{"id":"https://openalex.org/W2070000121","doi":"https://doi.org/10.1109/vlsi-soc.2013.6673255","title":"On the development of diagnostic test programs for VLIW processors","display_name":"On the development of diagnostic test programs for VLIW processors","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W2070000121","doi":"https://doi.org/10.1109/vlsi-soc.2013.6673255","mag":"2070000121"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-soc.2013.6673255","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2013.6673255","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073106920","display_name":"D. Sabena","orcid":null},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"D. Sabena","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5058555274","display_name":"M. Sonza Reorda","orcid":"https://orcid.org/0000-0003-2899-7669"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"M. Sonza Reorda","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021426042","display_name":"Luca Sterpone","orcid":"https://orcid.org/0000-0002-3080-2560"},"institutions":[{"id":"https://openalex.org/I177477856","display_name":"Polytechnic University of Turin","ror":"https://ror.org/00bgk9508","country_code":"IT","type":"education","lineage":["https://openalex.org/I177477856"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"L. Sterpone","raw_affiliation_strings":["Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy"],"affiliations":[{"raw_affiliation_string":"Dipartimento di Automatica e Informatica, Politecnico di Torino, Torino, Italy","institution_ids":["https://openalex.org/I177477856"]},{"raw_affiliation_string":"Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy","institution_ids":["https://openalex.org/I177477856"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5073106920"],"corresponding_institution_ids":["https://openalex.org/I177477856"],"apc_list":null,"apc_paid":null,"fwci":0.633,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.70809647,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"84","last_page":"89"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9962000250816345,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/very-long-instruction-word","display_name":"Very long instruction word","score":0.9234977960586548},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.8408920764923096},{"id":"https://openalex.org/keywords/control-reconfiguration","display_name":"Control reconfiguration","score":0.7108943462371826},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.6179236173629761},{"id":"https://openalex.org/keywords/spare-part","display_name":"Spare part","score":0.6148859858512878},{"id":"https://openalex.org/keywords/parallelism","display_name":"Parallelism (grammar)","score":0.5259411931037903},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.48586127161979675},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.48284560441970825},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.43236061930656433},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4290931522846222},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.37743109464645386},{"id":"https://openalex.org/keywords/computer-architecture","display_name":"Computer architecture","score":0.34349292516708374},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.2343462109565735},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.1473616659641266},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.08274897933006287}],"concepts":[{"id":"https://openalex.org/C170595534","wikidata":"https://www.wikidata.org/wiki/Q249743","display_name":"Very long instruction word","level":2,"score":0.9234977960586548},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.8408920764923096},{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.7108943462371826},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.6179236173629761},{"id":"https://openalex.org/C194648553","wikidata":"https://www.wikidata.org/wiki/Q1364774","display_name":"Spare part","level":2,"score":0.6148859858512878},{"id":"https://openalex.org/C2781172179","wikidata":"https://www.wikidata.org/wiki/Q853109","display_name":"Parallelism (grammar)","level":2,"score":0.5259411931037903},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.48586127161979675},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.48284560441970825},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.43236061930656433},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4290931522846222},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.37743109464645386},{"id":"https://openalex.org/C118524514","wikidata":"https://www.wikidata.org/wiki/Q173212","display_name":"Computer architecture","level":1,"score":0.34349292516708374},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.2343462109565735},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.1473616659641266},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.08274897933006287},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/vlsi-soc.2013.6673255","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2013.6673255","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},{"id":"pmh:oai:porto.polito.it:2517748","is_oa":false,"landing_page_url":"http://porto.polito.it/2517748/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402038","display_name":"PORTO Publications Open Repository TOrino (Politecnico di Torino)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I177477856","host_organization_name":"Politecnico di Torino","host_organization_lineage":["https://openalex.org/I177477856"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1506585561","https://openalex.org/W1974233271","https://openalex.org/W1979132636","https://openalex.org/W2006581061","https://openalex.org/W2021278248","https://openalex.org/W2048395739","https://openalex.org/W2057882245","https://openalex.org/W2096268091","https://openalex.org/W2104536586","https://openalex.org/W2127346720","https://openalex.org/W2158584428","https://openalex.org/W2162696040","https://openalex.org/W4237466351","https://openalex.org/W4317563422","https://openalex.org/W6630357839","https://openalex.org/W6652189185","https://openalex.org/W6655614456","https://openalex.org/W6662947046"],"related_works":["https://openalex.org/W2376859990","https://openalex.org/W2912704652","https://openalex.org/W2381161177","https://openalex.org/W1897551170","https://openalex.org/W2319226115","https://openalex.org/W830772239","https://openalex.org/W2970750595","https://openalex.org/W2366601680","https://openalex.org/W2392193501","https://openalex.org/W2169359484"],"abstract_inverted_index":{"Software-Based":[0],"Self-Test":[1],"(SBST)":[2],"approaches":[3],"have":[4],"shown":[5],"to":[6,11,33,41,109],"be":[7,58],"an":[8],"effective":[9],"solution":[10],"detect":[12],"permanent":[13,36],"faults,":[14,37],"both":[15],"at":[16],"the":[17,20,25,43,78,111,122,125],"end":[18],"of":[19,124],"production":[21],"process,":[22],"and":[23],"during":[24],"operational":[26],"phase.":[27],"When":[28,64],"partial":[29],"reconfiguration":[30],"is":[31,47,107],"adopted":[32],"deal":[34],"with":[35,50],"we":[38,87],"also":[39],"need":[40],"identify":[42,110],"faulty":[44,112],"module,":[45],"which":[46,103],"then":[48],"substituted":[49],"a":[51,89,99,118],"spare":[52],"one.":[53],"Software-based":[54],"Diagnosis":[55],"techniques":[56,74],"can":[57,75],"exploited":[59],"for":[60],"this":[61,85],"purpose,":[62],"too.":[63],"Very":[65],"Long":[66],"Instruction":[67],"Word":[68],"(VLIW)":[69],"processors":[70],"are":[71],"addressed,":[72],"these":[73,82],"effectively":[76],"exploit":[77],"parallelism":[79],"intrinsic":[80],"in":[81,104],"architectures.":[83],"In":[84],"paper":[86],"propose":[88],"new":[90],"approach":[91],"that":[92],"starting":[93],"from":[94],"existing":[95],"detection-oriented":[96],"programs":[97],"generates":[98],"diagnosis-oriented":[100],"test":[101],"program":[102],"most":[105],"cases":[106],"able":[108],"module.":[113],"Experimental":[114],"results":[115],"gathered":[116],"on":[117],"case":[119],"study":[120],"show":[121],"effectiveness":[123],"proposed":[126],"approach.":[127]},"counts_by_year":[{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}