{"id":"https://openalex.org/W4286571733","doi":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830374","title":"Demonstration of High Endurance Capability on Mega-Bit RRAM Macro and Model of ppm Level Failures","display_name":"Demonstration of High Endurance Capability on Mega-Bit RRAM Macro and Model of ppm Level Failures","publication_year":2022,"publication_date":"2022-06-12","ids":{"openalex":"https://openalex.org/W4286571733","doi":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830374"},"language":"en","primary_location":{"id":"doi:10.1109/vlsitechnologyandcir46769.2022.9830374","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830374","pdf_url":null,"source":{"id":"https://openalex.org/S4363605407","display_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102379721","display_name":"Chang-Feng Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":true,"raw_author_name":"Chang-Feng Yang","raw_affiliation_strings":["Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075430112","display_name":"Chun\u2010Yu Wu","orcid":"https://orcid.org/0000-0002-9544-8654"},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Yu Wu","raw_affiliation_strings":["Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5044472515","display_name":"Meng-Chun Shih","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Meng-Chun Shih","raw_affiliation_strings":["Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085774912","display_name":"Ming\u2010Ta Yang","orcid":"https://orcid.org/0000-0002-4874-3589"},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Ta Yang","raw_affiliation_strings":["Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109581613","display_name":"Ming-Han Yang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Han Yang","raw_affiliation_strings":["Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103916404","display_name":"Yu\u2010Tien Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yu-Tien Wu","raw_affiliation_strings":["Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5037460333","display_name":"Ta\u2010Chun Chien","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ta-Chun Chien","raw_affiliation_strings":["Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075527108","display_name":"Chih\u2010Wei Lai","orcid":"https://orcid.org/0000-0003-3571-4671"},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Wei Lai","raw_affiliation_strings":["Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072035948","display_name":"Shih-Chi Tsai","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Shih-Chi Tsai","raw_affiliation_strings":["Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102110209","display_name":"Wen-Ting Chu","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Wen-Ting Chu","raw_affiliation_strings":["Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112327269","display_name":"Arthur Hung","orcid":null},"institutions":[{"id":"https://openalex.org/I4210120917","display_name":"Taiwan Semiconductor Manufacturing Company (Taiwan)","ror":"https://ror.org/02wx79d08","country_code":"TW","type":"company","lineage":["https://openalex.org/I4210120917"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Arthur Hung","raw_affiliation_strings":["Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability,Hsinchu,Taiwan","institution_ids":["https://openalex.org/I4210120917"]},{"raw_affiliation_string":"Taiwan Semiconductor Manufacturing Company, Quality and Reliability, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210120917"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5102379721"],"corresponding_institution_ids":["https://openalex.org/I4210120917"],"apc_list":null,"apc_paid":null,"fwci":2.2345,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.88688669,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"318","last_page":"319"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"Resistive random-access memory","score":0.6928629875183105},{"id":"https://openalex.org/keywords/reset","display_name":"Reset (finance)","score":0.65828537940979},{"id":"https://openalex.org/keywords/macro","display_name":"Macro","score":0.5059840083122253},{"id":"https://openalex.org/keywords/bit","display_name":"Bit (key)","score":0.498852014541626},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4878425598144531},{"id":"https://openalex.org/keywords/quantum-tunnelling","display_name":"Quantum tunnelling","score":0.48120003938674927},{"id":"https://openalex.org/keywords/dielectric-strength","display_name":"Dielectric strength","score":0.463102787733078},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4268077611923218},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.4263761639595032},{"id":"https://openalex.org/keywords/dielectric","display_name":"Dielectric","score":0.36303073167800903},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.31490564346313477},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30746281147003174},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25393345952033997},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.23950913548469543},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.17329460382461548}],"concepts":[{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.6928629875183105},{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.65828537940979},{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.5059840083122253},{"id":"https://openalex.org/C117011727","wikidata":"https://www.wikidata.org/wiki/Q1278488","display_name":"Bit (key)","level":2,"score":0.498852014541626},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4878425598144531},{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.48120003938674927},{"id":"https://openalex.org/C70401718","wikidata":"https://www.wikidata.org/wiki/Q343241","display_name":"Dielectric strength","level":3,"score":0.463102787733078},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4268077611923218},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.4263761639595032},{"id":"https://openalex.org/C133386390","wikidata":"https://www.wikidata.org/wiki/Q184996","display_name":"Dielectric","level":2,"score":0.36303073167800903},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.31490564346313477},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30746281147003174},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25393345952033997},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.23950913548469543},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.17329460382461548},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C106159729","wikidata":"https://www.wikidata.org/wiki/Q2294553","display_name":"Financial economics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsitechnologyandcir46769.2022.9830374","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830374","pdf_url":null,"source":{"id":"https://openalex.org/S4363605407","display_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4312903428","https://openalex.org/W2621306919","https://openalex.org/W2032785938","https://openalex.org/W1966944787","https://openalex.org/W3185106882","https://openalex.org/W1980301972","https://openalex.org/W2761437135","https://openalex.org/W2086074825","https://openalex.org/W2025338515","https://openalex.org/W2108763968"],"abstract_inverted_index":{"In":[0,49],"this":[1],"work,":[2],"mega":[3],"bit":[4,71],"level":[5,104],"high":[6],"endurance":[7,24],"capability":[8],"on":[9],"RRAM":[10],"array":[11,52,75],"embedded":[12],"in":[13,46,57,122],"standard":[14],"28nm":[15],"platform":[16],"is":[17,25,60,96,111,121],"firstly":[18],"demonstrated.":[19],"500K":[20],"and":[21,30,43,72,120],"1M":[22],"cycles":[23],"achievable":[26],"with":[27,125],"2":[28],"bits":[29,32],"3":[31],"error":[33],"correction":[34],"code":[35],"design":[36],"scheme,":[37],"respectively,":[38],"by":[39,62,82,91,113],"well":[40],"optimized":[41],"SET":[42],"RESET":[44],"strength":[45],"programming":[47],"algorithm.":[48],"addition,":[50],"within":[51],"configuration":[53],"of":[54,102],"conductive":[55],"filament":[56],"statistical":[58],"view":[59],"analyzed":[61],"current":[63],"model":[64,110],"fitting.":[65],"At":[66],"0":[67],"state,":[68],"higher":[69],"resistance":[70],"post":[73],"cycling":[74],"exemplified":[76],"partially":[77],"ruptured":[78],"filament.":[79],"Moreover,":[80],"inspired":[81],"polarity":[83],"independent":[84],"failure":[85],"behavior,":[86],"additional":[87],"forming":[88],"path":[89],"initiated":[90],"field":[92],"induced":[93],"dielectric":[94],"breakdown":[95],"suggested":[97],"as":[98],"the":[99],"root":[100],"cause":[101],"ppm":[103],"failures":[105],"during":[106],"endurance.":[107],"The":[108],"proposed":[109],"validated":[112],"trap":[114],"assist":[115],"tunneling":[116],"based":[117],"Monte-Carlo":[118],"simulation":[119],"good":[123],"agreement":[124],"experimental":[126],"phenomenon.":[127]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1}],"updated_date":"2026-05-12T08:28:47.272897","created_date":"2025-10-10T00:00:00"}