{"id":"https://openalex.org/W2806235433","doi":"https://doi.org/10.1109/vlsi-dat.2018.8373224","title":"A 25-Gb/s 13 mW clock and data recovery using C<sup>2</sup>MOS D-flip-flop in 65-nm CMOS","display_name":"A 25-Gb/s 13 mW clock and data recovery using C<sup>2</sup>MOS D-flip-flop in 65-nm CMOS","publication_year":2018,"publication_date":"2018-04-01","ids":{"openalex":"https://openalex.org/W2806235433","doi":"https://doi.org/10.1109/vlsi-dat.2018.8373224","mag":"2806235433"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-dat.2018.8373224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2018.8373224","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075811902","display_name":"Ryosuke Noguchi","orcid":null},"institutions":[{"id":"https://openalex.org/I139159150","display_name":"University of Shiga Prefecture","ror":"https://ror.org/02dvjfw95","country_code":"JP","type":"education","lineage":["https://openalex.org/I139159150"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Ryosuke Noguchi","raw_affiliation_strings":["The University of Shiga Prefecture, Department of Electronic Systems Engineering, 2500, Hassaka cho Hikone-city, Shiga, 522-8533, Japan"],"affiliations":[{"raw_affiliation_string":"The University of Shiga Prefecture, Department of Electronic Systems Engineering, 2500, Hassaka cho Hikone-city, Shiga, 522-8533, Japan","institution_ids":["https://openalex.org/I139159150"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064079501","display_name":"Kosuke Furuichi","orcid":null},"institutions":[{"id":"https://openalex.org/I139159150","display_name":"University of Shiga Prefecture","ror":"https://ror.org/02dvjfw95","country_code":"JP","type":"education","lineage":["https://openalex.org/I139159150"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kosuke Furuichi","raw_affiliation_strings":["The University of Shiga Prefecture, Department of Electronic Systems Engineering, 2500, Hassaka cho Hikone-city, Shiga, 522-8533, Japan"],"affiliations":[{"raw_affiliation_string":"The University of Shiga Prefecture, Department of Electronic Systems Engineering, 2500, Hassaka cho Hikone-city, Shiga, 522-8533, Japan","institution_ids":["https://openalex.org/I139159150"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Hiromu Uemura Toshiyuki Inoue","orcid":null},"institutions":[{"id":"https://openalex.org/I139159150","display_name":"University of Shiga Prefecture","ror":"https://ror.org/02dvjfw95","country_code":"JP","type":"education","lineage":["https://openalex.org/I139159150"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiromu Uemura Toshiyuki Inoue","raw_affiliation_strings":["The University of Shiga Prefecture, Department of Electronic Systems Engineering, 2500, Hassaka cho Hikone-city, Shiga, 522-8533, Japan"],"affiliations":[{"raw_affiliation_string":"The University of Shiga Prefecture, Department of Electronic Systems Engineering, 2500, Hassaka cho Hikone-city, Shiga, 522-8533, Japan","institution_ids":["https://openalex.org/I139159150"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038761727","display_name":"Akira Tsuchiya","orcid":"https://orcid.org/0000-0002-3299-9328"},"institutions":[{"id":"https://openalex.org/I139159150","display_name":"University of Shiga Prefecture","ror":"https://ror.org/02dvjfw95","country_code":"JP","type":"education","lineage":["https://openalex.org/I139159150"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Akira Tsuchiya","raw_affiliation_strings":["The University of Shiga Prefecture, Department of Electronic Systems Engineering, 2500, Hassaka cho Hikone-city, Shiga, 522-8533, Japan"],"affiliations":[{"raw_affiliation_string":"The University of Shiga Prefecture, Department of Electronic Systems Engineering, 2500, Hassaka cho Hikone-city, Shiga, 522-8533, Japan","institution_ids":["https://openalex.org/I139159150"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022381888","display_name":"Keiji Kishine","orcid":"https://orcid.org/0000-0003-3213-6650"},"institutions":[{"id":"https://openalex.org/I139159150","display_name":"University of Shiga Prefecture","ror":"https://ror.org/02dvjfw95","country_code":"JP","type":"education","lineage":["https://openalex.org/I139159150"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keiji Kishine","raw_affiliation_strings":["The University of Shiga Prefecture, Department of Electronic Systems Engineering, 2500, Hassaka cho Hikone-city, Shiga, 522-8533, Japan"],"affiliations":[{"raw_affiliation_string":"The University of Shiga Prefecture, Department of Electronic Systems Engineering, 2500, Hassaka cho Hikone-city, Shiga, 522-8533, Japan","institution_ids":["https://openalex.org/I139159150"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077471241","display_name":"Hiroaki Katsurai","orcid":"https://orcid.org/0009-0002-8115-3860"},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroaki Katsurai","raw_affiliation_strings":["NTT Device Technology Labs, NTT Corporation, 3-1, Morinosato Wakamiya, Atsugi Kanagawa, 243-0198, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Device Technology Labs, NTT Corporation, 3-1, Morinosato Wakamiya, Atsugi Kanagawa, 243-0198, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102258855","display_name":"Shinsuke Nakano","orcid":null},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shinsuke Nakano","raw_affiliation_strings":["NTT Device Technology Labs, NTT Corporation, 3-1, Morinosato Wakamiya, Atsugi Kanagawa, 243-0198, Japan","NTT