{"id":"https://openalex.org/W2100157586","doi":"https://doi.org/10.1109/vlsi-soc.2013.6673230","title":"Embedded tutorials: Embedded tutorial 1: Cell-aware test-from gates to transistors","display_name":"Embedded tutorials: Embedded tutorial 1: Cell-aware test-from gates to transistors","publication_year":2013,"publication_date":"2013-10-01","ids":{"openalex":"https://openalex.org/W2100157586","doi":"https://doi.org/10.1109/vlsi-soc.2013.6673230","mag":"2100157586"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-soc.2013.6673230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2013.6673230","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110218833","display_name":"J. Rajski","orcid":null},"institutions":[{"id":"https://openalex.org/I4210156212","display_name":"Mentor Technologies","ror":"https://ror.org/05vewsj04","country_code":"US","type":"other","lineage":["https://openalex.org/I4210156212"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Janusz Rajski","raw_affiliation_strings":["Mentor Graphics, USA","Mentor Graphics , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Mentor Graphics, USA","institution_ids":["https://openalex.org/I4210156212"]},{"raw_affiliation_string":"Mentor Graphics , USA","institution_ids":["https://openalex.org/I4210156212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082847985","display_name":"Miodrag Potkonjak","orcid":null},"institutions":[{"id":"https://openalex.org/I2799798094","display_name":"UCLA Health","ror":"https://ror.org/01d88se56","country_code":"US","type":"healthcare","lineage":["https://openalex.org/I2799798094"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Miodrag Potkonjak","raw_affiliation_strings":["UCLA, USA","UCLA USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"UCLA, USA","institution_ids":["https://openalex.org/I2799798094"]},{"raw_affiliation_string":"UCLA USA","institution_ids":["https://openalex.org/I2799798094"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5104362993","display_name":"Adit D. Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I82497590","display_name":"Auburn University","ror":"https://ror.org/02v80fc35","country_code":"US","type":"education","lineage":["https://openalex.org/I82497590"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Adit Singh","raw_affiliation_strings":["Auburn University, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Auburn University, USA","institution_ids":["https://openalex.org/I82497590"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069579193","display_name":"Abhijit Chatterjee","orcid":"https://orcid.org/0000-0003-1553-4470"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]},{"id":"https://openalex.org/I2800444561","display_name":"Atlanta Technical College","ror":"https://ror.org/01s3vfp47","country_code":"US","type":"education","lineage":["https://openalex.org/I2800444561"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Abhijit Chatterjee","raw_affiliation_strings":["Georgia Tech, USA","Georgia Tech, USA#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Georgia Tech, USA","institution_ids":["https://openalex.org/I130701444","https://openalex.org/I2800444561"]},{"raw_affiliation_string":"Georgia Tech, USA#TAB#","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111436337","display_name":"Z. Navabi","orcid":null},"institutions":[{"id":"https://openalex.org/I23946033","display_name":"University of Tehran","ror":"https://ror.org/05vf56z40","country_code":"IR","type":"education","lineage":["https://openalex.org/I23946033"]}],"countries":["IR"],"is_corresponding":false,"raw_author_name":"Zain Navabi","raw_affiliation_strings":["University of Tehran, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of Tehran, Iran","institution_ids":["https://openalex.org/I23946033"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065218759","display_name":"Matthew R. Guthaus","orcid":"https://orcid.org/0000-0002-8113-4531"},"institutions":[{"id":"https://openalex.org/I185103710","display_name":"University of California, Santa Cruz","ror":"https://ror.org/03s65by71","country_code":"US","type":"education","lineage":["https://openalex.org/I185103710"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Matthew Guthaus","raw_affiliation_strings":["University of California Santa Cruz, USA","University of California, Santa Cruz. USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"University of California Santa Cruz, USA","institution_ids":["https://openalex.org/I185103710"]},{"raw_affiliation_string":"University of California, Santa Cruz. USA","institution_ids":["https://openalex.org/I185103710"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069036699","display_name":"Sezer G\u00f6ren","orcid":"https://orcid.org/0000-0002-3688-5280"},"institutions":[{"id":"https://openalex.org/I100072489","display_name":"Yeditepe University","ror":"https://ror.org/025mx2575","country_code":"TR","type":"education","lineage":["https://openalex.org/I100072489"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Sezer Goren","raw_affiliation_strings":["Yeditepe University, Turkey","Yeditepe Univ., Turkey"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yeditepe University, Turkey","institution_ids":["https://openalex.org/I100072489"]},{"raw_affiliation_string":"Yeditepe Univ., Turkey","institution_ids":["https://openalex.org/I100072489"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":8,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"xv","last_page":"xvi"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/netlist","display_name":"Netlist","score":0.9267821311950684},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7709582448005676},{"id":"https://openalex.org/keywords/standard-cell","display_name":"Standard