{"id":"https://openalex.org/W4414648175","doi":"https://doi.org/10.1109/vtc2025-spring65109.2025.11174636","title":"Software-Based Thermal Protection of a Vehicular Electronic Fuse's Semiconductor Device","display_name":"Software-Based Thermal Protection of a Vehicular Electronic Fuse's Semiconductor Device","publication_year":2025,"publication_date":"2025-06-17","ids":{"openalex":"https://openalex.org/W4414648175","doi":"https://doi.org/10.1109/vtc2025-spring65109.2025.11174636"},"language":"en","primary_location":{"id":"doi:10.1109/vtc2025-spring65109.2025.11174636","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtc2025-spring65109.2025.11174636","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 101st Vehicular Technology Conference (VTC2025-Spring)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108137049","display_name":"Christoph Mayer","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156768","display_name":"BMW Group (Germany)","ror":"https://ror.org/044kkbh92","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210156768"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Christoph Mayer","raw_affiliation_strings":["BMW Group,Germany"],"affiliations":[{"raw_affiliation_string":"BMW Group,Germany","institution_ids":["https://openalex.org/I4210156768"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058962505","display_name":"Martin Baumann","orcid":"https://orcid.org/0000-0002-2668-2527"},"institutions":[{"id":"https://openalex.org/I4210156768","display_name":"BMW Group (Germany)","ror":"https://ror.org/044kkbh92","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210156768"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Martin Baumann","raw_affiliation_strings":["BMW Group,Germany"],"affiliations":[{"raw_affiliation_string":"BMW Group,Germany","institution_ids":["https://openalex.org/I4210156768"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5119775166","display_name":"Simon Verwold","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156768","display_name":"BMW Group (Germany)","ror":"https://ror.org/044kkbh92","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210156768"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Simon Verwold","raw_affiliation_strings":["BMW Group,Germany"],"affiliations":[{"raw_affiliation_string":"BMW Group,Germany","institution_ids":["https://openalex.org/I4210156768"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030076248","display_name":"Bastian Eisenmann","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156768","display_name":"BMW Group (Germany)","ror":"https://ror.org/044kkbh92","country_code":"DE","type":"company","lineage":["https://openalex.org/I4210156768"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Bastian Eisenmann","raw_affiliation_strings":["BMW Group,Germany"],"affiliations":[{"raw_affiliation_string":"BMW Group,Germany","institution_ids":["https://openalex.org/I4210156768"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5018442305","display_name":"Hans\u2013Georg Herzog","orcid":"https://orcid.org/0000-0002-2143-0929"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Hans-Georg Herzog","raw_affiliation_strings":["Technical University of Munich (TUM),Germany"],"affiliations":[{"raw_affiliation_string":"Technical University of Munich (TUM),Germany","institution_ids":["https://openalex.org/I62916508"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5108137049"],"corresponding_institution_ids":["https://openalex.org/I4210156768"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.28428096,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9753999710083008,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9753999710083008,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13295","display_name":"Safety Systems Engineering in Autonomy","score":0.9696000218391418,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12810","display_name":"Real-time simulation and control systems","score":0.9358999729156494,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5583000183105469},{"id":"https://openalex.org/keywords/semiconductor-device","display_name":"Semiconductor device","score":0.5350000262260437},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.5271999835968018},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.5149999856948853},{"id":"https://openalex.org/keywords/junction-temperature","display_name":"Junction temperature","score":0.5120000243186951},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5094000101089478},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.4821999967098236},{"id":"https://openalex.org/keywords/bipolar-junction-transistor","display_name":"Bipolar