{"id":"https://openalex.org/W1916098515","doi":"https://doi.org/10.1109/vlsi-soc.2015.7314394","title":"An optimal operating point by using error monitoring circuits with an error-resilient technique","display_name":"An optimal operating point by using error monitoring circuits with an error-resilient technique","publication_year":2015,"publication_date":"2015-10-01","ids":{"openalex":"https://openalex.org/W1916098515","doi":"https://doi.org/10.1109/vlsi-soc.2015.7314394","mag":"1916098515"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-soc.2015.7314394","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2015.7314394","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100329293","display_name":"Jaemin Lee","orcid":"https://orcid.org/0000-0002-2911-6942"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaemin Lee","raw_affiliation_strings":["School of Electrical and Computer Engineering Ulsan National Institute of Science and Technology, Ulsan, Korea","School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Korea 689-798"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering Ulsan National Institute of Science and Technology, Ulsan, Korea","institution_ids":["https://openalex.org/I48566637"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Korea 689-798","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100656386","display_name":"Seungwon Kim","orcid":"https://orcid.org/0000-0002-9016-8792"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seungwon Kim","raw_affiliation_strings":["School of Electrical and Computer Engineering Ulsan National Institute of Science and Technology, Ulsan, Korea","School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Korea 689-798"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering Ulsan National Institute of Science and Technology, Ulsan, Korea","institution_ids":["https://openalex.org/I48566637"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Korea 689-798","institution_ids":["https://openalex.org/I48566637"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100337311","display_name":"Young\u2010Min Kim","orcid":"https://orcid.org/0000-0003-3220-9004"},"institutions":[{"id":"https://openalex.org/I161024014","display_name":"Kwangwoon University","ror":"https://ror.org/02e9zc863","country_code":"KR","type":"education","lineage":["https://openalex.org/I161024014"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Youngmin Kim","raw_affiliation_strings":["Department of Computer Engineering, Kwangwoon University, Seoul, Korea","Department of Computer Engineering, Kwangwoon University, Seoul, Korea 139-701"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Engineering, Kwangwoon University, Seoul, Korea","institution_ids":["https://openalex.org/I161024014"]},{"raw_affiliation_string":"Department of Computer Engineering, Kwangwoon University, Seoul, Korea 139-701","institution_ids":["https://openalex.org/I161024014"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044543389","display_name":"Seokhyeong Kang","orcid":"https://orcid.org/0000-0003-3015-1806"},"institutions":[{"id":"https://openalex.org/I48566637","display_name":"Ulsan National Institute of Science and Technology","ror":"https://ror.org/017cjz748","country_code":"KR","type":"education","lineage":["https://openalex.org/I48566637"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seokhyeong Kang","raw_affiliation_strings":["School of Electrical and Computer Engineering Ulsan National Institute of Science and Technology, Ulsan, Korea","School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Korea 689-798"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering Ulsan National Institute of Science and Technology, Ulsan, Korea","institution_ids":["https://openalex.org/I48566637"]},{"raw_affiliation_string":"School of Electrical and Computer Engineering, Ulsan National Institute of Science and Technology, Korea 689-798","institution_ids":["https://openalex.org/I48566637"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4118,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.51081226,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"69","last_page":"73"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.695749819278717},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.672132670879364},{"id":"https://openalex.org/keywords/sorting","display_name":"Sorting","score":0.6398072838783264},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6277914047241211},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.5922083854675293},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5191625356674194},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.49810266494750977},{"id":"https://openalex.org/keywords/error-detection-and-correction","display_name":"Error detection and correction","score":0.4869585931301117},{"id":"https://openalex.org/keywords/energy-consumption","display_name":"Energy consumption","score":0.47715824842453003},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.46365222334861755},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.41955459117889404},{"id":"https://openalex.org/keywords/design-flow","display_name":"Design flow","score":0.4116052985191345},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3854867219924927},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3549530506134033},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.27752232551574707},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26782387495040894},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.1958473026752472},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.11051791906356812},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.11051258444786072}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.695749819278717},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.672132670879364},{"id":"https://openalex.org/C111696304","wikidata":"https://www.wikidata.org/wiki/Q2303697","display_name":"Sorting","level":2,"score":0.6398072838783264},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6277914047241211},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.5922083854675293},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5191625356674194},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.49810266494750977},{"id":"https://openalex.org/C103088060","wikidata":"https://www.wikidata.org/wiki/Q1062839","display_name":"Error