{"id":"https://openalex.org/W4401881636","doi":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631465","title":"Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology","display_name":"Assessment of the Transient Self-Heating Effect and its Impact on the Performance of Watt-Level RF Power Amplifier in a FinFET Technology","publication_year":2024,"publication_date":"2024-06-16","ids":{"openalex":"https://openalex.org/W4401881636","doi":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631465"},"language":"en","primary_location":{"id":"doi:10.1109/vlsitechnologyandcir46783.2024.10631465","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631465","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://hdl.handle.net/11380/1364192","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"T. V. Dinh","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"T. V. Dinh","raw_affiliation_strings":["NXP Semiconductors,Austin,TX,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,Austin,TX,USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111301764","display_name":"S-W. Tam","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S-W. Tam","raw_affiliation_strings":["NXP Semiconductors,San Jose,CA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,San Jose,CA,USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070534850","display_name":"A.J. Scholten","orcid":"https://orcid.org/0000-0003-1861-883X"},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"A. J. Scholten","raw_affiliation_strings":["NXP Semiconductors,Eindhoven,The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,Eindhoven,The Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105424675","display_name":"Lisa Tondelli","orcid":"https://orcid.org/0000-0002-6917-205X"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Tondelli","raw_affiliation_strings":["University of Modena and Reggio Emilia,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Modena and Reggio Emilia,Italy","institution_ids":["https://openalex.org/I122346577"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074771815","display_name":"Ralf Pijper","orcid":null},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"R. M. T. Pijper","raw_affiliation_strings":["NXP Semiconductors,Eindhoven,The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,Eindhoven,The Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025411551","display_name":"Sri Harsha Kondapalli","orcid":"https://orcid.org/0000-0002-1691-6297"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"S. H. Kondapalli","raw_affiliation_strings":["NXP Semiconductors,San Jose,CA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,San Jose,CA,USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100337730","display_name":"Jingying Xie","orcid":"https://orcid.org/0000-0002-3877-8745"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Xie","raw_affiliation_strings":["NXP Semiconductors,San Jose,CA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,San Jose,CA,USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113608161","display_name":"Alan Wong","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A. Wong","raw_affiliation_strings":["NXP Semiconductors,San Jose,CA,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,San Jose,CA,USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067777399","display_name":"I. To","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"I. To","raw_affiliation_strings":["NXP Semiconductors,Chandler,AZ,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors,Chandler,AZ,USA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007746953","display_name":"R. Asanovski","orcid":"https://orcid.org/0000-0001-7127-6184"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"R. Asanovski","raw_affiliation_strings":["University of Modena and Reggio Emilia,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Modena and Reggio Emilia,Italy","institution_ids":["https://openalex.org/I122346577"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008355061","display_name":"L. Selmi","orcid":"https://orcid.org/0000-0001-8688-4326"},"institutions":[{"id":"https://openalex.org/I122346577","display_name":"University of Modena and Reggio Emilia","ror":"https://ror.org/02d4c4y02","country_code":"IT","type":"education","lineage":["https://openalex.org/I122346577"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Selmi","raw_affiliation_strings":["University of Modena and Reggio Emilia,Italy"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Modena and Reggio Emilia,Italy","institution_ids":["https://openalex.org/I122346577"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":11,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.7393,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.70904156,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9821000099182129,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9713000059127808,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/watt","display_name":"Watt","score":0.8786789178848267},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.708312451839447},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6941906809806824},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.6176527142524719},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5655103325843811},{"id":"https://openalex.org/keywords/rf-power-amplifier","display_name":"RF power amplifier","score":0.5433514714241028},{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.5086825489997864},{"id":"https://openalex.org/keywords/radio-frequency","display_name":"Radio frequency","score":0.459434449672699},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.41482013463974},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.3977504074573517},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3626860976219177},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3338775038719177},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.23007622361183167},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.2080613672733307},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.16593626141548157}],"concepts":[{"id":"https://openalex.org/C44012409","wikidata":"https://www.wikidata.org/wiki/Q25236","display_name":"Watt","level":3,"score":0.8786789178848267},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.708312451839447},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6941906809806824},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6176527142524719},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5655103325843811},{"id":"https://openalex.org/C196054291","wikidata":"https://www.wikidata.org/wiki/Q7276624","display_name":"RF power amplifier","level":4,"score":0.5433514714241028},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.5086825489997864},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.459434449672699},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.41482013463974},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.3977504074573517},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3626860976219177},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3338775038719177},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.23007622361183167},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.2080613672733307},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16593626141548157},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/vlsitechnologyandcir46783.2024.10631465","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631465","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},{"id":"pmh:oai:iris.unimore.it:11380/1364192","is_oa":true,"landing_page_url":"https://hdl.handle.net/11380/1364192","pdf_url":null,"source":{"id":"https://openalex.org/S4377196326","display_name":"Iris Unimore (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:zenodo.org:13970068","is_oa":true,"landing_page_url":"https://doi.org/10.1109/VLSITechnologyandCir46783.2024.10631465","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/other"}],"best_oa_location":{"id":"pmh:oai:iris.unimore.it:11380/1364192","is_oa":true,"landing_page_url":"https://hdl.handle.net/11380/1364192","pdf_url":null,"source":{"id":"https://openalex.org/S4377196326","display_name":"Iris Unimore (University of Modena and Reggio Emilia)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I122346577","host_organization_name":"University of Modena and Reggio Emilia","host_organization_lineage":["https://openalex.org/I122346577"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"info:eu-repo/semantics/conferenceObject"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8700000047683716}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W4252026737"],"related_works":["https://openalex.org/W3209221379","https://openalex.org/W2156294920","https://openalex.org/W3193712762","https://openalex.org/W2155700382","https://openalex.org/W4287025514","https://openalex.org/W4386535175","https://openalex.org/W2738144851","https://openalex.org/W3145027672","https://openalex.org/W4235509732","https://openalex.org/W4386628957"],"abstract_inverted_index":{"The":[0],"dynamic":[1],"behavior":[2],"of":[3,16,23,55,68,83],"self-heating":[4],"effect":[5],"in":[6,36,99],"FinFET":[7,37,61,102],"devices":[8],"has":[9,77],"a":[10,46,56,100],"profound":[11],"impact":[12],"on":[13],"the":[14,43,52,64,92],"performance":[15],"RF":[17,34,58,88,95],"circuits.":[18],"Hence":[19],"an":[20],"accurate":[21],"assessment":[22,74],"such":[24,69],"transient":[25],"thermal":[26,53,73],"response":[27],"is":[28],"critical":[29],"for":[30,42],"designing":[31],"successfully":[32],"thermal-sensitive":[33],"blocks":[35],"technology.":[38],"This":[39,72],"work":[40],"shows,":[41],"first":[44,93],"time,":[45],"physics-based":[47],"multi-stage":[48],"approach":[49],"to":[50],"evaluate":[51],"network":[54],"single":[57],"multi-fin":[59],"multi-finger":[60],"transistor":[62],"and":[63,86],"power":[65,96],"cell":[66],"comprised":[67],"multiple":[70],"transistors.":[71],"approach,":[75],"which":[76],"been":[78],"verified":[79],"by":[80],"intensive":[81],"characterization":[82],"both":[84],"on-wafer":[85],"in-packaged":[87],"test":[89],"chips,":[90],"enables":[91],"Watt-level":[94],"amplifier":[97],"design":[98],"baseline":[101],"node.":[103]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-14T07:44:22.658603","created_date":"2025-10-10T00:00:00"}