Device Innovation Center, NTT Corporation NTT Device Technology Labs, Morinosato Wakamiya, Atsugi Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Device Technology Labs, NTT Corporation, 3-1, Morinosato Wakamiya, Atsugi Kanagawa, 243-0198, Japan","institution_ids":["https://openalex.org/I2251713219"]},{"raw_affiliation_string":"NTT Device Innovation Center, NTT Corporation NTT Device Technology Labs, Morinosato Wakamiya, Atsugi Kanagawa, Japan","institution_ids":["https://openalex.org/I2251713219"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015690849","display_name":"Hideyuki Nosaka","orcid":"https://orcid.org/0000-0002-3994-0118"},"institutions":[{"id":"https://openalex.org/I2251713219","display_name":"NTT (Japan)","ror":"https://ror.org/00berct97","country_code":"JP","type":"company","lineage":["https://openalex.org/I2251713219"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideyuki Nosaka","raw_affiliation_strings":["NTT Device Technology Labs, NTT Corporation, 3-1, Morinosato Wakamiya, Atsugi Kanagawa, 243-0198, Japan","NTT Device Innovation Center, NTT Corporation NTT Device Technology Labs, Morinosato Wakamiya, Atsugi Kanagawa, Japan"],"affiliations":[{"raw_affiliation_string":"NTT Device Technology Labs, NTT Corporation, 3-1, Morinosato Wakamiya, Atsugi Kanagawa, 243-0198, Japan","institution_ids":["https://openalex.org/I2251713219"]},{"raw_affiliation_string":"NTT Device Innovation Center, NTT Corporation NTT Device Technology Labs, Morinosato Wakamiya, Atsugi Kanagawa, Japan","institution_ids":["https://openalex.org/I2251713219"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5075811902"],"corresponding_institution_ids":["https://openalex.org/I139159150"],"apc_list":null,"apc_paid":null,"fwci":0.1309,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.47185968,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/flip-flop","display_name":"Flip-flop","score":0.74837327003479},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.702496349811554},{"id":"https://openalex.org/keywords/power-consumption","display_name":"Power consumption","score":0.5613627433776855},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.44512176513671875},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.43957796692848206},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.39113813638687134},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2815377414226532},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.102894127368927}],"concepts":[{"id":"https://openalex.org/C2781007278","wikidata":"https://www.wikidata.org/wiki/Q183406","display_name":"Flip-flop","level":3,"score":0.74837327003479},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.702496349811554},{"id":"https://openalex.org/C2984118289","wikidata":"https://www.wikidata.org/wiki/Q29954","display_name":"Power consumption","level":3,"score":0.5613627433776855},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.44512176513671875},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.43957796692848206},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39113813638687134},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2815377414226532},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.102894127368927},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-dat.2018.8373224","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2018.8373224","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8999999761581421}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2032412046","https://openalex.org/W2089980566","https://openalex.org/W2124222653","https://openalex.org/W2210032893","https://openalex.org/W2756808819"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2132046218","https://openalex.org/W2783525109","https://openalex.org/W4402040071","https://openalex.org/W4230846245","https://openalex.org/W2763646728","https://openalex.org/W4206433830","https://openalex.org/W2168373109","https://openalex.org/W4300456897","https://openalex.org/W2118008391"],"abstract_inverted_index":{"A":[0],"25-Gb/s":[1,87],"low-power":[2,45],"Clock":[3],"and":[4,107],"Data":[5],"Recovery":[6],"(CDR)":[7],"with":[8,47,72,128],"Clocked":[9],"CMOS":[10,92],"(C":[11],"<sup":[12,54,60,103],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[13,55,61,104],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">2</sup>":[14,56,62,105],"MOS)":[15],"D-Flip-Flop":[16],"(D-FF)":[17],"for":[18,96,123],"low":[19],"power":[20,37,67,109],"operation":[21],"is":[22,29,100,114,118],"presented.":[23],"In":[24,39],"a":[25,52,73,90],"CDR":[26,46,88,127],"circuit,":[27],"D-FF":[28,64],"one":[30],"of":[31,121],"the":[32,36,44,66,82,97,108,124],"dominant":[33],"factor":[34],"on":[35],"consumption.":[38],"this":[40],"work,":[41],"we":[42,85],"design":[43],"25-GHz":[48,129],"clock":[49],"by":[50,68],"using":[51],"C":[53,59],"MOS":[57,63],"D-FF.":[58,79],"reduces":[65],"84":[69],"%":[70,120],"compared":[71],"conventional":[74,125],"current":[75],"mode":[76],"logic":[77],"(CML)":[78],"To":[80],"validate":[81],"proposed":[83],"design,":[84],"fabricated":[86],"in":[89],"65-nm":[91,126],"process.":[93],"The":[94],"area":[95],"core":[98],"circuits":[99],"0.047":[101],"mm":[102],",":[106],"consumption":[110],"without":[111],"output":[112],"buffers":[113],"13":[115,119],"mW,":[116],"which":[117],"that":[122],"clock.":[130]},"counts_by_year":[{"year":2018,"cited_by_count":1}],"updated_date":"2026-04-21T08:09:41.155169","created_date":"2025-10-10T00:00:00"}