{"id":"https://openalex.org/W3141134771","doi":"https://doi.org/10.1109/vlsi-soc.2012.6379045","title":"A soft error robust 32kb SRAM macro featuring access transistor-less 8T cell in 65-nm","display_name":"A soft error robust 32kb SRAM macro featuring access transistor-less 8T cell in 65-nm","publication_year":2012,"publication_date":"2012-10-01","ids":{"openalex":"https://openalex.org/W3141134771","doi":"https://doi.org/10.1109/vlsi-soc.2012.6379045","mag":"3141134771"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-soc.2012.6379045","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2012.6379045","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111414250","display_name":"Jaspal Singh Shah","orcid":null},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Jaspal Singh Shah","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006396240","display_name":"David Nairn","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"David Nairn","raw_affiliation_strings":[],"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5086259491","display_name":"Manoj Sachdev","orcid":"https://orcid.org/0000-0002-8256-9828"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Manoj Sachdev","raw_affiliation_strings":[],"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5111414250"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.2455,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.65188993,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"275","last_page":"278"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/macro","display_name":"Macro","score":0.789025604724884},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7633328437805176},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.7467072010040283},{"id":"https://openalex.org/keywords/random-access-memory","display_name":"Random access memory","score":0.6307007074356079},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6211428642272949},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5710404515266418},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42731598019599915},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27365005016326904},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.22671958804130554},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14526376128196716},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.05951949954032898}],"concepts":[{"id":"https://openalex.org/C166955791","wikidata":"https://www.wikidata.org/wiki/Q629579","display_name":"Macro","level":2,"score":0.789025604724884},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7633328437805176},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.7467072010040283},{"id":"https://openalex.org/C2994168587","wikidata":"https://www.wikidata.org/wiki/Q5295","display_name":"Random access memory","level":2,"score":0.6307007074356079},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6211428642272949},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5710404515266418},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42731598019599915},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27365005016326904},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.22671958804130554},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14526376128196716},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.05951949954032898},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-soc.2012.6379045","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-soc.2012.6379045","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2012 IEEE/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.8500000238418579,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1564617507","https://openalex.org/W2050431855","https://openalex.org/W2122954231","https://openalex.org/W2138111642","https://openalex.org/W2141068710","https://openalex.org/W2153751624","https://openalex.org/W2155051493","https://openalex.org/W2160993194","https://openalex.org/W2161978115","https://openalex.org/W6683657071"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W1500230652","https://openalex.org/W2066033226","https://openalex.org/W2363504003","https://openalex.org/W2548582980","https://openalex.org/W2620706469","https://openalex.org/W2052914698","https://openalex.org/W2088929465","https://openalex.org/W2612883256","https://openalex.org/W4386933833"],"abstract_inverted_index":null,"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}