{"id":"https://openalex.org/W4414648335","doi":"https://doi.org/10.1109/vtc2025-spring65109.2025.11174482","title":"An Enhanced Electromagnetic Properties Calibration Algorithm for RT-Based Electromagnetic Environment Reconstruction","display_name":"An Enhanced Electromagnetic Properties Calibration Algorithm for RT-Based Electromagnetic Environment Reconstruction","publication_year":2025,"publication_date":"2025-06-17","ids":{"openalex":"https://openalex.org/W4414648335","doi":"https://doi.org/10.1109/vtc2025-spring65109.2025.11174482"},"language":"en","primary_location":{"id":"doi:10.1109/vtc2025-spring65109.2025.11174482","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtc2025-spring65109.2025.11174482","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 101st Vehicular Technology Conference (VTC2025-Spring)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051082166","display_name":"Zhihao Xu","orcid":"https://orcid.org/0000-0003-3615-6296"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zirui Xu","raw_affiliation_strings":["Beijing University of Posts and Telecommunications,State Key Lab of Networking and Switching Technology,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing University of Posts and Telecommunications,State Key Lab of Networking and Switching Technology,Beijing,China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047139348","display_name":"Pan Tang","orcid":"https://orcid.org/0000-0003-0432-7361"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Pan Tang","raw_affiliation_strings":["Beijing University of Posts and Telecommunications,State Key Lab of Networking and Switching Technology,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing University of Posts and Telecommunications,State Key Lab of Networking and Switching Technology,Beijing,China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004827033","display_name":"Ximan Liu","orcid":"https://orcid.org/0009-0007-1685-101X"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ximan Liu","raw_affiliation_strings":["Beijing University of Posts and Telecommunications,State Key Lab of Networking and Switching Technology,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing University of Posts and Telecommunications,State Key Lab of Networking and Switching Technology,Beijing,China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060795112","display_name":"Haiyang Miao","orcid":"https://orcid.org/0000-0001-5578-0479"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haiyang Miao","raw_affiliation_strings":["Beijing University of Posts and Telecommunications,State Key Lab of Networking and Switching Technology,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing University of Posts and Telecommunications,State Key Lab of Networking and Switching Technology,Beijing,China","institution_ids":["https://openalex.org/I139759216"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5041947757","display_name":"Jianhua Zhang","orcid":"https://orcid.org/0000-0001-8061-1861"},"institutions":[{"id":"https://openalex.org/I139759216","display_name":"Beijing University of Posts and Telecommunications","ror":"https://ror.org/04w9fbh59","country_code":"CN","type":"education","lineage":["https://openalex.org/I139759216"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jianhua Zhang","raw_affiliation_strings":["Beijing University of Posts and Telecommunications,State Key Lab of Networking and Switching Technology,Beijing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beijing University of Posts and Telecommunications,State Key Lab of Networking and Switching Technology,Beijing,China","institution_ids":["https://openalex.org/I139759216"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I139759216"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9355000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11851","display_name":"Electromagnetic Compatibility and Measurements","score":0.9355000257492065,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tree-traversal","display_name":"Tree traversal","score":0.6021000146865845},{"id":"https://openalex.org/keywords/simulated-annealing","display_name":"Simulated annealing","score":0.5199999809265137},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.45350000262260437},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.4083000123500824},{"id":"https://openalex.org/keywords/chaotic","display_name":"Chaotic","score":0.38749998807907104},{"id":"https://openalex.org/keywords/electromagnetic-environment","display_name":"Electromagnetic environment","score":0.3723999857902527},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.35190001130104065},{"id":"https://openalex.org/keywords/reconstruction-algorithm","display_name":"Reconstruction algorithm","score":0.32919999957084656},{"id":"https://openalex.org/keywords/mean-squared-error","display_name":"Mean squared error","score":0.31630000472068787}],"concepts":[{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.7247999906539917},{"id":"https://openalex.org/C140745168","wikidata":"https://www.wikidata.org/wiki/Q1210082","display_name":"Tree traversal","level":2,"score":0.6021000146865845},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5622000098228455},{"id":"https://openalex.org/C126980161","wikidata":"https://www.wikidata.org/wiki/Q863783","display_name":"Simulated annealing","level":2,"score":0.5199999809265137},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.45350000262260437},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.4083000123500824},{"id":"https://openalex.org/C2777052490","wikidata":"https://www.wikidata.org/wiki/Q5072826","display_name":"Chaotic","level":2,"score":0.38749998807907104},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.37619999051094055},{"id":"https://openalex.org/C64183698","wikidata":"https://www.wikidata.org/wiki/Q4530886","display_name":"Electromagnetic