{"id":"https://openalex.org/W1963734298","doi":"https://doi.org/10.1109/vldi-dat.2013.6533878","title":"A process-scalable RF transmitter using 90nm and 65nm Si CMOS","display_name":"A process-scalable RF transmitter using 90nm and 65nm Si CMOS","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W1963734298","doi":"https://doi.org/10.1109/vldi-dat.2013.6533878","mag":"1963734298"},"language":"en","primary_location":{"id":"doi:10.1109/vldi-dat.2013.6533878","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vldi-dat.2013.6533878","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5028333708","display_name":"Atsushi Shirane","orcid":"https://orcid.org/0000-0001-8172-4323"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"A. Shirane","raw_affiliation_strings":["Solutions Science Research Laboratory (SSRL), Tokyo Institute of Technology, Yokohama, Japan","Solutions Sci. Res. Lab. (SSRL), Tokyo Inst. of Technol., Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Solutions Science Research Laboratory (SSRL), Tokyo Institute of Technology, Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]},{"raw_affiliation_string":"Solutions Sci. Res. Lab. (SSRL), Tokyo Inst. of Technol., Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079428934","display_name":"Hiroyuki Ito","orcid":"https://orcid.org/0000-0002-5687-0019"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"H. Ito","raw_affiliation_strings":["Solutions Science Research Laboratory (SSRL), Tokyo Institute of Technology, Yokohama, Japan","Solutions Sci. Res. Lab. (SSRL), Tokyo Inst. of Technol., Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Solutions Science Research Laboratory (SSRL), Tokyo Institute of Technology, Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]},{"raw_affiliation_string":"Solutions Sci. Res. Lab. (SSRL), Tokyo Inst. of Technol., Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046233153","display_name":"Noboru Ishihara","orcid":null},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"N. Ishihara","raw_affiliation_strings":["Solutions Science Research Laboratory (SSRL), Tokyo Institute of Technology, Yokohama, Japan","Solutions Sci. Res. Lab. (SSRL), Tokyo Inst. of Technol., Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Solutions Science Research Laboratory (SSRL), Tokyo Institute of Technology, Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]},{"raw_affiliation_string":"Solutions Sci. Res. Lab. (SSRL), Tokyo Inst. of Technol., Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049015548","display_name":"Kazuya Masu","orcid":"https://orcid.org/0000-0002-7121-8440"},"institutions":[{"id":"https://openalex.org/I114531698","display_name":"Tokyo Institute of Technology","ror":"https://ror.org/0112mx960","country_code":"JP","type":"education","lineage":["https://openalex.org/I114531698"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"K. Masu","raw_affiliation_strings":["Solutions Science Research Laboratory (SSRL), Tokyo Institute of Technology, Yokohama, Japan","Solutions Sci. Res. Lab. (SSRL), Tokyo Inst. of Technol., Yokohama, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Solutions Science Research Laboratory (SSRL), Tokyo Institute of Technology, Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]},{"raw_affiliation_string":"Solutions Sci. Res. Lab. (SSRL), Tokyo Inst. of Technol., Yokohama, Japan","institution_ids":["https://openalex.org/I114531698"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I114531698"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.02786698,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10187","display_name":"Radio Frequency Integrated Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transmitter","display_name":"Transmitter","score":0.8389318585395813},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.799342930316925},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7581738233566284},{"id":"https://openalex.org/keywords/miniaturization","display_name":"Miniaturization","score":0.6622862219810486},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.552108883857727},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4979128837585449},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47047191858291626},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46841636300086975},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.44022461771965027},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.420159250497818},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.3887825608253479},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22721505165100098},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.21043875813484192},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.11660721898078918}],"concepts":[{"id":"https://openalex.org/C47798520","wikidata":"https://www.wikidata.org/wiki/Q190157","display_name":"Transmitter","level":3,"score":0.8389318585395813},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.799342930316925},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7581738233566284},{"id":"https://openalex.org/C57528182","wikidata":"https://www.wikidata.org/wiki/Q1271842","display_name":"Miniaturization","level":2,"score":0.6622862219810486},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.552108883857727},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4979128837585449},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47047191858291626},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46841636300086975},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.44022461771965027},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.420159250497818},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.3887825608253479},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22721505165100098},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.21043875813484192},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.11660721898078918},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vldi-dat.2013.6533878","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vldi-dat.2013.6533878","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.8999999761581421,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321416","display_name":"Agilent Technologies","ror":"https://ror.org/01xtpxr95"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":3,"referenced_works":["https://openalex.org/W2007878036","https://openalex.org/W2026380282","https://openalex.org/W2099489306"],"related_works":["https://openalex.org/W2348807422","https://openalex.org/W2361025757","https://openalex.org/W2050837474","https://openalex.org/W2926730772","https://openalex.org/W1532462972","https://openalex.org/W1985414612","https://openalex.org/W2784209563","https://openalex.org/W2049043962","https://openalex.org/W4386264909","https://openalex.org/W3013760104"],"abstract_inverted_index":{"This":[0],"paper":[1],"describes":[2],"a":[3],"process-scalable":[4],"transmitter":[5,16],"based":[6],"on":[7],"inverter":[8],"topology":[9],"excluding":[10],"un-scalable":[11],"RF":[12],"inductors.":[13],"The":[14,27,43,53],"proposed":[15],"was":[17],"fabricated":[18],"by":[19],"using":[20],"90nm":[21,36],"and":[22,37,62,82],"65nm":[23,38],"Si":[24],"CMOS":[25],"process.":[26],"following":[28],"results":[29,74],"are":[30],"obtained":[31],"from":[32,50,57,67],"the":[33,40,46,63,76,79,84,88],"comparison":[34],"between":[35],"of":[39,45,78],"measurement":[41],"results.":[42],"area":[44],"core":[47],"circuits":[48],"reduces":[49],"0.0081mm2to":[51],"0.0054mm2.":[52],"operational":[54],"frequency":[55],"improves":[56],"6.0":[58],"GHz":[59],"to":[60,70],"11GHz,":[61],"power":[64],"consumption":[65],"decreases":[66],"10.6":[68],"mW":[69],"7.0":[71],"mW.":[72],"These":[73],"confirm":[75],"process-scalability":[77],"presented":[80],"transmitter,":[81],"promise":[83],"further":[85],"improvements":[86],"with":[87],"future":[89],"miniaturization.":[90]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}