{"id":"https://openalex.org/W3199459975","doi":"https://doi.org/10.1109/vlsi-soc53125.2021.9606985","title":"On the Evaluation of SEEs on Open-Source Embedded Static RAMs","display_name":"On the Evaluation of SEEs on Open-Source Embedded Static RAMs","publication_year":2021,"publication_date":"2021-10-04","ids":{"openalex":"https://openalex.org/W3199459975","doi":"https://doi.org/10.1109/vlsi-soc53125.2021.9606985","mag":"3199459975"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-soc53125.2021.9606985","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc53125.2021.9606985","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004083312","display_name":"Sarah Azimi","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"S. Azimi","raw_affiliation_strings":["Politecnico di Torino,Dipartimento di Automatica e Informatica,Torino,Italy","Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Dipartimento di Automatica e Informatica,Torino,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5018567565","display_name":"Corrado De Sio","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"C. De Sio","raw_affiliation_strings":["Politecnico di Torino,Dipartimento di Automatica e Informatica,Torino,Italy","Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Dipartimento di Automatica e Informatica,Torino,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021426042","display_name":"Luca Sterpone","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Sterpone","raw_affiliation_strings":["Politecnico di Torino,Dipartimento di Automatica e Informatica,Torino,Italy","Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy"],"affiliations":[{"raw_affiliation_string":"Politecnico di Torino,Dipartimento di Automatica e Informatica,Torino,Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5004083312"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.2005,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.5099065,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9937000274658203,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9929999709129333,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.9184982776641846},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6751102209091187},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6563961505889893},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6019587516784668},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5428926348686218},{"id":"https://openalex.org/keywords/compiler","display_name":"Compiler","score":0.5210075378417969},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.435005247592926},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.2752862870693207},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.22203752398490906},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18789169192314148},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12819862365722656},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.12051582336425781}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.9184982776641846},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6751102209091187},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6563961505889893},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6019587516784668},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5428926348686218},{"id":"https://openalex.org/C169590947","wikidata":"https://www.wikidata.org/wiki/Q47506","display_name":"Compiler","level":2,"score":0.5210075378417969},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.435005247592926},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.2752862870693207},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.22203752398490906},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18789169192314148},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12819862365722656},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.12051582336425781},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-soc53125.2021.9606985","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc53125.2021.9606985","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2021 IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.7300000190734863,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1969189258","https://openalex.org/W1970484880","https://openalex.org/W1974714003","https://openalex.org/W2033522216","https://openalex.org/W2038213992","https://openalex.org/W2069909337","https://openalex.org/W2096927458","https://openalex.org/W2105175332","https://openalex.org/W2106339466","https://openalex.org/W2114790701","https://openalex.org/W2119919753","https://openalex.org/W2120000030","https://openalex.org/W2130512204","https://openalex.org/W2135005342","https://openalex.org/W2141068710","https://openalex.org/W2148186459","https://openalex.org/W2520921847","https://openalex.org/W2537959404","https://openalex.org/W2604465481","https://openalex.org/W3040087426","https://openalex.org/W3088494275","https://openalex.org/W3112615326","https://openalex.org/W3115167365","https://openalex.org/W3122141613","https://openalex.org/W3174835652","https://openalex.org/W6660154263"],"related_works":["https://openalex.org/W3151633427","https://openalex.org/W3096456556","https://openalex.org/W4240253816","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W4293253840","https://openalex.org/W4378977321","https://openalex.org/W2967161359","https://openalex.org/W1976168335"],"abstract_inverted_index":{"Static":[0],"RAM":[1],"modules":[2,40],"are":[3,16,41],"widely":[4],"adopted":[5],"in":[6,18,23,144],"high":[7,185],"performance":[8],"systems.":[9],"Single":[10],"Event":[11],"Effects":[12],"(SEEs)":[13],"resilient":[14,38],"memories":[15],"required":[17],"many":[19],"embedded":[20,83],"systems":[21],"applied":[22,129],"automotive":[24],"and":[25,55,80,111,148,196,199],"aerospace":[26],"applications":[27],"to":[28,51,57,64,98,130,150,175],"increase":[29],"their":[30],"overall":[31],"resiliency":[32,60],"against":[33],"SEEs.":[34],"The":[35,139],"current":[36],"SEE":[37,182],"SRAM":[39,109,118],"obtained":[42],"by":[43,46,86,161],"applying":[44],"radiation-hardened":[45],"design":[47],"solutions":[48],"which":[49],"leads":[50],"elevated":[52],"area":[53,200],"overhead":[54,201],"difficulty":[56],"tune":[58],"the":[59,65,78,87,100,103,108,113,117,124,131,136,145,158,176,181],"capability":[61],"with":[62,107,173,190],"respect":[63,174],"particle's":[66],"radiation":[67,93,105,164],"profile.":[68],"To":[69],"overcome":[70],"these":[71],"limitations,":[72],"we":[73],"propose":[74],"a":[75,152,167],"methodology":[76],"for":[77,180],"analysis":[79,94,165],"mitigation":[81],"of":[82,102,116,123,193,202],"SRAMs":[84],"generated":[85],"OpenRAM":[88,146],"memory":[89],"compiler.":[90],"A":[91,120],"technology-oriented":[92],"tool":[95],"is":[96,142],"presented":[97],"support":[99],"interaction":[101],"charged":[104],"particles":[106],"layout":[110,137],"depict":[112],"sensitive":[114,125],"transistors":[115,126],"memory.":[119],"selective":[121],"duplication":[122],"has":[127],"been":[128],"6T-SRAM":[132,178],"cell":[133,141,179],"designed":[134,140],"at":[135,184],"level.":[138],"included":[143],"compiler":[147],"used":[149],"generate":[151],"mitigated":[153],"8Kb":[154],"SRAM-bank.":[155],"We":[156],"evaluated":[157],"SEEs":[159],"sensitivity":[160,183],"comparative":[162],"simulation-based":[163],"observing":[166],"reduction":[168],"more":[169],"than":[170,204],"6":[171],"times":[172],"original":[177],"energy":[186],"heavy":[187],"ions":[188],"particles,":[189],"negligible":[191],"degradation":[192],"operations":[194],"margins":[195],"power":[197],"consumption":[198],"less":[203],"$\\sim$":[205],"4%.":[206]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":2}],"updated_date":"2026-01-28T23:14:49.684275","created_date":"2025-10-10T00:00:00"}