{"id":"https://openalex.org/W2951630169","doi":"https://doi.org/10.1109/vlsi-dat.2019.8741536","title":"A 30 ns 16 Mb 2 b/cell Embedded Flash with Ramped Gate Time-Domain Sensing Scheme for Automotive Application","display_name":"A 30 ns 16 Mb 2 b/cell Embedded Flash with Ramped Gate Time-Domain Sensing Scheme for Automotive Application","publication_year":2019,"publication_date":"2019-04-01","ids":{"openalex":"https://openalex.org/W2951630169","doi":"https://doi.org/10.1109/vlsi-dat.2019.8741536","mag":"2951630169"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-dat.2019.8741536","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2019.8741536","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5040455571","display_name":"Sebastian Kiesel","orcid":null},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Sebastian Kiesel","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Technical University of Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Technical University of Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5019498001","display_name":"Thomas Kern","orcid":null},"institutions":[{"id":"https://openalex.org/I137594350","display_name":"Infineon Technologies (Germany)","ror":"https://ror.org/005kw6t15","country_code":"DE","type":"company","lineage":["https://openalex.org/I137594350"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Kern","raw_affiliation_strings":["Infineon Technologies AG, Neubiberg, Germany"],"affiliations":[{"raw_affiliation_string":"Infineon Technologies AG, Neubiberg, Germany","institution_ids":["https://openalex.org/I137594350"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061692629","display_name":"Bernhard Wicht","orcid":"https://orcid.org/0000-0003-0066-2955"},"institutions":[{"id":"https://openalex.org/I114112103","display_name":"Leibniz University Hannover","ror":"https://ror.org/0304hq317","country_code":"DE","type":"education","lineage":["https://openalex.org/I114112103"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Bernhard Wicht","raw_affiliation_strings":["Institute of Microelectronic Systems, Leibniz University Hannover, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Microelectronic Systems, Leibniz University Hannover, Germany","institution_ids":["https://openalex.org/I114112103"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033163680","display_name":"Helmut Graeb","orcid":"https://orcid.org/0000-0002-7626-1958"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Helmut Graeb","raw_affiliation_strings":["Department of Electrical and Computer Engineering, Technical University of Munich, Germany"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, Technical University of Munich, Germany","institution_ids":["https://openalex.org/I62916508"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5040455571"],"corresponding_institution_ids":["https://openalex.org/I62916508"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.06041295,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11181","display_name":"Advanced Data Storage Technologies","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flash-memory","display_name":"Flash memory","score":0.7516161203384399},{"id":"https://openalex.org/keywords/non-volatile-memory","display_name":"Non-volatile memory","score":0.6231090426445007},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6203543543815613},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6017032861709595},{"id":"https://openalex.org/keywords/automotive-industry","display_name":"Automotive industry","score":0.5661923289299011},{"id":"https://openalex.org/keywords/microcontroller","display_name":"Microcontroller","score":0.5417843461036682},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.49278524518013},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.48882338404655457},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.48365509510040283},{"id":"https://openalex.org/keywords/flash","display_name":"Flash (photography)","score":0.4243418574333191},{"id":"https://openalex.org/keywords/memory-cell","display_name":"Memory cell","score":0.41960081458091736},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3531937599182129},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3504370152950287},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.24993932247161865},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19444355368614197},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.1636504828929901},{"id":"https://openalex.org/keywords/distributed-computing","display_name":"Distributed computing","score":0.07914912700653076}],"concepts":[{"id":"https://openalex.org/C2776531357","wikidata":"https://www.wikidata.org/wiki/Q174077","display_name":"Flash memory","level":2,"score":0.7516161203384399},{"id":"https://openalex.org/C177950962","wikidata":"https://www.wikidata.org/wiki/Q10997658","display_name":"Non-volatile memory","level":2,"score":0.6231090426445007},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6203543543815613},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6017032861709595},{"id":"https://openalex.org/C526921623","wikidata":"https://www.wikidata.org/wiki/Q190117","display_name":"Automotive industry","level":2,"score":0.5661923289299011},{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.5417843461036682},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.49278524518013},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.48882338404655457},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.48365509510040283},{"id":"https://openalex.org/C2777526259","wikidata":"https://www.wikidata.org/wiki/Q221836","display_name":"Flash (photography)","level":2,"score":0.4243418574333191},{"id":"https://openalex.org/C2776638159","wikidata":"https://www.wikidata.org/wiki/Q18343761","display_name":"Memory cell","level":4,"score":0.41960081458091736},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3531937599182129},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3504370152950287},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.24993932247161865},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19444355368614197},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.1636504828929901},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.07914912700653076},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0},{"id":"https://openalex.org/C153349607","wikidata":"https://www.wikidata.org/wiki/Q36649","display_name":"Visual arts","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-dat.2019.8741536","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2019.8741536","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.6000000238418579,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1603428089","https://openalex.org/W2154625719","https://openalex.org/W2207316223","https://openalex.org/W2434698350","https://openalex.org/W2516930094","https://openalex.org/W2756617269","https://openalex.org/W2770724147"],"related_works":["https://openalex.org/W2116397085","https://openalex.org/W2535372975","https://openalex.org/W1969888373","https://openalex.org/W2903035209","https://openalex.org/W4237246592","https://openalex.org/W2017101954","https://openalex.org/W2537636062","https://openalex.org/W1594494193","https://openalex.org/W2086578073","https://openalex.org/W2537420636"],"abstract_inverted_index":{"The":[0,96],"growing":[1],"application":[2,52],"scope":[3],"of":[4,17,24,34],"non-volatile":[5],"memory":[6,12,25,48,99],"based":[7],"microcontrollers":[8],"leads":[9],"to":[10,71,92,109],"increased":[11,77],"capacity":[13],"requirements.":[14],"Scaling":[15],"issues":[16],"established":[18],"flash":[19,47],"technologies":[20,28],"impede":[21],"further":[22],"increase":[23],"density.":[26],"Emerging":[27],"still":[29],"suffer":[30],"from":[31],"a":[32,60],"lack":[33],"robustness":[35],"for":[36,50],"automotive":[37,51],"application.":[38],"This":[39],"paper":[40],"presents":[41],"the":[42,93],"first":[43],"embedded":[44],"multi-level":[45],"cell":[46,69],"macro":[49],"manufactured":[53],"in":[54],"28":[55],"nm":[56],"technology.":[57],"It":[58],"employs":[59],"robust":[61],"time-domain":[62,84],"voltage":[63,90],"sensing":[64],"scheme":[65],"with":[66,76,112],"ramped":[67],"gate":[68],"biasing":[70],"achieve":[72],"low":[73],"latency":[74],"combined":[75],"fault":[78],"tolerance.":[79],"Measurement":[80],"results":[81],"show":[82],"widened":[83],"read":[85],"windows":[86],"when":[87],"applying":[88],"dynamic":[89],"ramps":[91],"word":[94],"lines.":[95],"16":[97],"Mb":[98],"features":[100],"30":[101],"ns":[102],"random":[103],"access":[104],"time":[105],"at":[106],"temperatures":[107],"up":[108],"175":[110],"\u00b0C":[111],"2b/cell":[113],"operation.":[114],"Retention":[115],"bit":[116],"error":[117],"rates":[118],"below":[119],"80":[120],"ppm":[121],"are":[122],"achieved":[123],"after":[124],"1":[125],"k":[126],"programming":[127],"and":[128],"erasing":[129],"cycles.":[130]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}