{"id":"https://openalex.org/W1901339374","doi":"https://doi.org/10.1109/vlsi-soc.2015.7314433","title":"A new sizing approach for lifetime improvement of nanoscale digital circuits due to BTI aging","display_name":"A new sizing approach for lifetime improvement of nanoscale digital circuits due to BTI aging","publication_year":2015,"publication_date":"2015-10-01","ids":{"openalex":"https://openalex.org/W1901339374","doi":"https://doi.org/10.1109/vlsi-soc.2015.7314433","mag":"1901339374"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-soc.2015.7314433","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2015.7314433","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112241911","display_name":"Andres Gomez","orcid":null},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":true,"raw_author_name":"Andres Gomez","raw_affiliation_strings":["Dept. of Electronic Engineering, National Institute for Astrophysics, Mexico","Dept. of Electronic Engineering, National Institute for Astrophysics, Optics and Electronics - INAOE, Mexico"],"affiliations":[{"raw_affiliation_string":"Dept. of Electronic Engineering, National Institute for Astrophysics, Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"Dept. of Electronic Engineering, National Institute for Astrophysics, Optics and Electronics - INAOE, Mexico","institution_ids":["https://openalex.org/I39824353"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5038219219","display_name":"Victor Champac","orcid":"https://orcid.org/0000-0002-4440-3800"},"institutions":[{"id":"https://openalex.org/I39824353","display_name":"National Institute of Astrophysics, Optics and Electronics","ror":"https://ror.org/00bpmmc63","country_code":"MX","type":"facility","lineage":["https://openalex.org/I39824353"]}],"countries":["MX"],"is_corresponding":false,"raw_author_name":"Victor Champac","raw_affiliation_strings":["Dept. of Electronic Engineering, National Institute for Astrophysics, Mexico","Dept. of Electronic Engineering, National Institute for Astrophysics, Optics and Electronics - INAOE, Mexico"],"affiliations":[{"raw_affiliation_string":"Dept. of Electronic Engineering, National Institute for Astrophysics, Mexico","institution_ids":["https://openalex.org/I39824353"]},{"raw_affiliation_string":"Dept. of Electronic Engineering, National Institute for Astrophysics, Optics and Electronics - INAOE, Mexico","institution_ids":["https://openalex.org/I39824353"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5112241911"],"corresponding_institution_ids":["https://openalex.org/I39824353"],"apc_list":null,"apc_paid":null,"fwci":0.3946,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.65916972,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"297","last_page":"302"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.6391482949256897},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6211154460906982},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.6020892262458801},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"Circuit reliability","score":0.5775137543678284},{"id":"https://openalex.org/keywords/sizing","display_name":"Sizing","score":0.5769025683403015},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5675452947616577},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.5472046136856079},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5453989505767822},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5286819338798523},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5152049660682678},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.5004489421844482},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4868756830692291},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.46877092123031616},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4548431634902954},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3662875294685364},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.32656773924827576},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30094578862190247},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.16546037793159485},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08708131313323975},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07140457630157471}],"concepts":[{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.6391482949256897},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6211154460906982},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.6020892262458801},{"id":"https://openalex.org/C2778309119","wikidata":"https://www.wikidata.org/wiki/Q5121614","display_name":"Circuit reliability","level":4,"score":0.5775137543678284},{"id":"https://openalex.org/C2777767291","wikidata":"https://www.wikidata.org/wiki/Q1080291","display_name":"Sizing","level":2,"score":0.5769025683403015},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5675452947616577},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.5472046136856079},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5453989505767822},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5286819338798523},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5152049660682678},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.5004489421844482},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4868756830692291},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.46877092123031616},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4548431634902954},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3662875294685364},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.32656773924827576},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30094578862190247},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.16546037793159485},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08708131313323975},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07140457630157471},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-soc.2015.7314433","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2015.7314433","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321739","display_name":"Consejo Nacional de Ciencia y Tecnolog\u00eda","ror":"https://ror.org/059ex5q34"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W1600691640","https://openalex.org/W1782430720","https://openalex.org/W1984833777","https://openalex.org/W1998401102","https://openalex.org/W1999919743","https://openalex.org/W2101686625","https://openalex.org/W2120893974","https://openalex.org/W2135748666","https://openalex.org/W2140103399","https://openalex.org/W2141565132","https://openalex.org/W2165130438","https://openalex.org/W2170333286","https://openalex.org/W2407062564","https://openalex.org/W4232234266","https://openalex.org/W6675202185"],"related_works":["https://openalex.org/W1980349267","https://openalex.org/W2098419840","https://openalex.org/W2140610743","https://openalex.org/W2116326546","https://openalex.org/W2097637358","https://openalex.org/W2151104031","https://openalex.org/W2765435638","https://openalex.org/W3134372534","https://openalex.org/W2121863912","https://openalex.org/W2152913847"],"abstract_inverted_index":{"Bias":[0],"Temperature":[1],"Instability":[2],"(BTI)":[3],"has":[4],"become":[5],"a":[6,32,46,74,80,85,108,146],"major":[7],"aging":[8],"issue":[9],"for":[10],"circuit":[11,22,147],"lifetime":[12,144],"reliability":[13],"in":[14,103,110],"deeply":[15],"scaled":[16],"CMOS":[17],"technologies.":[18],"Due":[19],"to":[20,31,50,70,118,140],"BTI,":[21],"delay":[23,54,68,82,86,115,125,137],"increases":[24],"as":[25],"time":[26],"progress,":[27],"which":[28],"may":[29],"lead":[30],"timing":[33],"constraint":[34],"violation":[35],"before":[36],"the":[37,40,64,67,92,104,114,123,134,143],"end":[38],"of":[39,56,73,107,136,145],"expected":[41],"lifetime.":[42],"This":[43],"paper":[44],"proposes":[45],"new":[47],"sizing":[48,72,132],"approach":[49,60],"mitigate":[51],"BTI":[52,119],"induced":[53],"degradation":[55,87,116,138],"digital":[57,75],"circuits.":[58],"The":[59],"is":[61,77,120],"based":[62],"on":[63],"observation":[65],"that":[66,113],"sensitivity":[69,83,88],"transistor":[71],"gate":[76],"composed":[78],"by":[79],"nominal":[81,124],"and":[84,151],"components.":[89],"By":[90,129],"exploiting":[91],"differences":[93],"between":[94],"these":[95],"two":[96],"components,":[97],"one":[98],"can":[99],"size":[100],"some":[101],"gates":[102],"critical":[105],"paths":[106],"circuit,":[109],"such":[111],"way":[112],"due":[117],"reduced":[121],"while":[122],"remains":[126],"nearly":[127],"unchanged.":[128],"using":[130],"our":[131],"approach,":[133],"reduction":[135],"allows":[139],"further":[141],"extend":[142],"with":[148],"negligible":[149],"area":[150],"power":[152],"overhead.":[153]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}