{"id":"https://openalex.org/W4388893947","doi":"https://doi.org/10.1109/vlsi-soc57769.2023.10321888","title":"Soft Error Immune with Enhanced Critical Charge SIC14T SRAM Cell for Avionics Applications","display_name":"Soft Error Immune with Enhanced Critical Charge SIC14T SRAM Cell for Avionics Applications","publication_year":2023,"publication_date":"2023-10-16","ids":{"openalex":"https://openalex.org/W4388893947","doi":"https://doi.org/10.1109/vlsi-soc57769.2023.10321888"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-soc57769.2023.10321888","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/vlsi-soc57769.2023.10321888","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101269829","display_name":"Sagheer Ahmed","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127441","display_name":"Indian Institute of Technology Jammu","ror":"https://ror.org/02f0vsw63","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210127441"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Sagheer Ahmed","raw_affiliation_strings":["Indian Institute of Technology Jammu,IC-ResQ Lab,Department of Electrical Engineering,J&K,India,181221"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Jammu,IC-ResQ Lab,Department of Electrical Engineering,J&K,India,181221","institution_ids":["https://openalex.org/I4210127441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5093314684","display_name":"Jayesh Ambulkar","orcid":null},"institutions":[{"id":"https://openalex.org/I4210127441","display_name":"Indian Institute of Technology Jammu","ror":"https://ror.org/02f0vsw63","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210127441"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Jayesh Ambulkar","raw_affiliation_strings":["Indian Institute of Technology Jammu,IC-ResQ Lab,Department of Electrical Engineering,J&K,India,181221"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Jammu,IC-ResQ Lab,Department of Electrical Engineering,J&K,India,181221","institution_ids":["https://openalex.org/I4210127441"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102751673","display_name":"Debabrata Mondal","orcid":"https://orcid.org/0009-0007-7793-9066"},"institutions":[{"id":"https://openalex.org/I4210127441","display_name":"Indian Institute of Technology Jammu","ror":"https://ror.org/02f0vsw63","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210127441"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Debabrata Mondal","raw_affiliation_strings":["Indian Institute of Technology Jammu,IC-ResQ Lab,Department of Electrical Engineering,J&K,India,181221"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Jammu,IC-ResQ Lab,Department of Electrical Engineering,J&K,India,181221","institution_ids":["https://openalex.org/I4210127441"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035985978","display_name":"Ambika Prasad Shah","orcid":"https://orcid.org/0000-0003-0810-814X"},"institutions":[{"id":"https://openalex.org/I4210127441","display_name":"Indian Institute of Technology Jammu","ror":"https://ror.org/02f0vsw63","country_code":"IN","type":"education","lineage":["https://openalex.org/I4210127441"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ambika Prasad Shah","raw_affiliation_strings":["Indian Institute of Technology Jammu,IC-ResQ Lab,Department of Electrical Engineering,J&K,India,181221"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indian Institute of Technology Jammu,IC-ResQ Lab,Department of Electrical Engineering,J&K,India,181221","institution_ids":["https://openalex.org/I4210127441"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210127441"],"apc_list":null,"apc_paid":null,"fwci":0.5409,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.59247119,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9944999814033508,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9883000254631042,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.8337414264678955},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.8015778064727783},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6203139424324036},{"id":"https://openalex.org/keywords/avionics","display_name":"Avionics","score":0.5778588056564331},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.4766032099723816},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46312886476516724},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4444124102592468},{"id":"https://openalex.org/keywords/memory-cell","display_name":"Memory cell","score":0.43942829966545105},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.4142320156097412},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39428842067718506},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.38298484683036804},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3742572069168091},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.30189478397369385},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.2940070629119873},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.23798194527626038},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2275172472000122},{"id":"https://openalex.org/keywords/aerospace-engineering","display_name":"Aerospace engineering","score":0.08028537034988403}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8337414264678955},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.8015778064727783},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6203139424324036},{"id":"https://openalex.org/C15792166","wikidata":"https://www.wikidata.org/wiki/Q221329","display_name":"Avionics","level":2,"score":0.5778588056564331},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.4766032099723816},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46312886476516724},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4444124102592468},{"id":"https://openalex.org/C2776638159","wikidata":"https://www.wikidata.org/wiki/Q18343761","display_name":"Memory cell","level":4,"score":0.43942829966545105},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.4142320156097412},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39428842067718506},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.38298484683036804},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3742572069168091},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.30189478397369385},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.2940070629119873},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.23798194527626038},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2275172472000122},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.08028537034988403},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-soc57769.2023.10321888","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/vlsi-soc57769.2023.10321888","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W2033453286","https://openalex.org/W2901644239","https://openalex.org/W2996327265","https://openalex.org/W3009808216","https://openalex.org/W3120813255","https://openalex.org/W3137664271","https://openalex.org/W3162523375","https://openalex.org/W3174797530","https://openalex.org/W4318710893","https://openalex.org/W4376624422"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W1500230652","https://openalex.org/W2363504003","https://openalex.org/W2066033226","https://openalex.org/W2548582980","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W2612883256","https://openalex.org/W4386933833","https://openalex.org/W1030007664"],"abstract_inverted_index":{"The":[0,120],"impact":[1],"of":[2,65,71,100,115],"high-energy":[3],"particles":[4,12],"in":[5,17,89,93],"space":[6],"like":[7],"cosmic":[8],"rays":[9],"and":[10,43,56,82,102,108,128,138],"alpha":[11],"flips":[13],"the":[14,63,66,78,112,142],"stored":[15],"data":[16],"an":[18,45],"SRAM":[19,36,74,84,122],"cell.":[20],"This":[21],"paper":[22],"proposes":[23],"a":[24,97],"highly":[25],"reliable":[26],"soft":[27],"error":[28],"immune":[29],"with":[30,69,96,144],"enhanced":[31],"critical":[32,47,139],"charge":[33,48,140],"14T":[34],"(SIC14T)":[35],"cell":[37,68,85,123],"that":[38,49,70],"is":[39],"radiation-hardened":[40],"by":[41],"design":[42],"has":[44,124],"increased":[46],"can":[50],"withstand":[51],"both":[52],"single-event":[53,57],"upsets":[54,59],"(SEU)":[55],"multi-node":[58],"(SEMNU).":[60],"We":[61],"compare":[62],"performance":[64],"proposed":[67,121],"other":[72],"considered":[73],"cells,":[75],"such":[76],"as":[77],"SRRD12T,":[79],"RSP14T,":[80],"SEA14T,":[81],"6T":[83],"which":[86],"were":[87],"simulated":[88],"45-nm":[90],"CMOS":[91],"technology":[92],"Cadence":[94],"Virtuoso":[95],"supply":[98],"voltage":[99],"1V":[101],"27\u00b0C":[103],"operating":[104],"temperature.":[105],"Both":[106],"SEU":[107],"SEMNU":[109],"caused":[110],"at":[111],"storage":[113],"node":[114],"SIC14T":[116],"are":[117],"successfully":[118],"recovered.":[119],"1.02\u00d7,":[125],"0.6\u00d7,":[126],"0.72\u00d7,":[127],"4.64\u00d7":[129],"better":[130],"write":[131],"stability,":[132],"read":[133],"access":[134],"time,":[135],"leakage":[136],"power,":[137],"than":[141],"SRRD12T":[143],"1.68\u00d7":[145],"area":[146],"overhead.":[147]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}