cell","score":0.7684346437454224},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6408856511116028},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.49802374839782715},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.4947895407676697},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4796745777130127},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.468110054731369},{"id":"https://openalex.org/keywords/abstraction","display_name":"Abstraction","score":0.4221891462802887},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4136483073234558},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.41309329867362976},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.39851114153862},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.20720013976097107},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1863097846508026},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1813526451587677},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12228676676750183}],"concepts":[{"id":"https://openalex.org/C177650935","wikidata":"https://www.wikidata.org/wiki/Q1760303","display_name":"Netlist","level":2,"score":0.9267821311950684},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7709582448005676},{"id":"https://openalex.org/C78401558","wikidata":"https://www.wikidata.org/wiki/Q464496","display_name":"Standard cell","level":3,"score":0.7684346437454224},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6408856511116028},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.49802374839782715},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.4947895407676697},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4796745777130127},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.468110054731369},{"id":"https://openalex.org/C124304363","wikidata":"https://www.wikidata.org/wiki/Q673661","display_name":"Abstraction","level":2,"score":0.4221891462802887},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4136483073234558},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.41309329867362976},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.39851114153862},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.20720013976097107},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1863097846508026},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1813526451587677},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12228676676750183},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-soc.2013.6673230","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2013.6673230","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6399999856948853}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4288055011","https://openalex.org/W2100360214","https://openalex.org/W1544420370","https://openalex.org/W2999380228","https://openalex.org/W2091833418","https://openalex.org/W4242912623","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405"],"abstract_inverted_index":{"Devices":[0],"manufactured":[1],"in":[2,224],"20":[3],"nm":[4],"and":[5,29,40,118,135,142,150,174,254],"smaller":[6],"geometry":[7],"technologies":[8],"will":[9,18,71],"potentially":[10],"be":[11,72,229],"very":[12],"large":[13],"by":[14,24],"today's":[15],"standards,":[16],"they":[17],"also":[19],"have":[20],"new":[21],"characteristics":[22],"implied":[23],"things":[25],"like":[26],"process":[27],"variability":[28],"adoption":[30],"of":[31,58,69,75,81,97,103,111,177,187,240,251,258],"FinFET":[32],"transistors.":[33],"The":[34,66,120,203,232,244],"industry":[35],"has":[36,234],"cumulatively":[37],"adopted":[38],"more":[39,41],"sophisticated":[42],"fault":[43,152],"models":[44],"that":[45,221],"use":[46],"timing":[47],"as":[48,50],"well":[49],"layout":[51,137],"information.":[52],"There":[53],"is":[54,63,79,154,193],"a":[55,172,198,238,248],"growing":[56],"body":[57],"experimental":[59,245],"data":[60,246],"showing":[61],"it":[62],"still":[64],"insufficient.":[65],"next":[67],"area":[68],"focus":[70],"the":[73,82,88,95,101,124,147,158,162,178,184,208,215,222,255],"quality":[74,96,210],"test.":[76],"Cell-aware":[77],"test":[78,98,126,192,211],"one":[80],"most":[83],"promising":[84],"approaches":[85],"developed":[86],"over":[87],"last":[89],"five":[90],"years":[91],"aimed":[92],"at":[93,183],"improving":[94],"while":[99],"maintaining":[100],"efficiency":[102],"gate-level":[104,225],"approach.":[105],"This":[106,219],"approach":[107],"combines":[108],"two":[109],"levels":[110],"abstraction":[112],"to":[113,156,170],"provide":[114],"trade-offs":[115],"between":[116],"accuracy":[117],"efficiency.":[119],"first":[121],"step":[122],"creates":[123],"cell-aware":[125,191,205,216],"library":[127,188,217],"models.":[128],"It":[129],"starts":[130],"with":[131],"standard":[132,200],"cell":[133,201],"libraries":[134,179],"performs":[136],"extraction.":[138],"Realistic":[139],"defects":[140,163],"(bridges":[141],"opens)":[143],"are":[144,164,168],"injected":[145],"into":[146],"SPICE":[148],"netlist,":[149],"analog":[151],"simulation":[153],"performed":[155,194],"determine":[157],"conditions":[159,167],"under":[160],"which":[161],"detected.":[165],"Those":[166],"aggregated":[169],"create":[171],"compact":[173],"efficient":[175],"representation":[176],"for":[180,190,197],"ATPG":[181,206,226],"done":[182],"gate-level.":[185],"Generation":[186],"views":[189],"only":[195],"once":[196],"given":[199],"library.":[202],"final":[204],"generates":[207],"high":[209],"patterns":[212],"based":[213],"on":[214,237],"views.":[218],"guarantees":[220],"investment":[223],"infrastructure":[227],"could":[228],"efficiently":[230],"utilized.":[231],"technology":[233],"been":[235],"used":[236],"number":[239],"high-volume":[241],"industrial":[242],"designs.":[243],"show":[247],"significant":[249],"increase":[250],"defect":[252,259],"coverage":[253],"corresponding":[256],"improvement":[257],"rate.":[260]},"counts_by_year":[{"year":2014,"cited_by_count":1}],"updated_date":"2026-07-22T07:51:19.307946","created_date":"2025-10-10T00:00:00"}