{"id":"https://openalex.org/W4286571881","doi":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830225","title":"A Cryogenic CMOS Current Comparator for Spin Qubit Readout Achieving Fast Readout Time and High Current Resolution","display_name":"A Cryogenic CMOS Current Comparator for Spin Qubit Readout Achieving Fast Readout Time and High Current Resolution","publication_year":2022,"publication_date":"2022-06-12","ids":{"openalex":"https://openalex.org/W4286571881","doi":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830225"},"language":"en","primary_location":{"id":"doi:10.1109/vlsitechnologyandcir46769.2022.9830225","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830225","pdf_url":null,"source":{"id":"https://openalex.org/S4363605407","display_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004321250","display_name":"Hiroshi Fuketa","orcid":"https://orcid.org/0000-0003-0171-6679"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Hiroshi Fuketa","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST),Japan","National Institute of Advanced Industrial Science and Technology (AIST), Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST),Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078390222","display_name":"Ippei Akita","orcid":"https://orcid.org/0000-0003-1451-9287"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ippei Akita","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST),Japan","National Institute of Advanced Industrial Science and Technology (AIST), Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST),Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101054296","display_name":"Tomohiro Ishikawa","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Tomohiro Ishikawa","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST),Japan","National Institute of Advanced Industrial Science and Technology (AIST), Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST),Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112437600","display_name":"Hanpei Koike","orcid":null},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hanpei Koike","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST),Japan","National Institute of Advanced Industrial Science and Technology (AIST), Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST),Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Japan","institution_ids":["https://openalex.org/I73613424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5081968742","display_name":"Takahiro Mori","orcid":"https://orcid.org/0000-0001-5899-1060"},"institutions":[{"id":"https://openalex.org/I73613424","display_name":"National Institute of Advanced Industrial Science and Technology","ror":"https://ror.org/01703db54","country_code":"JP","type":"government","lineage":["https://openalex.org/I73613424"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takahiro Mori","raw_affiliation_strings":["National Institute of Advanced Industrial Science and Technology (AIST),Japan","National Institute of Advanced Industrial Science and Technology (AIST), Japan"],"affiliations":[{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST),Japan","institution_ids":["https://openalex.org/I73613424"]},{"raw_affiliation_string":"National Institute of Advanced Industrial Science and Technology (AIST), Japan","institution_ids":["https://openalex.org/I73613424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5004321250"],"corresponding_institution_ids":["https://openalex.org/I73613424"],"apc_list":null,"apc_paid":null,"fwci":8.7037,"has_fulltext":false,"cited_by_count":8,"citation_normalized_percentile":{"value":0.98616653,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"234","last_page":"235"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10382","display_name":"Quantum and electron transport phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10682","display_name":"Quantum Computing Algorithms and Architecture","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/comparator","display_name":"Comparator","score":0.9109126925468445},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7586922645568848},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.6116325259208679},{"id":"https://openalex.org/keywords/integrator","display_name":"Integrator","score":0.5764134526252747},{"id":"https://openalex.org/keywords/figure-of-merit","display_name":"Figure of merit","score":0.48384156823158264},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.4716733396053314},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.46566084027290344},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4505985379219055},{"id":"https://openalex.org/keywords/sampling","display_name":"Sampling (signal processing)","score":0.42293867468833923},{"id":"https://openalex.org/keywords/qubit","display_name":"Qubit","score":0.42053964734077454},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3883472979068756},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3691747188568115},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3021004796028137},{"id":"https://openalex.org/keywords/detector","display_name":"Detector","score":0.2527884244918823},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.15137439966201782},{"id":"https://openalex.org/keywords/quantum","display_name":"Quantum","score":0.15059810876846313},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.10956987738609314}],"concepts":[{"id":"https://openalex.org/C155745195","wikidata":"https://www.wikidata.org/wiki/Q1164179","display_name":"Comparator","level":3,"score":0.9109126925468445},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7586922645568848},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.6116325259208679},{"id":"https://openalex.org/C79518650","wikidata":"https://www.wikidata.org/wiki/Q2081431","display_name":"Integrator","level":3,"score":0.5764134526252747},{"id":"https://openalex.org/C130277099","wikidata":"https://www.wikidata.org/wiki/Q3676605","display_name":"Figure of merit","level":2,"score":0.48384156823158264},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.4716733396053314},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.46566084027290344},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4505985379219055},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.42293867468833923},{"id":"https://openalex.org/C203087015","wikidata":"https://www.wikidata.org/wiki/Q378201","display_name":"Qubit","level":3,"score":0.42053964734077454},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3883472979068756},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3691747188568115},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3021004796028137},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.2527884244918823},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.15137439966201782},{"id":"https://openalex.org/C84114770","wikidata":"https://www.wikidata.org/wiki/Q46344","display_name":"Quantum","level":2,"score":0.15059810876846313},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.10956987738609314},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsitechnologyandcir46769.2022.9830225","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsitechnologyandcir46769.2022.9830225","pdf_url":null,"source":{"id":"https://openalex.org/S4363605407","display_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5699999928474426,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W2069935419","https://openalex.org/W2170098818","https://openalex.org/W2794141696","https://openalex.org/W2899594858","https://openalex.org/W3099750598","https://openalex.org/W3100966077"],"related_works":["https://openalex.org/W2034349229","https://openalex.org/W4366783034","https://openalex.org/W1972415042","https://openalex.org/W4313221225","https://openalex.org/W2150642609","https://openalex.org/W2005410346","https://openalex.org/W2198645257","https://openalex.org/W2044867305","https://openalex.org/W3161676474","https://openalex.org/W67296738"],"abstract_inverted_index":{"Employing":[0],"a":[1,8,18,29,38],"precise":[2],"current":[3,9,20,45,64,75],"readout":[4,24,35,49,57,76],"circuit":[5,22],"enabled":[6],"by":[7,28,37],"integrator":[10],"and":[11,42],"correlation":[12],"double":[13],"sampling":[14],"circuit,":[15],"we":[16],"propose":[17],"cryo-CMOS":[19,83],"comparator":[21,65],"to":[23,54],"spin":[25],"qubit":[26],"states":[27],"charge":[30],"sensing":[31],"scheme.":[32],"The":[33],"reduced":[34],"time":[36],"factor":[39],"of":[40,51,89],"1/100":[41],"100-times":[43],"better":[44],"resolution":[46],"with":[47],"the":[48,55,62,67,72,80,87],"fidelity":[50],"99.9%":[52],"compared":[53],"conventional":[56,73],"systems":[58],"are":[59],"achieved.":[60],"Furthermore,":[61],"proposed":[63],"attains":[66],"best":[68],"figure-of-merit":[69],"(FoM)":[70],"among":[71],"cryogenic":[74],"circuits.":[77],"This":[78],"is":[79],"demonstration":[81],"that":[82],"technology":[84],"can":[85],"enhance":[86],"performance":[88],"quantum":[90],"computer":[91],"systems.":[92]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}