{"id":"https://openalex.org/W2805850079","doi":"https://doi.org/10.1109/vlsi-dat.2018.8373275","title":"MapReduce-based pattern classification for design space analysis","display_name":"MapReduce-based pattern classification for design space analysis","publication_year":2018,"publication_date":"2018-04-01","ids":{"openalex":"https://openalex.org/W2805850079","doi":"https://doi.org/10.1109/vlsi-dat.2018.8373275","mag":"2805850079"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-dat.2018.8373275","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2018.8373275","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5054122828","display_name":"Yan-Shiun Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yan-Shiun Wu","raw_affiliation_strings":["National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109301373","display_name":"Hongyan Su","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Hong-Yan Su","raw_affiliation_strings":["National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112346398","display_name":"Yi-Hsiang Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Yi-Hsiang Chang","raw_affiliation_strings":["National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084170591","display_name":"Rasit Onur Topaloglu","orcid":"https://orcid.org/0000-0001-8759-6959"},"institutions":[{"id":"https://openalex.org/I25846049","display_name":"National Tsing Hua University","ror":"https://ror.org/00zdnkx70","country_code":"TW","type":"education","lineage":["https://openalex.org/I25846049"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Rasit Onur Topaloglu","raw_affiliation_strings":["National Tsing Hua University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Tsing Hua University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I25846049"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5034618339","display_name":"Yih-Lang Li","orcid":"https://orcid.org/0000-0002-6441-2392"},"institutions":[{"id":"https://openalex.org/I1341412227","display_name":"IBM (United States)","ror":"https://ror.org/05hh8d621","country_code":"US","type":"company","lineage":["https://openalex.org/I1341412227"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yih-Lang Li","raw_affiliation_strings":["IBM, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"IBM, USA","institution_ids":["https://openalex.org/I1341412227"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.8313,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.65869565,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9923999905586243,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9740999937057495,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/design-for-manufacturability","display_name":"Design for manufacturability","score":0.8676878213882446},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.708233654499054},{"id":"https://openalex.org/keywords/cad","display_name":"CAD","score":0.6073880195617676},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.5792467594146729},{"id":"https://openalex.org/keywords/contest","display_name":"CONTEST","score":0.4821852743625641},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4503631591796875},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.43277448415756226},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.4104834794998169},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.37848377227783203},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.3630638122558594},{"id":"https://openalex.org/keywords/engineering-drawing","display_name":"Engineering drawing","score":0.14688721299171448},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12155473232269287}],"concepts":[{"id":"https://openalex.org/C62064638","wikidata":"https://www.wikidata.org/wiki/Q553878","display_name":"Design for manufacturability","level":2,"score":0.8676878213882446},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.708233654499054},{"id":"https://openalex.org/C194789388","wikidata":"https://www.wikidata.org/wiki/Q17855283","display_name":"CAD","level":2,"score":0.6073880195617676},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.5792467594146729},{"id":"https://openalex.org/C2777582232","wikidata":"https://www.wikidata.org/wiki/Q5013414","display_name":"CONTEST","level":2,"score":0.4821852743625641},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4503631591796875},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.43277448415756226},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.4104834794998169},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.37848377227783203},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.3630638122558594},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.14688721299171448},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12155473232269287},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-dat.2018.8373275","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2018.8373275","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5299999713897705,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2026211365","https://openalex.org/W2053195890","https://openalex.org/W2173213060","https://openalex.org/W2538780316","https://openalex.org/W2625105415","https://openalex.org/W2625784888","https://openalex.org/W6663978089"],"related_works":["https://openalex.org/W2735088306","https://openalex.org/W4286740636","https://openalex.org/W2946214509","https://openalex.org/W2606108738","https://openalex.org/W2628063975","https://openalex.org/W2356479129","https://openalex.org/W2387346515","https://openalex.org/W2352196451","https://openalex.org/W2063121583","https://openalex.org/W1886798349"],"abstract_inverted_index":{"With":[0],"the":[1,68,71,98,101],"ongoing":[2],"reduction":[3],"of":[4,70,78,80,100,109],"feature":[5,53,58],"size,":[6],"design":[7,28,31],"for":[8,27,47,50],"manufacturability":[9],"is":[10,20,64],"a":[11,21,42],"critical":[12],"concern":[13],"in":[14,107],"advanced":[15],"technology":[16],"nodes.":[17],"Pattern":[18],"classification":[19,51,73],"promising":[22],"and":[23,34,56,93],"widely":[24],"employed":[25],"approach":[26],"space":[29],"analysis,":[30],"rule":[32],"generation,":[33],"yield":[35],"optimization.":[36],"In":[37],"this":[38,95],"paper,":[39],"we":[40],"propose":[41],"hybrid":[43],"algorithm":[44],"that":[45,76,90],"account":[46],"two":[48],"variations":[49],"metrics:":[52],"edge":[54],"displacement":[55],"total":[57],"area":[59],"difference.":[60],"A":[61],"MapRe-duce-based":[62],"framework":[63],"proposed":[65],"to":[66],"reduce":[67],"complexity":[69],"pattern":[72],"problem":[74],"such":[75],"orders":[77],"magnitude":[79],"performance":[81],"improvement":[82],"can":[83],"be":[84],"realized.":[85],"Our":[86],"experimental":[87],"results":[88],"indicate":[89],"regarding":[91],"accuracy":[92],"runtime,":[94],"work":[96],"out-performs":[97],"winner":[99],"CAD":[102],"Contest":[103],"at":[104],"ICCAD":[105],"2016":[106],"terms":[108],"contest":[110],"scoring":[111],"measure.":[112]},"counts_by_year":[{"year":2020,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}