W1979305473","https://openalex.org/W2274367941","https://openalex.org/W2075356617","https://openalex.org/W2143881398","https://openalex.org/W2074302528","https://openalex.org/W2019719714","https://openalex.org/W2160753176","https://openalex.org/W2035832568"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"an":[3],"efficient":[4],"technique":[5],"for":[6,96,115],"test":[7,56,60,72,78,97,101],"data":[8,57,98],"volume":[9,58,99],"reduction":[10],"based":[11],"on":[12,38],"the":[13,20,39,66,109,112],"shared":[14],"scan-in":[15],"(Illinois":[16],"Scan)":[17,25],"architecture":[18,26,31,114],"and":[19,47,59,100],"scan":[21,43,91],"chain":[22],"reconfiguration":[23],"(Dynamic":[24],"is":[27,32,70],"defined.":[28],"The":[29,63,105],"composite":[30],"created":[33],"with":[34],"analysis":[35,46,49],"that":[36],"relies":[37],"compatibility":[40,48],"relation":[41],"of":[42,65,90,111],"chains.":[44],"Topological":[45],"are":[50],"used":[51],"to":[52,71],"maximize":[53],"gains":[54],"in":[55,76],"application":[61,102],"time.":[62],"goal":[64],"proposed":[67,113],"synthesis":[68],"procedure":[69],"all":[73],"detectable":[74],"faults":[75],"broadcast":[77],"mode":[79],"using":[80],"minimum":[81],"scan-chain":[82],"configurations.":[83],"As":[84],"a":[85],"result,":[86],"more":[87],"aggressive":[88],"sharing":[89],"inputs":[92],"can":[93],"be":[94],"applied":[95],"time":[103],"reduction.":[104],"experimental":[106],"results":[107],"demonstrate":[108],"efficiency":[110],"real-industrial":[116],"circuits.":[117]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":6},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":3}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}