detection and correction","level":2,"score":0.4869585931301117},{"id":"https://openalex.org/C2780165032","wikidata":"https://www.wikidata.org/wiki/Q16869822","display_name":"Energy consumption","level":2,"score":0.47715824842453003},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.46365222334861755},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.41955459117889404},{"id":"https://openalex.org/C37135326","wikidata":"https://www.wikidata.org/wiki/Q931942","display_name":"Design flow","level":2,"score":0.4116052985191345},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3854867219924927},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3549530506134033},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.27752232551574707},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26782387495040894},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.1958473026752472},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.11051791906356812},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.11051258444786072},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/vlsi-soc.2015.7314394","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2015.7314394","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},{"id":"pmh:oai:scholarworks.unist.ac.kr:201301/34972","is_oa":false,"landing_page_url":"https://scholarworks.unist.ac.kr/handle/201301/34972","pdf_url":null,"source":{"id":"https://openalex.org/S4306401118","display_name":"Scholarworks@UNIST (Ulsan National Institute of Science and Technology)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I48566637","host_organization_name":"Ulsan National Institute of Science and Technology","host_organization_lineage":["https://openalex.org/I48566637"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"CONFERENCE"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W1535623014","https://openalex.org/W1979194489","https://openalex.org/W1981859590","https://openalex.org/W1998525920","https://openalex.org/W2020656014","https://openalex.org/W2039559700","https://openalex.org/W2039818127","https://openalex.org/W2048816638","https://openalex.org/W2063559373","https://openalex.org/W2065430789","https://openalex.org/W2097718610","https://openalex.org/W2104677471","https://openalex.org/W2118880665","https://openalex.org/W2126481660","https://openalex.org/W2129542184","https://openalex.org/W2136103183","https://openalex.org/W2146750110","https://openalex.org/W2149866574","https://openalex.org/W2150424241","https://openalex.org/W2154462663","https://openalex.org/W2155636448","https://openalex.org/W2163421219","https://openalex.org/W2167037406","https://openalex.org/W2178304595","https://openalex.org/W2216201525","https://openalex.org/W2268605313","https://openalex.org/W2274826939","https://openalex.org/W2286785546","https://openalex.org/W3144939025","https://openalex.org/W3145424647","https://openalex.org/W3147349573","https://openalex.org/W3147784729","https://openalex.org/W4236432903","https://openalex.org/W4249020130","https://openalex.org/W4250593381","https://openalex.org/W4285719527","https://openalex.org/W6660155203","https://openalex.org/W6694732674","https://openalex.org/W6695681737"],"related_works":["https://openalex.org/W2739612537","https://openalex.org/W2349174696","https://openalex.org/W2360241746","https://openalex.org/W4313041667","https://openalex.org/W2767599893","https://openalex.org/W2381572297","https://openalex.org/W4388070314","https://openalex.org/W2106741186","https://openalex.org/W2368890809","https://openalex.org/W1922771929"],"abstract_inverted_index":{"For":[0],"applications":[1],"related":[2],"to":[3,38,113],"human,":[4],"such":[5],"as":[6],"Internet":[7],"of":[8,41,78,123],"Things":[9],"(loT)":[10],"and":[11,27,54,72,91,99],"wearable":[12],"devices,":[13],"near":[14],"threshold":[15],"voltage":[16],"(NTV)":[17],"technology":[18],"has":[19],"been":[20],"proposed":[21,96],"for":[22,58],"the":[23,36,42,79,95,100,108,124],"trade-off":[24],"between":[25],"performance":[26],"energy":[28],"consumption.":[29],"However,":[30],"errorresilient":[31],"techniques":[32],"are":[33,88],"required":[34],"in":[35],"circuits":[37],"improve":[39],"reliability":[40],"NTV":[43,59],"operation.":[44],"In":[45],"this":[46],"paper,":[47],"we":[48,82],"propose":[49,83],"a":[50,55,63],"low-overhead":[51],"error-resilient":[52,126],"system":[53,98],"design":[56],"flow":[57],"operations.":[60],"We":[61],"use":[62],"new":[64],"monitoring":[65,97,115],"circuit,":[66],"which":[67,87],"can":[68],"detect":[69],"timing":[70],"errors":[71],"find":[73],"an":[74],"optimal":[75,109],"operation":[76],"point":[77],"system.":[80],"Also,":[81],"two":[84],"different":[85],"methodologies,":[86],"slack-based":[89],"methodology":[90],"sensitivity-based":[92],"methodology.":[93],"From":[94],"sensitivitybased":[101],"sorting":[102],"algorithm,":[103],"benchmark":[104],"results":[105],"show":[106],"that":[107],"designs":[110],"provide":[111],"up":[112],"46%":[114],"area":[116],"reduction":[117],"maintaining":[118],"similar":[119],"error":[120],"detection":[121],"ability":[122],"conventional":[125],"design.":[127]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}