{"id":"https://openalex.org/W2029497909","doi":"https://doi.org/10.1109/vlsi-dat.2014.6834894","title":"A passive supply-resonance suppression filter utilizing inductance-enhanced coupled bonding-wire coils","display_name":"A passive supply-resonance suppression filter utilizing inductance-enhanced coupled bonding-wire coils","publication_year":2014,"publication_date":"2014-04-01","ids":{"openalex":"https://openalex.org/W2029497909","doi":"https://doi.org/10.1109/vlsi-dat.2014.6834894","mag":"2029497909"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-dat.2014.6834894","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2014.6834894","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5022941859","display_name":"Taisuke Hayashi","orcid":null},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Taisuke Hayashi","raw_affiliation_strings":["Kobe University, Japan","Kobe University, JAPAN"],"affiliations":[{"raw_affiliation_string":"Kobe University, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Kobe University, JAPAN","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032938283","display_name":"Noriyuki Miura","orcid":"https://orcid.org/0000-0002-0072-6114"},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Noriyuki Miura","raw_affiliation_strings":["Kobe University, Japan","Kobe University, JAPAN"],"affiliations":[{"raw_affiliation_string":"Kobe University, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Kobe University, JAPAN","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064089426","display_name":"Kumpei Yoshikawa","orcid":null},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kumpei Yoshikawa","raw_affiliation_strings":["Kobe University, Japan","Kobe University, JAPAN"],"affiliations":[{"raw_affiliation_string":"Kobe University, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Kobe University, JAPAN","institution_ids":["https://openalex.org/I65837984"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5070370721","display_name":"Makoto Nagata","orcid":"https://orcid.org/0000-0002-0625-9107"},"institutions":[{"id":"https://openalex.org/I65837984","display_name":"Kobe University","ror":"https://ror.org/03tgsfw79","country_code":"JP","type":"education","lineage":["https://openalex.org/I65837984"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Makoto Nagata","raw_affiliation_strings":["Kobe University, Japan","Kobe University, JAPAN"],"affiliations":[{"raw_affiliation_string":"Kobe University, Japan","institution_ids":["https://openalex.org/I65837984"]},{"raw_affiliation_string":"Kobe University, JAPAN","institution_ids":["https://openalex.org/I65837984"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5022941859"],"corresponding_institution_ids":["https://openalex.org/I65837984"],"apc_list":null,"apc_paid":null,"fwci":0.4187,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.67330479,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11417","display_name":"Advancements in PLL and VCO Technologies","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inductance","display_name":"Inductance","score":0.7285609245300293},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7039512395858765},{"id":"https://openalex.org/keywords/electromagnetic-coil","display_name":"Electromagnetic coil","score":0.6682737469673157},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.637395441532135},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.5724812150001526},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5089201927185059},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4950777590274811},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.49197766184806824},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.4870889186859131},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4764863848686218},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.47022390365600586},{"id":"https://openalex.org/keywords/wire-bonding","display_name":"Wire bonding","score":0.4353320002555847},{"id":"https://openalex.org/keywords/power-integrity","display_name":"Power integrity","score":0.4251987040042877},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3998798429965973},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.33910292387008667},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2713991701602936},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1810145378112793},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1695803701877594},{"id":"https://openalex.org/keywords/signal-integrity","display_name":"Signal integrity","score":0.07594969868659973}],"concepts":[{"id":"https://openalex.org/C29210110","wikidata":"https://www.wikidata.org/wiki/Q177897","display_name":"Inductance","level":3,"score":0.7285609245300293},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7039512395858765},{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.6682737469673157},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.637395441532135},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.5724812150001526},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5089201927185059},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4950777590274811},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.49197766184806824},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.4870889186859131},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4764863848686218},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.47022390365600586},{"id":"https://openalex.org/C140269135","wikidata":"https://www.wikidata.org/wiki/Q750783","display_name":"Wire bonding","level":3,"score":0.4353320002555847},{"id":"https://openalex.org/C2777561913","wikidata":"https://www.wikidata.org/wiki/Q19599527","display_name":"Power integrity","level":4,"score":0.4251987040042877},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3998798429965973},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.33910292387008667},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2713991701602936},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1810145378112793},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1695803701877594},{"id":"https://openalex.org/C44938667","wikidata":"https://www.wikidata.org/wiki/Q4503810","display_name":"Signal integrity","level":3,"score":0.07594969868659973},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-dat.2014.6834894","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2014.6834894","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7900000214576721,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320338075","display_name":"Core Research for Evolutional Science and Technology","ror":"https://ror.org/00097mb19"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1969650916","https://openalex.org/W2123037857","https://openalex.org/W2141448832","https://openalex.org/W6642736963"],"related_works":["https://openalex.org/W4235454973","https://openalex.org/W4239401071","https://openalex.org/W2067224723","https://openalex.org/W2898734073","https://openalex.org/W1895690637","https://openalex.org/W3211049872","https://openalex.org/W2156032803","https://openalex.org/W2280084618","https://openalex.org/W1634378525","https://openalex.org/W4387884733"],"abstract_inverted_index":{"This":[0,62],"paper":[1],"presents":[2],"a":[3,18],"low-power":[4],"and":[5,25,50,72,95,122],"compact":[6],"passive":[7,63],"supply-resonance":[8],"(SR)":[9],"suppression":[10,85,113],"filter.":[11],"By":[12],"using":[13],"an":[14,51,82],"on-chip":[15,52,99],"waveform":[16],"monitor,":[17],"power-delivery":[19],"network":[20],"(PDN)":[21],"impedance":[22],"including":[23],"package,":[24],"board":[26],"PDNs":[27],"is":[28,56],"in-situ":[29],"analyzed":[30],"to":[31,70,76,81],"identify":[32],"the":[33,59,67,73,98,103],"SR":[34,60,84,112],"frequency":[35],"f":[36],"<sub":[37],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[38],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">SR</sub>":[39],".":[40],"A":[41,106],"notch":[42],"filter":[43],"which":[44],"consists":[45],"of":[46,119],"coupled":[47,89],"bonding-wire":[48,90],"coils":[49],"MOS":[53],"capacitor":[54,100],"bank":[55],"auto-tuned":[57],"for":[58,102],"suppression.":[61],"filtering":[64],"approach":[65],"reduces":[66],"power":[68,75,120],"loss":[69,121],"1/5~1/10":[71],"static":[74],"effectively":[77],"zero":[78],"as":[79],"compared":[80],"active":[83],"circuit":[86],"[1].":[87],"The":[88],"coil":[91],"enhances":[92],"its":[93],"self-inductance":[94],"hence":[96],"shrinks":[97],"size":[101],"layout-area":[104],"saving.":[105],"0.18\u03bcm":[107],"CMOS":[108],"test":[109],"chip":[110],"demonstrates":[111],"by":[114],">43%":[115],"with":[116],"only":[117],"<;7%":[118],"<;0.034mm":[123],"layout":[124],"area":[125],"penalty.":[126]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}