{"id":"https://openalex.org/W4401881131","doi":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631448","title":"A 71.5-dB SNDR 475-MS/s Ringamp-Based Pipelined SAR ADC with On-Chip Bit-Weight Calibration","display_name":"A 71.5-dB SNDR 475-MS/s Ringamp-Based Pipelined SAR ADC with On-Chip Bit-Weight Calibration","publication_year":2024,"publication_date":"2024-06-16","ids":{"openalex":"https://openalex.org/W4401881131","doi":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631448"},"language":"en","primary_location":{"id":"doi:10.1109/vlsitechnologyandcir46783.2024.10631448","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631448","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111394068","display_name":"C. Chen","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Chen","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034764005","display_name":"Yuan Zhu","orcid":"https://orcid.org/0000-0003-4641-2847"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhu Yuan","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072148138","display_name":"Peng Cao","orcid":"https://orcid.org/0000-0001-8735-2989"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Peng Cao","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100743218","display_name":"Jiawei Xu","orcid":"https://orcid.org/0000-0002-6192-558X"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiawei Xu","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5082092557","display_name":"Zhiliang Hong","orcid":"https://orcid.org/0000-0002-9968-5964"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiliang Hong","raw_affiliation_strings":["Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fudan University,State Key Laboratory of Integrated Chips and Systems,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I24943067"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":17,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"2"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11472","display_name":"Analytical Chemistry and Sensors","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1502","display_name":"Bioengineering"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/successive-approximation-adc","display_name":"Successive approximation ADC","score":0.69648677110672},{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.6662671566009521},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.5935218334197998},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5787237286567688},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45674365758895874},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4049263000488281},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.18674132227897644},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15365254878997803},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.13873881101608276},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.12316465377807617},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.1060771644115448},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.08676663041114807},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.06416016817092896}],"concepts":[{"id":"https://openalex.org/C60154766","wikidata":"https://www.wikidata.org/wiki/Q2650458","display_name":"Successive approximation ADC","level":4,"score":0.69648677110672},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.6662671566009521},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.5935218334197998},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5787237286567688},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45674365758895874},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4049263000488281},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.18674132227897644},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15365254878997803},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.13873881101608276},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.12316465377807617},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.1060771644115448},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.08676663041114807},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.06416016817092896},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsitechnologyandcir46783.2024.10631448","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631448","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8100000023841858}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W4230760062"],"related_works":["https://openalex.org/W2411923897","https://openalex.org/W4394546135","https://openalex.org/W4285347720","https://openalex.org/W4200259850","https://openalex.org/W2333831899","https://openalex.org/W2484894494","https://openalex.org/W2367385042","https://openalex.org/W4381186982","https://openalex.org/W2040781570","https://openalex.org/W4226055750"],"abstract_inverted_index":{"This":[0,86],"paper":[1],"presents":[2],"a":[3,12,43,69,74,83,89],"13-bit":[4],"475-MS/s":[5],"single-channel":[6],"pipelined":[7],"SAR":[8],"ADC,":[9],"which":[10],"utilizes":[11],"ring":[13],"amplifier":[14],"(ringamp)":[15],"for":[16],"residue":[17],"amplification":[18],"through":[19],"an":[20,32],"improved":[21],"bias":[22],"scheme":[23],"and":[24,42,52,79,94],"common-mode":[25],"feedback":[26],"(CMFB).":[27],"Moreover,":[28],"the":[29,48,62,66],"ADC":[30],"exploits":[31],"on-chip":[33],"bit-weight":[34],"calibration":[35],"with":[36],"signal-dependent":[37],"pseudo-random":[38],"noise":[39],"(PN)":[40],"injection":[41],"window":[44],"detector":[45],"to":[46,60,88],"correct":[47],"interstage":[49],"gain":[50,63],"error":[51,64],"DAC":[53],"mismatch,":[54],"requiring":[55],"only":[56],"4096":[57],"PN-injected":[58],"samples":[59],"calibrate":[61],"in":[65],"background.":[67],"As":[68],"result,":[70],"this":[71],"work":[72],"achieves":[73],"peak":[75],"SNDR":[76],"of":[77,92,96],"71.5dB":[78],"consumes":[80],"9.93mW":[81],"from":[82],"1V":[84],"supply.":[85],"corresponds":[87],"state-of-the-art":[90],"FoMs":[91],"175.3dB":[93],"FoMw":[95],"6.8fJ/conv-step.":[97]},"counts_by_year":[{"year":2026,"cited_by_count":4},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}