{"id":"https://openalex.org/W2077457383","doi":"https://doi.org/10.1109/vlsi-dat.2012.6212652","title":"A 1-V 60 GHz CMOS low noise amplifier with low loss microstrip lines","display_name":"A 1-V 60 GHz CMOS low noise amplifier with low loss microstrip lines","publication_year":2012,"publication_date":"2012-04-01","ids":{"openalex":"https://openalex.org/W2077457383","doi":"https://doi.org/10.1109/vlsi-dat.2012.6212652","mag":"2077457383"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-dat.2012.6212652","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2012.6212652","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of Technical Program of 2012 VLSI Design, Automation and Test","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065961705","display_name":"Chun\u2010Lin Ko","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]},{"id":"https://openalex.org/I4210166867","display_name":"National Institutes of Applied Research","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chun-Lin Ko","raw_affiliation_strings":["National Chiao Tung University, Hsinchu, Taiwan","National Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"National Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102149835","display_name":"Chieh-Pin Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Institutes of Applied Research","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chieh-Pin Chang","raw_affiliation_strings":["National Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101766269","display_name":"Chien\u2010Nan Kuo","orcid":"https://orcid.org/0000-0001-7479-717X"},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chien-Nan Kuo","raw_affiliation_strings":["National Chiao Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Chiao Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036113522","display_name":"Da\u2010Chiang Chang","orcid":"https://orcid.org/0000-0001-8312-9595"},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Institutes of Applied Research","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Da-Chiang Chang","raw_affiliation_strings":["National Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110220041","display_name":"Ying\u2010Zong Juang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210166867","display_name":"National Institutes of Applied Research","ror":"https://ror.org/05wcstg80","country_code":"TW","type":"government","lineage":["https://openalex.org/I4210128167","https://openalex.org/I4210166867"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ying-Zong Juang","raw_affiliation_strings":["National Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Chip Implementation Center, National Applied Research Laboratories, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210166867"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.9993,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.79268418,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microstrip","display_name":"Microstrip","score":0.744022011756897},{"id":"https://openalex.org/keywords/ground-plane","display_name":"Ground plane","score":0.6831530332565308},{"id":"https://openalex.org/keywords/low-noise-amplifier","display_name":"Low-noise amplifier","score":0.6338200569152832},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6092796921730042},{"id":"https://openalex.org/keywords/noise-figure","display_name":"Noise figure","score":0.5671525001525879},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5618116855621338},{"id":"https://openalex.org/keywords/amplifier","display_name":"Amplifier","score":0.5347105264663696},{"id":"https://openalex.org/keywords/insertion-loss","display_name":"Insertion loss","score":0.4663110673427582},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.4296020567417145},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3955632448196411},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3940693438053131},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.38768354058265686},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.38304728269577026},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3494163155555725},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.29741713404655457},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.2439395785331726},{"id":"https://openalex.org/keywords/antenna","display_name":"Antenna (radio)","score":0.07394763827323914}],"concepts":[{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.744022011756897},{"id":"https://openalex.org/C88764893","wikidata":"https://www.wikidata.org/wiki/Q1547722","display_name":"Ground plane","level":3,"score":0.6831530332565308},{"id":"https://openalex.org/C155332784","wikidata":"https://www.wikidata.org/wiki/Q1151304","display_name":"Low-noise amplifier","level":4,"score":0.6338200569152832},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6092796921730042},{"id":"https://openalex.org/C112806910","wikidata":"https://www.wikidata.org/wiki/Q746825","display_name":"Noise figure","level":4,"score":0.5671525001525879},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5618116855621338},{"id":"https://openalex.org/C194257627","wikidata":"https://www.wikidata.org/wiki/Q211554","display_name":"Amplifier","level":3,"score":0.5347105264663696},{"id":"https://openalex.org/C90327742","wikidata":"https://www.wikidata.org/wiki/Q947396","display_name":"Insertion loss","level":2,"score":0.4663110673427582},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.4296020567417145},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3955632448196411},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3940693438053131},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.38768354058265686},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.38304728269577026},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3494163155555725},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.29741713404655457},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2439395785331726},{"id":"https://openalex.org/C21822782","wikidata":"https://www.wikidata.org/wiki/Q131214","display_name":"Antenna (radio)","level":2,"score":0.07394763827323914},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-dat.2012.6212652","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vlsi-dat.2012.6212652","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of Technical Program of 2012 VLSI Design, Automation and Test","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.8799999952316284}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321040","display_name":"National Science Council","ror":"https://ror.org/02kv4zf79"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2098309357","https://openalex.org/W2099341468","https://openalex.org/W2111318673","https://openalex.org/W2112728827","https://openalex.org/W2113258681","https://openalex.org/W2136507586","https://openalex.org/W2159913949"],"related_works":["https://openalex.org/W2135018839","https://openalex.org/W4389104745","https://openalex.org/W2119730587","https://openalex.org/W2161201277","https://openalex.org/W2160800367","https://openalex.org/W2181528871","https://openalex.org/W2115285716","https://openalex.org/W2108759486","https://openalex.org/W2592537632","https://openalex.org/W2111894905"],"abstract_inverted_index":{"A":[0],"V-band":[1],"low":[2,18,85,99],"noise":[3,100],"amplifier":[4],"has":[5],"been":[6],"demonstrated":[7],"in":[8,32],"90":[9],"nm":[10],"CMOS.":[11],"The":[12,39,75],"LNA":[13,78,96],"design":[14],"was":[15],"used":[16],"the":[17,28,34,42,46,56,65,67,92,95],"loss":[19,48,69],"microstrip":[20,93],"lines":[21],"for":[22,84],"all":[23],"matching":[24],"networks.":[25],"To":[26],"fulfill":[27],"metal":[29],"density":[30],"requirement":[31],"fabrication,":[33],"ground":[35],"plane":[36],"needs":[37],"slots.":[38],"direction":[40],"of":[41,77,102,108],"slot":[43,62],"pattern":[44],"affects":[45],"line":[47,68],"over":[49],"30%":[50],"at":[51,111],"60":[52,112],"GHz,":[53],"according":[54],"to":[55],"analysis":[57],"and":[58,105],"experimental":[59],"results.":[60],"By":[61],"filling":[63],"under":[64],"line,":[66],"can":[70],"be":[71],"improved":[72],"10%":[73],"further.":[74],"topology":[76],"is":[79],"3":[80],"stage":[81],"common-source":[82],"cascades":[83],"supply":[86],"voltage":[87],"limited":[88],"by":[89],"process.":[90],"Using":[91],"lines,":[94],"exhibited":[97],"a":[98,106,119],"figure":[101],"5.6":[103],"dB":[104,110],"gain":[107],"10.8":[109],"GHz":[113],"with":[114],"only":[115],"5.5":[116],"mW":[117],"from":[118],"1.0":[120],"V":[121],"power":[122],"supply.":[123]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":2},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}