{"id":"https://openalex.org/W2065866391","doi":"https://doi.org/10.1109/vlsisoc.2007.4402479","title":"Obtaining delay distribution of dynamic logic circuits by error propagation at the electrical level","display_name":"Obtaining delay distribution of dynamic logic circuits by error propagation at the electrical level","publication_year":2007,"publication_date":"2007-10-01","ids":{"openalex":"https://openalex.org/W2065866391","doi":"https://doi.org/10.1109/vlsisoc.2007.4402479","mag":"2065866391"},"language":"en","primary_location":{"id":"doi:10.1109/vlsisoc.2007.4402479","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsisoc.2007.4402479","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IFIP International Conference on Very Large Scale Integration","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009474826","display_name":"Lucas Brusamarello","orcid":null},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Lucas Brusamarello","raw_affiliation_strings":["Institute of Inform\u00e1tica, UFRGS, Brazil","Instituto de Inform\u00e1tica \u2013 UFRGS Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Inform\u00e1tica, UFRGS, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Instituto de Inform\u00e1tica \u2013 UFRGS Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042832490","display_name":"Roberto da Silva","orcid":"https://orcid.org/0000-0001-6110-0441"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Roberto da Silva","raw_affiliation_strings":["Institute of Inform\u00e1tica, UFRGS, Brazil","Instituto de Inform\u00e1tica \u2013 UFRGS Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Inform\u00e1tica, UFRGS, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Instituto de Inform\u00e1tica \u2013 UFRGS Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022015482","display_name":"Gilson Wirth","orcid":"https://orcid.org/0000-0002-4990-5113"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Gilson I. Wirth","raw_affiliation_strings":["Departmento de Engenharia El\u00e9trica, UFRGS, Brazil","Departamento de Engenharia El\u00e9trica - UFRGS, Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departmento de Engenharia El\u00e9trica, UFRGS, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Departamento de Engenharia El\u00e9trica - UFRGS, Brazil","institution_ids":["https://openalex.org/I130442723"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108043721","display_name":"Ricardo Reis","orcid":"https://orcid.org/0000-0001-5781-5858"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Ricardo A. L. Reis","raw_affiliation_strings":["Institute of Inform\u00e1tica, UFRGS, Brazil","Instituto de Inform\u00e1tica \u2013 UFRGS Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Inform\u00e1tica, UFRGS, Brazil","institution_ids":["https://openalex.org/I130442723"]},{"raw_affiliation_string":"Instituto de Inform\u00e1tica \u2013 UFRGS Brazil","institution_ids":["https://openalex.org/I130442723"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I130442723"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15607605,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2","issue":null,"first_page":"94","last_page":"98"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.6587957143783569},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6176770329475403},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6014575362205505},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5422206521034241},{"id":"https://openalex.org/keywords/leakage","display_name":"Leakage (economics)","score":0.5235916376113892},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5004534721374512},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.46369990706443787},{"id":"https://openalex.org/keywords/propagation-of-uncertainty","display_name":"Propagation of uncertainty","score":0.4440707862377167},{"id":"https://openalex.org/keywords/logic-synthesis","display_name":"Logic synthesis","score":0.43306198716163635},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.42201119661331177},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.26331353187561035},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22950822114944458},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20054075121879578},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1760912835597992}],"concepts":[{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.6587957143783569},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6176770329475403},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6014575362205505},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5422206521034241},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.5235916376113892},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5004534721374512},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.46369990706443787},{"id":"https://openalex.org/C123614077","wikidata":"https://www.wikidata.org/wiki/Q1364905","display_name":"Propagation of uncertainty","level":2,"score":0.4440707862377167},{"id":"https://openalex.org/C157922185","wikidata":"https://www.wikidata.org/wiki/Q173198","display_name":"Logic synthesis","level":3,"score":0.43306198716163635},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.42201119661331177},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.26331353187561035},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22950822114944458},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20054075121879578},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1760912835597992},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsisoc.2007.4402479","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsisoc.2007.4402479","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2007 IFIP International Conference on Very Large Scale Integration","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6700000166893005,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1508076293","https://openalex.org/W1987450039","https://openalex.org/W2083124406","https://openalex.org/W2104628168","https://openalex.org/W2107566947","https://openalex.org/W2118621836","https://openalex.org/W2120432055","https://openalex.org/W2123021960","https://openalex.org/W2125892790","https://openalex.org/W2142910310","https://openalex.org/W2160840734","https://openalex.org/W2168559772","https://openalex.org/W3172772885","https://openalex.org/W6797258325"],"related_works":["https://openalex.org/W2098419840","https://openalex.org/W1966764473","https://openalex.org/W2789349722","https://openalex.org/W1985308002","https://openalex.org/W2614722573","https://openalex.org/W2121963733","https://openalex.org/W1977171228","https://openalex.org/W2059422871","https://openalex.org/W2041787842","https://openalex.org/W2170504327"],"abstract_inverted_index":{"In":[0],"deep-sub-micron":[1],"technologies,":[2],"process":[3],"variability":[4],"challenges":[5],"the":[6,26,100],"design":[7],"of":[8,28,37,40,67,83,102],"high":[9],"yield":[10,45,51,66],"integrated":[11],"circuits.":[12],"While":[13],"device":[14],"critical":[15],"dimensions":[16],"and":[17],"threshold":[18],"voltage":[19],"shrink,":[20],"leakage":[21],"currents":[22],"drastically":[23],"increase,":[24],"threatening":[25],"feasibility":[27],"reliable":[29],"dynamic":[30,54,84,89,92],"logic":[31,55],"gates.":[32],"Electrical":[33],"level":[34],"statistical":[35],"characterization":[36],"this":[38],"kind":[39],"gates":[41,56,85,90],"is":[42],"essential":[43],"for":[44,53,99],"analysis.":[46],"This":[47],"paper":[48],"proposes":[49],"a":[50,68,80],"model":[52],"based":[57],"on":[58],"error":[59,106],"propagation":[60],"using":[61,70,91],"numerical":[62,97],"methods.":[63],"We":[64],"study":[65],"dynamic-NOR":[69],"static":[71],"keeper.":[72],"The":[73,108],"analytical":[74],"formulations":[75],"can":[76],"be":[77],"extended":[78],"to":[79,118,127],"wide":[81],"range":[82],"(for":[86],"example":[87],"pre-charge":[88],"keeper)":[93],"because":[94],"we":[95],"use":[96],"approach":[98],"calculation":[101],"derivatives":[103],"required":[104],"by":[105],"propagation.":[107],"proposed":[109],"methodology":[110],"presents":[111],"errors":[112],"less":[113],"than":[114],"2%":[115],"as":[116],"compared":[117],"Monte":[119],"Carlo":[120],"simulation,":[121],"while":[122],"increasing":[123],"computational":[124],"efficiency":[125],"up":[126],"50\u00d7.":[128]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}