environment","level":2,"score":0.3723999857902527},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.35190001130104065},{"id":"https://openalex.org/C2779898584","wikidata":"https://www.wikidata.org/wiki/Q7820109","display_name":"Reconstruction algorithm","level":3,"score":0.32919999957084656},{"id":"https://openalex.org/C139945424","wikidata":"https://www.wikidata.org/wiki/Q1940696","display_name":"Mean squared error","level":2,"score":0.31630000472068787},{"id":"https://openalex.org/C14589660","wikidata":"https://www.wikidata.org/wiki/Q64122","display_name":"Electromagnetic pulse","level":2,"score":0.31619998812675476},{"id":"https://openalex.org/C121483023","wikidata":"https://www.wikidata.org/wiki/Q7298343","display_name":"Ray tracing (physics)","level":2,"score":0.31369999051094055},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.3043000102043152},{"id":"https://openalex.org/C135252773","wikidata":"https://www.wikidata.org/wiki/Q1567213","display_name":"Inverse problem","level":2,"score":0.30329999327659607},{"id":"https://openalex.org/C106516650","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm design","level":2,"score":0.29260000586509705},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.2824999988079071},{"id":"https://openalex.org/C28843909","wikidata":"https://www.wikidata.org/wiki/Q177625","display_name":"Electromagnetic field","level":2,"score":0.27869999408721924},{"id":"https://openalex.org/C204241405","wikidata":"https://www.wikidata.org/wiki/Q461499","display_name":"Transformation (genetics)","level":3,"score":0.27459999918937683},{"id":"https://openalex.org/C125470083","wikidata":"https://www.wikidata.org/wiki/Q747288","display_name":"Electromagnetic compatibility","level":2,"score":0.2736999988555908},{"id":"https://openalex.org/C138673069","wikidata":"https://www.wikidata.org/wiki/Q322229","display_name":"Tracing","level":2,"score":0.2720000147819519},{"id":"https://openalex.org/C125583679","wikidata":"https://www.wikidata.org/wiki/Q755673","display_name":"Search algorithm","level":2,"score":0.265500009059906},{"id":"https://openalex.org/C189950617","wikidata":"https://www.wikidata.org/wiki/Q937228","display_name":"Property (philosophy)","level":2,"score":0.2637999951839447},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.2621999979019165},{"id":"https://openalex.org/C44154836","wikidata":"https://www.wikidata.org/wiki/Q45045","display_name":"Simulation","level":1,"score":0.25040000677108765}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vtc2025-spring65109.2025.11174482","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vtc2025-spring65109.2025.11174482","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2025 IEEE 101st Vehicular Technology Conference (VTC2025-Spring)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G1174835396","display_name":null,"funder_award_id":"61925102","funder_id":"https://openalex.org/F4320336125","funder_display_name":"National Science Fund for Distinguished Young Scholars"},{"id":"https://openalex.org/G1362023880","display_name":null,"funder_award_id":"62201086,62341128,U2268201","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8764073355","display_name":null,"funder_award_id":"2023YFB2904805","funder_id":"https://openalex.org/F4320335777","funder_display_name":"National Key Research and Development Program of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320335777","display_name":"National Key Research and Development Program of China","ror":null},{"id":"https://openalex.org/F4320336125","display_name":"National Science Fund for Distinguished Young Scholars","ror":null}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1991838949","https://openalex.org/W2030006281","https://openalex.org/W2032609865","https://openalex.org/W2088978850","https://openalex.org/W2102892532","https://openalex.org/W2148129371","https://openalex.org/W2479346210","https://openalex.org/W3065310332","https://openalex.org/W4247381894","https://openalex.org/W4297094924","https://openalex.org/W4308823830","https://openalex.org/W4312890860","https://openalex.org/W4391941434"],"related_works":[],"abstract_inverted_index":{"With":[0],"the":[1,6,14,26,57,71,88,110,121,125,136,142,146,154],"full":[2],"automation":[3],"transformation":[4],"of":[5,16,40,48,59,73,91,114,148],"railway":[7,33,117],"industry":[8],"and":[9,22,78,97,112,145,150],"its":[10],"close":[11],"connection":[12],"to":[13,153],"goals":[15],"high":[17,20],"data":[18],"rate,":[19],"reliability,":[21],"ultra-low":[23],"latency":[24],"communication,":[25],"demand":[27],"for":[28,94,102,105],"wireless":[29],"communication":[30,34],"technology":[31],"in":[32,38,42,116],"is":[35],"increasing,":[36],"especially":[37],"terms":[39],"accuracy":[41,47,58,111],"electromagnetic":[43,52,60],"environment":[44,53],"reconstruction.":[45],"The":[46,83],"ray":[49],"tracing":[50],"(RT)-based":[51],"reconstruction":[54],"depends":[55],"on":[56,129],"(EM))":[61],"properties.":[62],"Therefore,":[63],"we":[64],"propose":[65],"an":[66],"enhanced":[67],"algorithm,":[68],"which":[69],"combines":[70],"advantages":[72],"logistic":[74],"chaotic":[75],"(LC)":[76],"algorithm":[77,85,93,101,115],"simulated":[79],"annealing":[80],"(SA)":[81],"algorithm.":[82],"proposed":[84],"first":[86],"utilizes":[87],"traversal":[89],"property":[90],"LC":[92],"global":[95],"search,":[96],"then":[98],"uses":[99],"SA":[100],"fine":[103],"search":[104],"optimal":[106],"solution.":[107],"We":[108],"validate":[109],"applicability":[113],"scenario":[118],"by":[119],"comparing":[120],"measurement":[122],"results":[123,127],"with":[124],"simulation":[126],"based":[128],"RT.":[130],"After":[131],"calibration,":[132],"it":[133],"will":[134],"reduce":[135],"root":[137],"mean":[138],"square":[139],"error":[140],"between":[141],"measured":[143],"parameters":[144,147],"RT,":[149],"quickly":[151],"converge":[152],"minimum":[155],"value.":[156]},"counts_by_year":[],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}
