{"id":"https://openalex.org/W4401879761","doi":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631453","title":"Terahertz Sensing with CMOS-RFIC - Feasibility Verification for Short-Range Imaging using 300GHz MIMO Radar -","display_name":"Terahertz Sensing with CMOS-RFIC - Feasibility Verification for Short-Range Imaging using 300GHz MIMO Radar -","publication_year":2024,"publication_date":"2024-06-16","ids":{"openalex":"https://openalex.org/W4401879761","doi":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631453"},"language":"en","primary_location":{"id":"doi:10.1109/vlsitechnologyandcir46783.2024.10631453","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631453","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5003768557","display_name":"Ichiro Somada","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ichiro Somada","raw_affiliation_strings":["Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5029987059","display_name":"Akihito Hirai","orcid":"https://orcid.org/0000-0002-0591-7518"},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akihito Hirai","raw_affiliation_strings":["Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103914956","display_name":"Keigo Nakatani","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keigo Nakatani","raw_affiliation_strings":["Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5001841165","display_name":"Akinori Taira","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akinori Taira","raw_affiliation_strings":["Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059959882","display_name":"Kazuaki Ishioka","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuaki Ishioka","raw_affiliation_strings":["Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113213558","display_name":"Takuma Nishimura","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takuma Nishimura","raw_affiliation_strings":["Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan","institution_ids":["https://openalex.org/I4210133125"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5104317008","display_name":"Koji Yamanaka","orcid":null},"institutions":[{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Koji Yamanaka","raw_affiliation_strings":["Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Information Technology R&D Center, Mitsubishi Electric Corporation,Kanagawa,Japan","institution_ids":["https://openalex.org/I4210133125"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3712,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.5960612,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10752","display_name":"Terahertz technology and applications","score":0.9901000261306763,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/rfic","display_name":"RFIC","score":0.8599321842193604},{"id":"https://openalex.org/keywords/terahertz-radiation","display_name":"Terahertz radiation","score":0.8026776313781738},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6703170537948608},{"id":"https://openalex.org/keywords/radar","display_name":"Radar","score":0.6087303161621094},{"id":"https://openalex.org/keywords/range","display_name":"Range (aeronautics)","score":0.5240873694419861},{"id":"https://openalex.org/keywords/mimo","display_name":"MIMO","score":0.4361325204372406},{"id":"https://openalex.org/keywords/radar-imaging","display_name":"Radar imaging","score":0.4305141568183899},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40357422828674316},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.32264143228530884},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3191945552825928},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3024449944496155},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23962587118148804},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.23208457231521606},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14084741473197937},{"id":"https://openalex.org/keywords/beamforming","display_name":"Beamforming","score":0.13276538252830505},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.13121864199638367},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.07565882802009583}],"concepts":[{"id":"https://openalex.org/C121152627","wikidata":"https://www.wikidata.org/wiki/Q6095735","display_name":"RFIC","level":3,"score":0.8599321842193604},{"id":"https://openalex.org/C107816215","wikidata":"https://www.wikidata.org/wiki/Q647887","display_name":"Terahertz radiation","level":2,"score":0.8026776313781738},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6703170537948608},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.6087303161621094},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.5240873694419861},{"id":"https://openalex.org/C207987634","wikidata":"https://www.wikidata.org/wiki/Q176862","display_name":"MIMO","level":3,"score":0.4361325204372406},{"id":"https://openalex.org/C10929652","wikidata":"https://www.wikidata.org/wiki/Q7279985","display_name":"Radar imaging","level":3,"score":0.4305141568183899},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40357422828674316},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.32264143228530884},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3191945552825928},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3024449944496155},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23962587118148804},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.23208457231521606},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14084741473197937},{"id":"https://openalex.org/C54197355","wikidata":"https://www.wikidata.org/wiki/Q5782992","display_name":"Beamforming","level":2,"score":0.13276538252830505},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.13121864199638367},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.07565882802009583}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsitechnologyandcir46783.2024.10631453","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631453","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7900000214576721}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321034","display_name":"New Energy and Industrial Technology Development Organization","ror":"https://ror.org/0055k7a87"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W4366504249"],"related_works":["https://openalex.org/W2358678416","https://openalex.org/W2026774392","https://openalex.org/W2382973340","https://openalex.org/W2168197554","https://openalex.org/W2049882526","https://openalex.org/W2211903849","https://openalex.org/W2067199695","https://openalex.org/W4225568700","https://openalex.org/W4200496191","https://openalex.org/W2011049366"],"abstract_inverted_index":{"For":[0],"solving":[1],"various":[2],"social":[3],"issues,":[4],"sensing":[5,47],"technology":[6],"has":[7],"gained":[8],"significant":[9],"interest.":[10],"Terahertz":[11],"waves,":[12,24],"which":[13],"combine":[14],"the":[15,42,51,57,71,84,107,110,115],"high":[16],"resolution":[17,94],"of":[18,22,27,44,63,73,109],"light":[19],"and":[20,59,102],"transparency":[21],"radio":[23],"enable":[25],"visualization":[26],"obstacles":[28],"behind":[29],"internal":[30],"structures.":[31],"So,":[32],"it":[33],"offers":[34],"potential":[35],"for":[36],"new":[37],"solutions.":[38],"This":[39],"paper":[40],"introduces":[41],"overview":[43],"a":[45],"short-distance":[46],"system":[48],"based":[49,79],"on":[50,80],"full":[52],"digital":[53],"MIMO":[54],"radar":[55],"concept,":[56],"design":[58],"fundamental":[60],"evaluation":[61],"results":[62],"300GHz":[64,76],"terahertz":[65,77,85],"CMOS":[66],"devices,":[67],"as":[68,70],"well":[69],"achievements":[72],"imaging":[74,95],"using":[75],"wave":[78],"actual":[81],"measurements.":[82],"Since":[83],"band":[86],"can":[87,96],"obtain":[88],"an":[89],"ultra-wideband":[90],"spectrum,":[91],"several":[92],"milli-meter":[93],"be":[97],"performed":[98],"in":[99],"azimuth,":[100],"elevation,":[101],"depth":[103],"direction.":[104],"We":[105],"show":[106],"feasibility":[108],"security":[111],"gate":[112],"application":[113],"with":[114],"measured":[116],"high-resolution":[117],"tomographic":[118],"images.":[119]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}