{"id":"https://openalex.org/W1898386713","doi":"https://doi.org/10.1109/vlsi-soc.2015.7314411","title":"Scalable algorithm for structural fault collapsing in digital circuits","display_name":"Scalable algorithm for structural fault collapsing in digital circuits","publication_year":2015,"publication_date":"2015-10-01","ids":{"openalex":"https://openalex.org/W1898386713","doi":"https://doi.org/10.1109/vlsi-soc.2015.7314411","mag":"1898386713"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-soc.2015.7314411","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2015.7314411","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5010536057","display_name":"Raimund Ubar","orcid":"https://orcid.org/0000-0001-8186-4385"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Raimund Ubar","raw_affiliation_strings":["Department of Computer Engineering, TTU, Tallinn, Estonia","Department of Computer Engineering, TTU, Ehitajate tee 5, 19086 Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, TTU, Tallinn, Estonia","institution_ids":[]},{"raw_affiliation_string":"Department of Computer Engineering, TTU, Ehitajate tee 5, 19086 Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060713767","display_name":"Lembit J\u00fcrim\u00e4gi","orcid":"https://orcid.org/0000-0002-6914-2838"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Lembit Jurimagi","raw_affiliation_strings":["Department of Computer Engineering, TTU, Tallinn, Estonia","Department of Computer Engineering, TTU, Ehitajate tee 5, 19086 Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, TTU, Tallinn, Estonia","institution_ids":[]},{"raw_affiliation_string":"Department of Computer Engineering, TTU, Ehitajate tee 5, 19086 Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052820399","display_name":"E. Orasson","orcid":null},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Elmet Orasson","raw_affiliation_strings":["Department of Computer Engineering, TTU, Tallinn, Estonia","Department of Computer Engineering, TTU, Ehitajate tee 5, 19086 Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, TTU, Tallinn, Estonia","institution_ids":[]},{"raw_affiliation_string":"Department of Computer Engineering, TTU, Ehitajate tee 5, 19086 Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010286547","display_name":"Jaan Raik","orcid":"https://orcid.org/0000-0001-8113-020X"},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Jaan Raik","raw_affiliation_strings":["Department of Computer Engineering, TTU, Tallinn, Estonia","Department of Computer Engineering, TTU, Ehitajate tee 5, 19086 Tallinn, Estonia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, TTU, Tallinn, Estonia","institution_ids":[]},{"raw_affiliation_string":"Department of Computer Engineering, TTU, Ehitajate tee 5, 19086 Tallinn, Estonia","institution_ids":["https://openalex.org/I111112146"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I111112146"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"c 22","issue":null,"first_page":"171","last_page":"176"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11522","display_name":"VLSI and FPGA Design Techniques","score":0.9962999820709229,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9961000084877014,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.6994622945785522},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6514315009117126},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.6432844400405884},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5799195170402527},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5716078281402588},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.5627437829971313},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.49871301651000977},{"id":"https://openalex.org/keywords/digital-electronics","display_name":"Digital electronics","score":0.4770766496658325},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.46747705340385437},{"id":"https://openalex.org/keywords/fault-model","display_name":"Fault model","score":0.4642788767814636},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.42831045389175415},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.4205198884010315},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4012395739555359},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.33992522954940796},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.20711055397987366},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20434901118278503},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14098355174064636}],"concepts":[{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.6994622945785522},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6514315009117126},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.6432844400405884},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5799195170402527},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5716078281402588},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.5627437829971313},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.49871301651000977},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.4770766496658325},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.46747705340385437},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.4642788767814636},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.42831045389175415},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.4205198884010315},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4012395739555359},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.33992522954940796},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.20711055397987366},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20434901118278503},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14098355174064636},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-soc.2015.7314411","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2015.7314411","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":21,"referenced_works":["https://openalex.org/W1610153840","https://openalex.org/W1964747036","https://openalex.org/W1964866107","https://openalex.org/W1979404875","https://openalex.org/W2023826858","https://openalex.org/W2049423177","https://openalex.org/W2080267935","https://openalex.org/W2108159261","https://openalex.org/W2109508018","https://openalex.org/W2111525550","https://openalex.org/W2111705765","https://openalex.org/W2112078647","https://openalex.org/W2142900162","https://openalex.org/W2152040677","https://openalex.org/W2152406824","https://openalex.org/W2156524662","https://openalex.org/W2159880265","https://openalex.org/W2546264495","https://openalex.org/W3144136025","https://openalex.org/W4240513729","https://openalex.org/W6683667564"],"related_works":["https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W2340957901","https://openalex.org/W1555400249","https://openalex.org/W2031110496","https://openalex.org/W2157154381","https://openalex.org/W2568949342","https://openalex.org/W2037862379","https://openalex.org/W4253743993","https://openalex.org/W4252048065"],"abstract_inverted_index":{"The":[0,29,87,122],"paper":[1,88],"presents":[2,89],"a":[3,50,61,75,94,131,156],"new":[4],"algorithm":[5,91,123],"for":[6,14,79,97,142,155,168],"structural":[7,143,169],"fault":[8,19,23,71,85,99,133,144,152,170],"collapsing":[9,134,145,153,171],"to":[10],"reduce":[11],"search":[12],"space":[13],"test":[15],"generation,":[16],"speed":[17],"up":[18],"simulation":[20],"and":[21,101,114,127,139,146],"make":[22],"diagnosis":[24],"easier":[25],"in":[26,74],"digital":[27],"circuits.":[28,161],"proposed":[30],"method":[31],"is":[32,102,128],"based":[33],"on":[34],"hierarchical":[35],"topology":[36],"analysis":[37],"of":[38,53,57,70,84,112,120,149,151,159],"the":[39,43,67,81,106,118],"circuit":[40,45],"description.":[41],"First,":[42],"gate-level":[44],"will":[46],"be":[47],"converted":[48],"into":[49],"macro-level":[51],"network":[52],"fan-out-free":[54],"regions":[55],"each":[56],"them":[58],"represented":[59],"by":[60,109],"BDD.":[62],"This":[63],"conversion":[64],"procedure":[65],"represents":[66],"first":[68],"step":[69,96],"collapsing,":[72,100],"resulting":[73],"compressed":[76],"BDD":[77],"model":[78],"representing":[80],"remaining":[82],"set":[83,158],"sites.":[86],"an":[90],"which":[92],"implements":[93],"complementary":[95],"further":[98],"carried":[103],"out":[104],"at":[105],"macro":[107],"level":[108],"topological":[110],"reasoning":[111],"equivalence":[113],"dominance":[115],"relations":[116],"between":[117],"nodes":[119],"BDDs.":[121],"has":[124,164],"linear":[125],"complexity":[126],"implemented":[129],"as":[130],"scalable":[132],"procedure.":[135],"We":[136],"introduce":[137],"higher":[138],"lower":[140],"bounds":[141],"provide":[147],"statistics":[148],"distribution":[150],"results":[154,167],"broad":[157],"benchmark":[160],"Experimental":[162],"research":[163],"demonstrated":[165],"better":[166],"compared":[172],"with":[173],"state-of-the-art.":[174]},"counts_by_year":[{"year":2023,"cited_by_count":1},{"year":2018,"cited_by_count":3},{"year":2016,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}