{"id":"https://openalex.org/W2555206104","doi":"https://doi.org/10.1109/vlsi-soc.2016.7753573","title":"Comparative analysis of redundancy schemes for soft-error detection in low-cost space applications","display_name":"Comparative analysis of redundancy schemes for soft-error detection in low-cost space applications","publication_year":2016,"publication_date":"2016-09-01","ids":{"openalex":"https://openalex.org/W2555206104","doi":"https://doi.org/10.1109/vlsi-soc.2016.7753573","mag":"2555206104"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-soc.2016.7753573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2016.7753573","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5053902946","display_name":"Charlotte Frenkel","orcid":"https://orcid.org/0000-0002-1879-0288"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":true,"raw_author_name":"Charlotte Frenkel","raw_affiliation_strings":["ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium"],"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070230046","display_name":"Jean-Didier Legat","orcid":"https://orcid.org/0000-0001-7147-5124"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"Jean-Didier Legat","raw_affiliation_strings":["ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium"],"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5065138463","display_name":"David Bol","orcid":"https://orcid.org/0000-0002-2678-1613"},"institutions":[{"id":"https://openalex.org/I95674353","display_name":"UCLouvain","ror":"https://ror.org/02495e989","country_code":"BE","type":"education","lineage":["https://openalex.org/I95674353"]}],"countries":["BE"],"is_corresponding":false,"raw_author_name":"David Bol","raw_affiliation_strings":["ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium"],"affiliations":[{"raw_affiliation_string":"ICTEAM Institute, Universit\u00e9 catholique de Louvain, Louvain-la-Neuve, Belgium","institution_ids":["https://openalex.org/I95674353"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5053902946"],"corresponding_institution_ids":["https://openalex.org/I95674353"],"apc_list":null,"apc_paid":null,"fwci":0.7467,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.76150611,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":"32","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10829","display_name":"Interconnection Networks and Systems","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/redundancy","display_name":"Redundancy (engineering)","score":0.8771218061447144},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7744430303573608},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7675081491470337},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.5973225831985474},{"id":"https://openalex.org/keywords/microprocessor","display_name":"Microprocessor","score":0.5893683433532715},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5869399905204773},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.585451602935791},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.5690908432006836},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.5230841636657715},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3393532633781433},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3046795427799225},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.29509204626083374},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.2892695665359497},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10193094611167908}],"concepts":[{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.8771218061447144},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7744430303573608},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7675081491470337},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.5973225831985474},{"id":"https://openalex.org/C2780728072","wikidata":"https://www.wikidata.org/wiki/Q5297","display_name":"Microprocessor","level":2,"score":0.5893683433532715},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5869399905204773},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.585451602935791},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.5690908432006836},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.5230841636657715},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3393532633781433},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3046795427799225},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.29509204626083374},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2892695665359497},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10193094611167908},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/vlsi-soc.2016.7753573","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2016.7753573","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2016 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},{"id":"pmh:oai:dial.uclouvain.be:boreal:181096","is_oa":false,"landing_page_url":"http://hdl.handle.net/2078.1/181096","pdf_url":null,"source":{"id":"https://openalex.org/S4306401902","display_name":"Digital Access to Libraries (Universit\u00e9 catholique de Louvain (UCL), l'Universit\u00e9 de Namur (UNamur) and the Universit\u00e9 Saint-Louis (USL-B))","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I95674353","host_organization_name":"UCLouvain","host_organization_lineage":["https://openalex.org/I95674353"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"mag:3175559568","is_oa":false,"landing_page_url":"https://jglobal.jst.go.jp/en/detail?JGLOBAL_ID=201602233746636431","pdf_url":null,"source":{"id":"https://openalex.org/S4306512817","display_name":"IEEE Conference Proceedings","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":null,"raw_source_name":"IEEE Conference Proceedings","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.41999998688697815,"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1650942424","https://openalex.org/W1669302834","https://openalex.org/W2096568519","https://openalex.org/W2096692505","https://openalex.org/W2099569658","https://openalex.org/W2104677471","https://openalex.org/W2119482888","https://openalex.org/W2126901998","https://openalex.org/W2132529273","https://openalex.org/W2165297788","https://openalex.org/W2169213530","https://openalex.org/W3149410719","https://openalex.org/W4236432903","https://openalex.org/W6677993950"],"related_works":["https://openalex.org/W2531550288","https://openalex.org/W2149041233","https://openalex.org/W2171347834","https://openalex.org/W2066042903","https://openalex.org/W3040935927","https://openalex.org/W1993206924","https://openalex.org/W2518564956","https://openalex.org/W2066664769","https://openalex.org/W2168546702","https://openalex.org/W2394408226"],"abstract_inverted_index":{"Single-Event":[0],"Effects":[1],"are":[2,18,62],"an":[3],"increasingly":[4],"important":[5],"issue":[6],"in":[7,29],"electronic":[8],"circuits":[9,22],"due":[10],"to":[11,24],"technology":[12],"scaling,":[13],"efficient":[14],"error":[15,79],"detection":[16,80],"schemes":[17,42,61],"thus":[19],"required":[20],"for":[21,93],"dedicated":[23],"radiative":[25],"environments,":[26],"such":[27],"as":[28,75],"space":[30],"applications.":[31],"This":[32],"work":[33],"shows":[34],"that":[35],"the":[36,69],"widespread":[37],"spatial":[38],"and":[39,51,64,89],"temporal":[40],"redundancy":[41,60],"exhibit":[43],"widely":[44],"different":[45],"performances":[46],"depending":[47],"on":[48],"technology,":[49],"environment":[50],"circuit":[52],"architecture":[53],"parameters.":[54],"Following":[55],"these":[56],"results,":[57],"three":[58],"new":[59],"proposed":[63],"compared:":[65],"one":[66],"of":[67],"them,":[68],"Forward":[70],"Temporal":[71],"Redundancy,":[72],"stands":[73],"out":[74],"it":[76],"achieves":[77],"full":[78],"with":[81],"limited":[82],"timing":[83],"penalty":[84],"at":[85],"only":[86],"100%":[87],"sequential":[88],"45%":[90],"combinational":[91],"overheads":[92],"a":[94],"benchmark":[95],"pipelined":[96],"MIPS":[97],"microprocessor.":[98]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}