{"id":"https://openalex.org/W1598756149","doi":"https://doi.org/10.1109/vlsi-dat.2015.7114528","title":"Integrating aging aware timing analysis into a commercial STA tool","display_name":"Integrating aging aware timing analysis into a commercial STA tool","publication_year":2015,"publication_date":"2015-04-01","ids":{"openalex":"https://openalex.org/W1598756149","doi":"https://doi.org/10.1109/vlsi-dat.2015.7114528","mag":"1598756149"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-dat.2015.7114528","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2015.7114528","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design, Automation and Test(VLSI-DAT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043105674","display_name":"Shushanik Karapetyan","orcid":null},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Shushanik Karapetyan","raw_affiliation_strings":["Institute for Electronic Design Automation, Technische Universitat Munchen, Munich, Germany","[Institute for Electronic Design Automation, Technische Universit\u00e4t M\u00fcnchen, Munich, Germany]"],"affiliations":[{"raw_affiliation_string":"Institute for Electronic Design Automation, Technische Universitat Munchen, Munich, Germany","institution_ids":["https://openalex.org/I62916508"]},{"raw_affiliation_string":"[Institute for Electronic Design Automation, Technische Universit\u00e4t M\u00fcnchen, Munich, Germany]","institution_ids":["https://openalex.org/I62916508"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017567485","display_name":"Ulf Schlichtmann","orcid":"https://orcid.org/0000-0003-4431-7619"},"institutions":[{"id":"https://openalex.org/I62916508","display_name":"Technical University of Munich","ror":"https://ror.org/02kkvpp62","country_code":"DE","type":"education","lineage":["https://openalex.org/I62916508"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ulf Schlichtmann","raw_affiliation_strings":["Institute for Electronic Design Automation, Technische Universitat Munchen, Munich, Germany","[Institute for Electronic Design Automation, Technische Universit\u00e4t M\u00fcnchen, Munich, Germany]"],"affiliations":[{"raw_affiliation_string":"Institute for Electronic Design Automation, Technische Universitat Munchen, Munich, Germany","institution_ids":["https://openalex.org/I62916508"]},{"raw_affiliation_string":"[Institute for Electronic Design Automation, Technische Universit\u00e4t M\u00fcnchen, Munich, Germany]","institution_ids":["https://openalex.org/I62916508"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5043105674"],"corresponding_institution_ids":["https://openalex.org/I62916508"],"apc_list":null,"apc_paid":null,"fwci":1.1837,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.80877305,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6375519037246704}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6375519037246704}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-dat.2015.7114528","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2015.7114528","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI Design, Automation and Test(VLSI-DAT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.4300000071525574,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W1991431227","https://openalex.org/W1991891926","https://openalex.org/W1994071691","https://openalex.org/W2037225622","https://openalex.org/W2062672825","https://openalex.org/W2091163742","https://openalex.org/W2096424065","https://openalex.org/W2097579272","https://openalex.org/W2100661413","https://openalex.org/W2102729267","https://openalex.org/W2103123542","https://openalex.org/W2117533672","https://openalex.org/W2136500761","https://openalex.org/W2164178706","https://openalex.org/W3143610959","https://openalex.org/W3145030156","https://openalex.org/W4234952510","https://openalex.org/W6648088779","https://openalex.org/W6684298975"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W2382290278","https://openalex.org/W2478288626","https://openalex.org/W4391913857","https://openalex.org/W2350741829","https://openalex.org/W2530322880"],"abstract_inverted_index":{"With":[0],"the":[1,34,48,55,61,67,128,154],"continuous":[2],"scaling":[3],"of":[4,29,37,47,57,63],"transistor":[5],"sizes,":[6],"aging":[7,40,58,93,99,130,164],"effects":[8,16,59],"become":[9],"more":[10,12],"and":[11,23,73,82,117,120,134,167],"pronounced.":[13],"Two":[14],"dominant":[15],"are":[17],"negative":[18],"bias":[19],"temperature":[20],"instability":[21],"(NBTI)":[22],"hot":[24],"carrier":[25],"injection":[26],"(HCI).":[27],"Both":[28],"these":[30,84],"mechanisms":[31],"negatively":[32],"impact":[33,56],"timing":[35,123,141],"behavior":[36],"circuits.":[38,159],"Traditionally,":[39],"analysis":[41,94,100,142],"has":[42],"not":[43,90,102],"been":[44,78],"a":[45,138],"part":[46],"established":[49],"circuit":[50],"design":[51,68],"flow.":[52],"However,":[53,86],"as":[54],"increases,":[60],"necessity":[62],"their":[64],"consideration":[65],"in":[66],"flow":[69],"grows.":[70],"Various":[71],"device":[72],"gate":[74,96,132],"level":[75],"models":[76],"have":[77],"developed":[79],"to":[80,105,156],"explore":[81],"study":[83],"effects.":[85],"commercial":[87,139,175],"tools":[88],"do":[89],"yet":[91],"support":[92],"on":[95],"level,":[97],"therefore":[98],"is":[101,165],"commonly":[103],"available":[104],"industrial":[106],"designers":[107],"yet.":[108],"This":[109],"paper":[110,148],"presents":[111,149],"an":[112],"automated":[113],"methodology":[114],"for":[115],"fast":[116],"accurate":[118],"NBTI":[119],"HCI":[121],"aware":[122,131],"analysis.":[124],"The":[125,147],"approach":[126],"utilizes":[127],"AgeGate":[129],"model":[133],"integrates":[135],"it":[136,169],"into":[137],"static":[140],"(STA)":[143],"tool":[144],"(Synopsys":[145],"PrimeTime).":[146],"results":[150,161],"obtained":[151],"from":[152],"applying":[153],"method":[155],"various":[157],"benchmark":[158],"These":[160],"demonstrate":[162],"that":[163,168],"relevant":[166],"can":[170],"efficiently":[171],"be":[172],"analyzed":[173],"using":[174],"tools.":[176]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":3}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}