{"id":"https://openalex.org/W4286571788","doi":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830428","title":"Advanced novel optical stack technologies for high SNR in CMOS Image Sensor","display_name":"Advanced novel optical stack technologies for high SNR in CMOS Image Sensor","publication_year":2022,"publication_date":"2022-06-12","ids":{"openalex":"https://openalex.org/W4286571788","doi":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830428"},"language":"en","primary_location":{"id":"doi:10.1109/vlsitechnologyandcir46769.2022.9830428","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830428","pdf_url":null,"source":{"id":"https://openalex.org/S4363605407","display_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084253929","display_name":"Hye Yeon Park","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Hye Yeon Park","raw_affiliation_strings":["Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030773079","display_name":"Yunki Lee","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yunki Lee","raw_affiliation_strings":["Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101407470","display_name":"Jonghoon Park","orcid":"https://orcid.org/0000-0002-0971-3002"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jonghoon Park","raw_affiliation_strings":["Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064562632","display_name":"Hyunseok Song","orcid":"https://orcid.org/0000-0002-0539-1579"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunseok Song","raw_affiliation_strings":["Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010085296","display_name":"Taesung Lee","orcid":"https://orcid.org/0000-0003-1015-7004"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taesung Lee","raw_affiliation_strings":["Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010471472","display_name":"Hyung Keun Gweon","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyung Keun Gweon","raw_affiliation_strings":["Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055046047","display_name":"Yunji Jung","orcid":"https://orcid.org/0009-0005-4298-3038"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Yunji Jung","raw_affiliation_strings":["Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106761258","display_name":"Jeongmin Bae","orcid":"https://orcid.org/0000-0002-7430-0183"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeongmin Bae","raw_affiliation_strings":["Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102018227","display_name":"Boseong Kim","orcid":"https://orcid.org/0000-0002-7437-5169"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Boseong Kim","raw_affiliation_strings":["Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069693732","display_name":"Junwon Han","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Junwon Han","raw_affiliation_strings":["Semiconductor R&D Center,Samsung Electronics,Hwaseong-si,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Semiconductor R&D Center,Samsung Electronics,Hwaseong-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100656386","display_name":"Seungwon Kim","orcid":"https://orcid.org/0000-0002-9016-8792"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungwon Kim","raw_affiliation_strings":["Semiconductor R&D Center,Samsung Electronics,Hwaseong-si,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Semiconductor R&D Center,Samsung Electronics,Hwaseong-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039175795","display_name":"Cheolsang Yoon","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Cheolsang Yoon","raw_affiliation_strings":["Semiconductor R&D Center,Samsung Electronics,Hwaseong-si,Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Semiconductor R&D Center,Samsung Electronics,Hwaseong-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5086582368","display_name":"Jeongki Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jeongki Kim","raw_affiliation_strings":["Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","Foundry Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Foundry Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046856992","display_name":"Changkeun Lee","orcid":"https://orcid.org/0000-0001-8044-4979"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Changkeun Lee","raw_affiliation_strings":["Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","Foundry Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Foundry Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028684331","display_name":"Sehoon Yoo","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sehoon Yoo","raw_affiliation_strings":["Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","Foundry Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Foundry Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072027402","display_name":"Euiyeol Kim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"EuiYeol Kim","raw_affiliation_strings":["Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","Foundry Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Foundry Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066097804","display_name":"Hyunmin Baek","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyunmin Baek","raw_affiliation_strings":["Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","Foundry Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Foundry Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5090080019","display_name":"Howoo Park","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Howoo Park","raw_affiliation_strings":["Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","Foundry Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,Foundry Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"Foundry Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025624226","display_name":"Bumsuk Kim","orcid":"https://orcid.org/0000-0002-8438-6670"},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Bumsuk Kim","raw_affiliation_strings":["Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102604026","display_name":"JungChak Ahn","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"JungChak Ahn","raw_affiliation_strings":["Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5036472245","display_name":"JoonSeo Yim","orcid":null},"institutions":[{"id":"https://openalex.org/I2250650973","display_name":"Samsung (South Korea)","ror":"https://ror.org/04w3jy968","country_code":"KR","type":"company","lineage":["https://openalex.org/I2250650973"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"JoonSeo Yim","raw_affiliation_strings":["Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Samsung