junction transistor","score":0.4185999929904938}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5583000183105469},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.5350000262260437},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.5271999835968018},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.5149999856948853},{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.5120000243186951},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5094000101089478},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.4821999967098236},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.44859999418258667},{"id":"https://openalex.org/C23061349","wikidata":"https://www.wikidata.org/wiki/Q188946","display_name":"Bipolar junction transistor","level":4,"score":0.4185999929904938},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.4140999913215637},{"id":"https://openalex.org/C72688512","wikidata":"https://www.wikidata.org/wiki/Q908282","display_name":"Thermal runaway","level":4,"score":0.40400001406669617},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.38440001010894775},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.3716999888420105},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.37070000171661377},{"id":"https://openalex.org/C73000952","wikidata":"https://www.wikidata.org/wiki/Q17007827","display_name":"Discretization","level":2,"score":0.3589000105857849},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.34360000491142273},{"id":"https://openalex.org/C141812795","wikidata":"https://www.wikidata.org/wiki/Q7236534","display_name":"Power module","level":3,"score":0.33660000562667847},{"id":"https://openalex.org/C2983266536","wikidata":"https://www.wikidata.org/wiki/Q3509543","display_name":"Electronic systems","level":2,"score":0.3312000036239624},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3285999894142151},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2962000072002411},{"id":"https://openalex.org/C2986597240","wikidata":"https://www.wikidata.org/wiki/Q259873","display_name":"Thermal protection","level":2,"score":0.2842000126838684},{"id":"https://openalex.org/C81060104","wikidata":"https://www.wikidata.org/wiki/Q11653","display_name":"Electronic component","level":2,"score":0.28360000252723694},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.2590000033378601}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vtc2025-spring65109.2025.11174636","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtc2025-spring65109.2025.11174636","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 101st Vehicular Technology Conference (VTC2025-Spring)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2079564482","https://openalex.org/W2105252367","https://openalex.org/W2481417112","https://openalex.org/W2969829813","https://openalex.org/W3005975842","https://openalex.org/W3097565360","https://openalex.org/W4391342563","https://openalex.org/W4400945587","https://openalex.org/W4406138499","https://openalex.org/W4407566247"],"related_works":[],"abstract_inverted_index":{"A":[0],"fail-operational":[1],"vehicular":[2,14],"power":[3,15,115],"system":[4],"is":[5,62,104],"a":[6,53,59,70],"prerequisite":[7],"for":[8,97,109],"autonomous":[9],"driving":[10],"functions.":[11],"Thus,":[12],"novel":[13],"systems":[16],"include":[17],"electronic":[18],"fuses":[19,24],"(eFuses)":[20],"instead":[21],"of":[22,44,69,76,101],"melting":[23],"to":[25,32,52,64],"implement":[26],"advanced":[27],"protection":[28],"mechanisms.":[29],"In":[30,56],"order":[31],"perform":[33],"their":[34],"functions":[35],"over":[36],"the":[37,41,66,77,94,99,102,110,114],"whole":[38],"lifetime":[39],"reliably,":[40],"semiconductor":[42],"devices":[43],"eFuses":[45],"must":[46],"be":[47],"protected":[48],"from":[49],"damage":[50],"due":[51],"thermal":[54],"overload.":[55],"this":[57],"paper,":[58],"software-based":[60],"approach":[61],"proposed":[63],"determine":[65],"junction":[67],"temperature":[68,100,112],"transistor":[71],"using":[72],"an":[73],"electrothermal":[74],"model":[75],"device.":[78],"Different":[79],"modeling":[80],"approaches":[81],"(Foster,":[82],"Cauer)":[83],"are":[84,118],"explained":[85],"and":[86],"compared":[87],"regarding":[88],"technical":[89],"feasibility.":[90],"Measurements":[91],"exhibit":[92],"that":[93],"discretized":[95],"algorithm":[96],"monitoring":[98],"eFuse":[103],"viable":[105],"when":[106],"realistic":[107],"values":[108],"ambient":[111],"within":[113],"distribution":[116],"unit":[117],"processed.":[119]},"counts_by_year":[],"updated_date":"2026-03-07T16:01:11.037858","created_date":"2025-10-10T00:00:00"}