{"id":"https://openalex.org/W2547163922","doi":"https://doi.org/10.1109/vlsi-soc.2014.7004195","title":"Power dissipation effects on 28nm FPGA-based System on Chips neutron sensitivity","display_name":"Power dissipation effects on 28nm FPGA-based System on Chips neutron sensitivity","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2547163922","doi":"https://doi.org/10.1109/vlsi-soc.2014.7004195","mag":"2547163922"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-soc.2014.7004195","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2014.7004195","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073366898","display_name":"G. Bruni","orcid":"https://orcid.org/0000-0003-4858-4212"},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"G. Bruni","raw_affiliation_strings":["Dipartimento di Eletronica e Informatica, Padova University, DEI, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Eletronica e Informatica, Padova University, DEI, Italy","institution_ids":["https://openalex.org/I138689650"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054264208","display_name":"Paolo Rech","orcid":"https://orcid.org/0000-0002-9597-1007"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]},{"id":"https://openalex.org/I126460647","display_name":"Universidade Federal do Rio Grande","ror":"https://ror.org/05hpfkn88","country_code":"BR","type":"education","lineage":["https://openalex.org/I126460647"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"P. Rech","raw_affiliation_strings":["Instituto de Informatica, Universidade Federal do Rio Grande do SuI, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Instituto de Informatica, Universidade Federal do Rio Grande do SuI, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723","https://openalex.org/I126460647"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072145606","display_name":"Lucas Antunes Tambara","orcid":"https://orcid.org/0000-0001-7456-4368"},"institutions":[{"id":"https://openalex.org/I126460647","display_name":"Universidade Federal do Rio Grande","ror":"https://ror.org/05hpfkn88","country_code":"BR","type":"education","lineage":["https://openalex.org/I126460647"]},{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"L. Tambara","raw_affiliation_strings":["Instituto de Informatica, Universidade Federal do Rio Grande do SuI, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Instituto de Informatica, Universidade Federal do Rio Grande do SuI, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723","https://openalex.org/I126460647"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064852217","display_name":"Gabriel L. Nazar","orcid":"https://orcid.org/0000-0001-7202-7139"},"institutions":[{"id":"https://openalex.org/I126460647","display_name":"Universidade Federal do Rio Grande","ror":"https://ror.org/05hpfkn88","country_code":"BR","type":"education","lineage":["https://openalex.org/I126460647"]},{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"G. L. Nazar","raw_affiliation_strings":["Instituto de Informatica, Universidade Federal do Rio Grande do SuI, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Instituto de Informatica, Universidade Federal do Rio Grande do SuI, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723","https://openalex.org/I126460647"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024813896","display_name":"Fernanda Lima Kastensmidt","orcid":"https://orcid.org/0000-0001-5767-8582"},"institutions":[{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]},{"id":"https://openalex.org/I126460647","display_name":"Universidade Federal do Rio Grande","ror":"https://ror.org/05hpfkn88","country_code":"BR","type":"education","lineage":["https://openalex.org/I126460647"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"F. L. Kastensmidt","raw_affiliation_strings":["Instituto de Informatica, Universidade Federal do Rio Grande do SuI, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Instituto de Informatica, Universidade Federal do Rio Grande do SuI, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723","https://openalex.org/I126460647"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108043721","display_name":"Ricardo Reis","orcid":"https://orcid.org/0000-0001-5781-5858"},"institutions":[{"id":"https://openalex.org/I126460647","display_name":"Universidade Federal do Rio Grande","ror":"https://ror.org/05hpfkn88","country_code":"BR","type":"education","lineage":["https://openalex.org/I126460647"]},{"id":"https://openalex.org/I130442723","display_name":"Universidade Federal do Rio Grande do Sul","ror":"https://ror.org/041yk2d64","country_code":"BR","type":"education","lineage":["https://openalex.org/I130442723"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"R. Reis","raw_affiliation_strings":["Instituto de Informatica, Universidade Federal do Rio Grande do SuI, Porto Alegre, Brazil"],"affiliations":[{"raw_affiliation_string":"Instituto de Informatica, Universidade Federal do Rio Grande do SuI, Porto Alegre, Brazil","institution_ids":["https://openalex.org/I130442723","https://openalex.org/I126460647"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021496307","display_name":"A. Paccagnell","orcid":null},"institutions":[{"id":"https://openalex.org/I138689650","display_name":"University of Padua","ror":"https://ror.org/00240q980","country_code":"IT","type":"education","lineage":["https://openalex.org/I138689650"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Paccagnell","raw_affiliation_strings":["Universita degli Studi di Padova, Padova, Veneto, IT"],"affiliations":[{"raw_affiliation_string":"Universita degli Studi di Padova, Padova, Veneto, IT","institution_ids":["https://openalex.org/I138689650"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":7,"corresponding_author_ids":["https://openalex.org/A5073366898"],"corresponding_institution_ids":["https://openalex.org/I138689650"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.27261487,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.8251479268074036},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7504563331604004},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5776424407958984},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5456900596618652},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5066271424293518},{"id":"https://openalex.org/keywords/sensitivity","display_name":"Sensitivity (control systems)","score":0.46822187304496765},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42926862835884094},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4071853756904602},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39851343631744385},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29022908210754395},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.2524169981479645}],"concepts":[{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.8251479268074036},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7504563331604004},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5776424407958984},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5456900596618652},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5066271424293518},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.46822187304496765},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42926862835884094},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4071853756904602},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39851343631744385},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29022908210754395},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2524169981479645},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-soc.2014.7004195","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2014.7004195","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2014 22nd International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.8700000047683716,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W968476659","https://openalex.org/W2019264548","https://openalex.org/W2099569658","https://openalex.org/W2123424800","https://openalex.org/W2128938296","https://openalex.org/W2130355184","https://openalex.org/W2157024459","https://openalex.org/W2161917951","https://openalex.org/W2161960035","https://openalex.org/W3103339143","https://openalex.org/W3149410719","https://openalex.org/W4285719527","https://openalex.org/W6683178885"],"related_works":["https://openalex.org/W2347486132","https://openalex.org/W2316789606","https://openalex.org/W2350340797","https://openalex.org/W4293224283","https://openalex.org/W2950501077","https://openalex.org/W2368601041","https://openalex.org/W2096844293","https://openalex.org/W2363944576","https://openalex.org/W2351041855","https://openalex.org/W2570254841"],"abstract_inverted_index":{"Modern":[0],"System":[1],"on":[2,33,65,69],"Chips":[3],"(SoCs)":[4],"and":[5,58],"embedded":[6],"electronic":[7],"devices":[8],"work":[9],"at":[10],"very":[11],"high":[12],"frequencies,":[13],"which":[14],"have":[15],"the":[16,20,25,40,50,61],"countermeasure":[17],"of":[18,60],"increasing":[19],"power":[21,66],"dissipation":[22,67],"and,":[23],"consequently,":[24],"silicon":[26],"die":[27],"temperature.":[28],"The":[29],"presented":[30],"radiation":[31],"experiments":[32],"a":[34,45],"28nm":[35],"FPGA-based":[36],"SoC":[37],"demonstrate":[38],"that":[39],"temperature":[41],"variation":[42],"caused":[43],"by":[44],"higher":[46],"operating":[47],"frequency":[48],"affects":[49],"FPGA":[51],"configuration":[52],"memory":[53],"cross":[54],"section.":[55],"An":[56],"evaluation":[57],"discussion":[59],"observed":[62],"reliability":[63],"dependence":[64],"effects":[68],"practical":[70],"application":[71],"is":[72],"also":[73],"presented.":[74]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}