Electronics,System LSI Division,Yongin-si,Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]},{"raw_affiliation_string":"System LSI Division, Samsung Electronics, Yongin-si, Republic of Korea","institution_ids":["https://openalex.org/I2250650973"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":21,"corresponding_author_ids":["https://openalex.org/A5084253929"],"corresponding_institution_ids":["https://openalex.org/I2250650973"],"apc_list":null,"apc_paid":null,"fwci":0.3224,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.37066876,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"353","last_page":"354"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12389","display_name":"Infrared Target Detection Methodologies","score":0.9857000112533569,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9749000072479248,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.8533042669296265},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.5863451957702637},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5788688063621521},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5579598546028137},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.542625904083252},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.5363259315490723},{"id":"https://openalex.org/keywords/signal-to-noise-ratio","display_name":"Signal-to-noise ratio (imaging)","score":0.5162439346313477},{"id":"https://openalex.org/keywords/stack","display_name":"Stack (abstract data type)","score":0.5142154693603516},{"id":"https://openalex.org/keywords/image-resolution","display_name":"Image resolution","score":0.5130109190940857},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.5129987597465515},{"id":"https://openalex.org/keywords/signal","display_name":"SIGNAL (programming language)","score":0.48082220554351807},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4669440984725952},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4586688280105591},{"id":"https://openalex.org/keywords/optical-filter","display_name":"Optical filter","score":0.42986544966697693},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3507388234138489},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3466961681842804},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.33849960565567017},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.29675596952438354},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2657317817211151},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.14307153224945068},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14095669984817505}],"concepts":[{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.8533042669296265},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.5863451957702637},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5788688063621521},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5579598546028137},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.542625904083252},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.5363259315490723},{"id":"https://openalex.org/C13944312","wikidata":"https://www.wikidata.org/wiki/Q7512748","display_name":"Signal-to-noise ratio (imaging)","level":2,"score":0.5162439346313477},{"id":"https://openalex.org/C9395851","wikidata":"https://www.wikidata.org/wiki/Q177929","display_name":"Stack (abstract data type)","level":2,"score":0.5142154693603516},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.5130109190940857},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.5129987597465515},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.48082220554351807},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4669440984725952},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4586688280105591},{"id":"https://openalex.org/C45613198","wikidata":"https://www.wikidata.org/wiki/Q1134091","display_name":"Optical filter","level":2,"score":0.42986544966697693},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3507388234138489},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3466961681842804},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.33849960565567017},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.29675596952438354},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2657317817211151},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.14307153224945068},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14095669984817505},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsitechnologyandcir46769.2022.9830428","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830428","pdf_url":null,"source":{"id":"https://openalex.org/S4363605407","display_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4099999964237213,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1977064738","https://openalex.org/W3006227404","https://openalex.org/W3015439375","https://openalex.org/W3135871764","https://openalex.org/W6644123276","https://openalex.org/W6921413901"],"related_works":["https://openalex.org/W2380576232","https://openalex.org/W2937054111","https://openalex.org/W2066223521","https://openalex.org/W2013178899","https://openalex.org/W373327546","https://openalex.org/W2321534397","https://openalex.org/W2058958858","https://openalex.org/W2077601556","https://openalex.org/W2148243540","https://openalex.org/W1835805572"],"abstract_inverted_index":{"Smaller":[0],"pixels":[1],"with":[2],"high":[3,76],"resolution":[4],"are":[5,85],"widely":[6],"used":[7],"for":[8],"CMOS":[9],"image":[10,29],"sensor":[11],"(CIS)":[12],"and":[13,58,68,97],"it":[14],"needs":[15],"technologies":[16],"to":[17,54,74,87],"reduce":[18],"the":[19,22,35,56,89,99,105],"size":[20,39],"of":[21,28,43,80,91,101],"chips":[23],"while":[24],"performance":[25],"or":[26],"quality":[27],"is":[30,72],"even":[31],"more":[32],"enhanced.":[33],"However,":[34],"decrease":[36],"in":[37,104],"pixel":[38,83,95,102],"inevitably":[40],"causes":[41],"degradation":[42,90],"optical":[44,69,82],"properties.":[45],"In":[46],"this":[47],"paper,":[48],"we":[49],"introduce":[50],"a":[51],"new":[52,64,81],"technique":[53],"improve":[55],"sensitivity":[57],"signal-to-noise":[59],"ratio":[60],"(SNR)":[61],"by":[62],"using":[63],"color":[65],"filter":[66],"material":[67],"structure":[70],"which":[71],"necessary":[73],"implement":[75],"resolution.":[77],"These":[78],"development":[79],"structures":[84],"able":[86],"overcome":[88],"characteristics":[92],"resulting":[93],"from":[94],"shrink":[96,103],"guarantee":[98],"possibility":[100],"future.":[106]},"counts_by_year":[{"year":2023,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}