{"id":"https://openalex.org/W4286571726","doi":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830467","title":"Palm-sized LiDAR module with III/V-on-Si optical phased array","display_name":"Palm-sized LiDAR module with III/V-on-Si optical phased array","publication_year":2022,"publication_date":"2022-06-12","ids":{"openalex":"https://openalex.org/W4286571726","doi":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830467"},"language":"en","primary_location":{"id":"doi:10.1109/vlsitechnologyandcir46769.2022.9830467","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830467","pdf_url":null,"source":{"id":"https://openalex.org/S4363605407","display_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038558477","display_name":"Kyunghyun Son","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Kyunghyun Son","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101403116","display_name":"Dongjae Shin","orcid":"https://orcid.org/0000-0001-7240-0378"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dongjae Shin","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5009138261","display_name":"Jisan Lee","orcid":"https://orcid.org/0000-0002-9039-7448"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jisan Lee","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109375534","display_name":"Bongyong Jang","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Bongyong Jang","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046350644","display_name":"Dong-Sik Shim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dongsik Shim","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108833815","display_name":"Hyunil Byun","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunil Byun","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047713566","display_name":"Changbum Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Changbum Lee","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066456568","display_name":"Yong-Chul Cho","orcid":"https://orcid.org/0000-0002-4145-8929"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yongchul Cho","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020989829","display_name":"Tatsuhiro Otsuka","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Tatsuhiro Otsuka","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107699272","display_name":"Changgyun Shin","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Changgyun Shin","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080645370","display_name":"Inoh Hwang","orcid":"https://orcid.org/0000-0002-6204-7715"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Inoh Hwang","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100744785","display_name":"Eun Kyung Lee","orcid":"https://orcid.org/0009-0003-0799-6904"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Eun Kyung Lee","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113681986","display_name":"Kyoungho Ha","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Kyoungho Ha","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057963712","display_name":"Hyuck Choo","orcid":"https://orcid.org/0000-0002-8903-7939"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyuck Choo","raw_affiliation_strings":["Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Advanced Institute of Technology, Samsung Electronics,Advanced Sensor Lab.,Suwon,Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Advanced Sensor Lab., Samsung Advanced Institute of Technology, Samsung Electronics, Suwon, Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":14,"corresponding_author_ids":["https://openalex.org/A5038558477"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":2.2445,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.88910682,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"166","last_page":"167"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11569","display_name":"Optical Coherence Tomography Applications","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11569","display_name":"Optical Coherence Tomography Applications","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12153","display_name":"Advanced Optical Sensing Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10299","display_name":"Photonic and Optical Devices","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ranging","display_name":"Ranging","score":0.9363905787467957},{"id":"https://openalex.org/keywords/lidar","display_name":"Lidar","score":0.9328626394271851},{"id":"https://openalex.org/keywords/digital-signal-processing","display_name":"Digital signal processing","score":0.6150434017181396},{"id":"https://openalex.org/keywords/volume","display_name":"Volume (thermodynamics)","score":0.5566067099571228},{"id":"https://openalex.org/keywords/remote-sensing","display_name":"Remote sensing","score":0.5455548167228699},{"id":"https://openalex.org/keywords/phased-array","display_name":"Phased array","score":0.501997709274292},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4938541054725647},{"id":"https://openalex.org/keywords/signal-processing","display_name":"Signal processing","score":0.44210177659988403},{"id":"https://openalex.org/keywords/phased-array-optics","display_name":"Phased-array optics","score":0.4300159811973572},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.4144335985183716},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.39330604672431946},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3869647979736328},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2677991986274719},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22681677341461182},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.18449947237968445},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.15161189436912537}],"concepts":[{"id":"https://openalex.org/C115051666","wikidata":"https://www.wikidata.org/wiki/Q6522493","display_name":"Ranging","level":2,"score":0.9363905787467957},{"id":"https://openalex.org/C51399673","wikidata":"https://www.wikidata.org/wiki/Q504027","display_name":"Lidar","level":2,"score":0.9328626394271851},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.6150434017181396},{"id":"https://openalex.org/C20556612","wikidata":"https://www.wikidata.org/wiki/Q4469374","display_name":"Volume (thermodynamics)","level":2,"score":0.5566067099571228},{"id":"https://openalex.org/C62649853","wikidata":"https://www.wikidata.org/wiki/Q199687","display_name":"Remote sensing","level":1,"score":0.5455548167228699},{"id":"https://openalex.org/C55494473","wikidata":"https://www.wikidata.org/wiki/Q727898","display_name":"Phased array","level":3,"score":0.501997709274292},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4938541054725647},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.44210177659988403},{"id":"https://openalex.org/C193860024","wikidata":"https://www.wikidata.org/wiki/Q7180973","display_name":"Phased-array optics","level":4,"score":0.4300159811973572},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.4144335985183716},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.39330604672431946},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3869647979736328},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2677991986274719},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22681677341461182},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.18449947237968445},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.15161189436912537},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsitechnologyandcir46769.2022.9830467","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830467","pdf_url":null,"source":{"id":"https://openalex.org/S4363605407","display_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4399999976158142,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2067210918","https://openalex.org/W3157043473","https://openalex.org/W4245028643"],"related_works":["https://openalex.org/W4327695958","https://openalex.org/W3159522993","https://openalex.org/W3133773357","https://openalex.org/W4316469771","https://openalex.org/W2591944985","https://openalex.org/W2961615526","https://openalex.org/W4286571726","https://openalex.org/W4250508846","https://openalex.org/W2331123909","https://openalex.org/W1980730849"],"abstract_inverted_index":{"We":[0],"have":[1],"implemented":[2],"a":[3],"compact,":[4],"highly":[5],"accurate":[6],"light":[7],"detection":[8],"and":[9,28,33,65],"ranging":[10,32],"(LiDAR)":[11],"module":[12,21],"using":[13],"our":[14,51],"III/V-on-Si":[15],"optical":[16],"phased":[17],"array":[18],"(OPA).":[19],"Our":[20],"measures":[22],"only":[23],"1.4":[24],"liter":[25],"in":[26],"volume,":[27],"we":[29],"demonstrated":[30],"20-m":[31],"10-m":[34],"3D":[35,68],"imaging":[36],"with":[37],"1-cm":[38],"accuracy":[39,45],"under":[40],"100-klx":[41],"bright":[42],"sunlight.":[43],"The":[44,62],"was":[46],"improved":[47],"by":[48,55],"300%":[49],"from":[50],"previous":[52],"work":[53],"[1]":[54],"employing":[56],"sub-binning-based":[57],"digital":[58],"signal":[59],"processing":[60],"(DSP).":[61],"small":[63],"size":[64],"its":[66],"robust":[67],"depth-sensing":[69],"performance":[70],"promise":[71],"strong":[72],"commercial":[73],"viability.":[74]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":4}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}