{"id":"https://openalex.org/W1966802912","doi":"https://doi.org/10.1109/vldi-dat.2013.6533801","title":"Area-efficient power-rail ESD clamp circuit with SCR device embedded into ESD-transient detection circuit in a 65nm CMOS process","display_name":"Area-efficient power-rail ESD clamp circuit with SCR device embedded into ESD-transient detection circuit in a 65nm CMOS process","publication_year":2013,"publication_date":"2013-04-01","ids":{"openalex":"https://openalex.org/W1966802912","doi":"https://doi.org/10.1109/vldi-dat.2013.6533801","mag":"1966802912"},"language":"en","primary_location":{"id":"doi:10.1109/vldi-dat.2013.6533801","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vldi-dat.2013.6533801","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102214259","display_name":"Chih-Ting Yeh","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]},{"id":"https://openalex.org/I4210148468","display_name":"Industrial Technology Research Institute","ror":"https://ror.org/05szzwt63","country_code":"TW","type":"nonprofit","lineage":["https://openalex.org/I4210148468"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Chih-Ting Yeh","raw_affiliation_strings":["Department of Electronics Engineering & Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan","Information and Communications Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics Engineering & Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]},{"raw_affiliation_string":"Information and Communications Research Laboratories, Industrial Technology Research Institute, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I4210148468"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111936696","display_name":"Ming-Dou Ker","orcid":null},"institutions":[{"id":"https://openalex.org/I148366613","display_name":"National Yang Ming Chiao Tung University","ror":"https://ror.org/00se2k293","country_code":"TW","type":"education","lineage":["https://openalex.org/I148366613"]},{"id":"https://openalex.org/I98298690","display_name":"I-Shou University","ror":"https://ror.org/04d7e4m76","country_code":"TW","type":"education","lineage":["https://openalex.org/I98298690"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ming-Dou Ker","raw_affiliation_strings":["Department of Electronic Engineering, I-Shou University, Kaohsiung, Taiwan","Department of Electronics Engineering & Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Engineering, I-Shou University, Kaohsiung, Taiwan","institution_ids":["https://openalex.org/I98298690"]},{"raw_affiliation_string":"Department of Electronics Engineering & Institute of Electronics, National Chiao-Tung University, Hsinchu, Taiwan","institution_ids":["https://openalex.org/I148366613"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.047772,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/electrostatic-discharge","display_name":"Electrostatic discharge","score":0.9014154076576233},{"id":"https://openalex.org/keywords/clamper","display_name":"Clamper","score":0.7670972347259521},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6605909466743469},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.6216974854469299},{"id":"https://openalex.org/keywords/human-body-model","display_name":"Human-body model","score":0.5134345293045044},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.48765337467193604},{"id":"https://openalex.org/keywords/rectifier","display_name":"Rectifier (neural networks)","score":0.4544026553630829},{"id":"https://openalex.org/keywords/clamp","display_name":"Clamp","score":0.4375991225242615},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3836210072040558},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3698963522911072},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.36085253953933716},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.23899132013320923}],"concepts":[{"id":"https://openalex.org/C205483674","wikidata":"https://www.wikidata.org/wiki/Q3574961","display_name":"Electrostatic discharge","level":3,"score":0.9014154076576233},{"id":"https://openalex.org/C64881904","wikidata":"https://www.wikidata.org/wiki/Q825778","display_name":"Clamper","level":3,"score":0.7670972347259521},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6605909466743469},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6216974854469299},{"id":"https://openalex.org/C2781089380","wikidata":"https://www.wikidata.org/wiki/Q5936753","display_name":"Human-body model","level":2,"score":0.5134345293045044},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.48765337467193604},{"id":"https://openalex.org/C50100734","wikidata":"https://www.wikidata.org/wiki/Q7303176","display_name":"Rectifier (neural networks)","level":5,"score":0.4544026553630829},{"id":"https://openalex.org/C2776161997","wikidata":"https://www.wikidata.org/wiki/Q846600","display_name":"Clamp","level":3,"score":0.4375991225242615},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3836210072040558},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3698963522911072},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.36085253953933716},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.23899132013320923},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C84111939","wikidata":"https://www.wikidata.org/wiki/Q5125465","display_name":"Clamping","level":2,"score":0.0},{"id":"https://openalex.org/C147168706","wikidata":"https://www.wikidata.org/wiki/Q1457734","display_name":"Recurrent neural network","level":3,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C86582703","wikidata":"https://www.wikidata.org/wiki/Q7617824","display_name":"Stochastic neural network","level":4,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vldi-dat.2013.6533801","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vldi-dat.2013.6533801","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8299999833106995}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2013327499","https://openalex.org/W2085898298","https://openalex.org/W2086185767","https://openalex.org/W2092538998","https://openalex.org/W2116641647","https://openalex.org/W2154937102","https://openalex.org/W2169412944"],"related_works":["https://openalex.org/W2169305461","https://openalex.org/W2154271946","https://openalex.org/W2133051202","https://openalex.org/W1571396369","https://openalex.org/W4245750910","https://openalex.org/W2153563320","https://openalex.org/W2082194675","https://openalex.org/W1966802912","https://openalex.org/W1964998666","https://openalex.org/W1773794743"],"abstract_inverted_index":{"An":[0],"area-efficient":[1],"power-rail":[2,50],"electrostatic":[3],"discharge":[4],"(ESD)":[5],"clamp":[6,15,52],"circuit":[7,35,53,92],"with":[8,54,95],"silicon-controlled":[9],"rectifier":[10],"(SCR)":[11],"as":[12],"main":[13],"ESD":[14,51,68,72],"device":[16],"has":[17],"been":[18],"proposed":[19,49],"and":[20,64],"verified":[21],"in":[22,40,81],"a":[23],"65nm":[24],"CMOS":[25],"process.":[26],"By":[27],"modifying":[28],"the":[29,32,41,45,48,71,77,82,90],"layout":[30],"structure,":[31],"ESD-transient":[33],"detection":[34],"can":[36,59],"be":[37],"totally":[38],"embedded":[39],"SCR":[42,55],"device.":[43],"From":[44],"measured":[46],"results,":[47],"width":[56],"of":[57,84],"45\u03bcm":[58],"achieve":[60],"7kV":[61],"human-body-model":[62],"(HBM)":[63],"350V":[65],"machinemodel":[66],"(MM)":[67],"levels":[69],"under":[70,89],"stress":[73],"event,":[74],"while":[75],"consuming":[76],"standby":[78],"leakage":[79],"current":[80],"order":[83],"nano-ampere":[85],"at":[86],"room":[87],"temperature":[88],"normal":[91],"operating":[93],"condition":[94],"1V":[96],"bias.":[97]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}