{"id":"https://openalex.org/W2057712258","doi":"https://doi.org/10.1109/vecims.2010.5609339","title":"Simulation of reflectometer system for complex reflection coefficient measurements","display_name":"Simulation of reflectometer system for complex reflection coefficient measurements","publication_year":2010,"publication_date":"2010-09-01","ids":{"openalex":"https://openalex.org/W2057712258","doi":"https://doi.org/10.1109/vecims.2010.5609339","mag":"2057712258"},"language":"en","primary_location":{"id":"doi:10.1109/vecims.2010.5609339","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vecims.2010.5609339","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Conference on Virtual Environments, Human-Computer Interfaces and Measurement Systems","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5020436704","display_name":"Ermeey Abd Kadir","orcid":null},"institutions":[{"id":"https://openalex.org/I82724352","display_name":"Universiti Teknologi MARA","ror":"https://ror.org/05n8tts92","country_code":"MY","type":"education","lineage":["https://openalex.org/I82724352"]},{"id":"https://openalex.org/I157696592","display_name":"Universiti Malaysia Terengganu","ror":"https://ror.org/02474f074","country_code":"MY","type":"education","lineage":["https://openalex.org/I157696592"]}],"countries":["MY"],"is_corresponding":true,"raw_author_name":"Ermeey Abd. Kadir","raw_affiliation_strings":["Faculty of Electrical Engineering, Universiti Teknologi MARA TerEngganu, Terengganu, Malaysia","Faculty of Electrical Engineering, Universiti Teknologi, MARA Terengganu, 23000, Malaysia"],"affiliations":[{"raw_affiliation_string":"Faculty of Electrical Engineering, Universiti Teknologi MARA TerEngganu, Terengganu, Malaysia","institution_ids":["https://openalex.org/I157696592","https://openalex.org/I82724352"]},{"raw_affiliation_string":"Faculty of Electrical Engineering, Universiti Teknologi, MARA Terengganu, 23000, Malaysia","institution_ids":["https://openalex.org/I82724352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026805111","display_name":"Husna Abd. Rahman","orcid":null},"institutions":[{"id":"https://openalex.org/I82724352","display_name":"Universiti Teknologi MARA","ror":"https://ror.org/05n8tts92","country_code":"MY","type":"education","lineage":["https://openalex.org/I82724352"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Husna Abd. Rahman","raw_affiliation_strings":["Microwave Technology Centre, Universiti Teknologi MARA TerEngganu, Shah Alam, Selangor Darul Ehsan, Malaysia","Microwave Technology Centre, Universiti Teknologi MARA, 40450, Shah Alam, Selangor, Malaysia"],"affiliations":[{"raw_affiliation_string":"Microwave Technology Centre, Universiti Teknologi MARA TerEngganu, Shah Alam, Selangor Darul Ehsan, Malaysia","institution_ids":["https://openalex.org/I82724352"]},{"raw_affiliation_string":"Microwave Technology Centre, Universiti Teknologi MARA, 40450, Shah Alam, Selangor, Malaysia","institution_ids":["https://openalex.org/I82724352"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091159346","display_name":"Nesamalar Kantasamu","orcid":null},"institutions":[{"id":"https://openalex.org/I82724352","display_name":"Universiti Teknologi MARA","ror":"https://ror.org/05n8tts92","country_code":"MY","type":"education","lineage":["https://openalex.org/I82724352"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Nesamalar Kantasamu","raw_affiliation_strings":["Microwave Technology Centre, Universiti Teknologi MARA TerEngganu, Shah Alam, Selangor Darul Ehsan, Malaysia","Microwave Technology Centre, Universiti Teknologi MARA, 40450, Shah Alam, Selangor, Malaysia"],"affiliations":[{"raw_affiliation_string":"Microwave Technology Centre, Universiti Teknologi MARA TerEngganu, Shah Alam, Selangor Darul Ehsan, Malaysia","institution_ids":["https://openalex.org/I82724352"]},{"raw_affiliation_string":"Microwave Technology Centre, Universiti Teknologi MARA, 40450, Shah Alam, Selangor, Malaysia","institution_ids":["https://openalex.org/I82724352"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5008266041","display_name":"Nor Wahidah Binti Misran","orcid":null},"institutions":[{"id":"https://openalex.org/I82724352","display_name":"Universiti Teknologi MARA","ror":"https://ror.org/05n8tts92","country_code":"MY","type":"education","lineage":["https://openalex.org/I82724352"]}],"countries":["MY"],"is_corresponding":false,"raw_author_name":"Nor Wahidah Binti Misran","raw_affiliation_strings":["Microwave Technology Centre, Universiti Teknologi MARA TerEngganu, Shah Alam, Selangor Darul Ehsan, Malaysia","Microwave Technology Centre, Universiti Teknologi MARA, 40450, Shah Alam, Selangor, Malaysia"],"affiliations":[{"raw_affiliation_string":"Microwave Technology Centre, Universiti Teknologi MARA TerEngganu, Shah Alam, Selangor Darul Ehsan, Malaysia","institution_ids":["https://openalex.org/I82724352"]},{"raw_affiliation_string":"Microwave Technology Centre, Universiti Teknologi MARA, 40450, Shah Alam, Selangor, Malaysia","institution_ids":["https://openalex.org/I82724352"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5020436704"],"corresponding_institution_ids":["https://openalex.org/I157696592","https://openalex.org/I82724352"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.1207746,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"28","last_page":"32"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10262","display_name":"Microwave Engineering and Waveguides","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":0.9840999841690063,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reflection-coefficient","display_name":"Reflection coefficient","score":0.8710842728614807},{"id":"https://openalex.org/keywords/reflection","display_name":"Reflection (computer programming)","score":0.7353817224502563},{"id":"https://openalex.org/keywords/microstrip","display_name":"Microstrip","score":0.598704993724823},{"id":"https://openalex.org/keywords/optical-time-domain-reflectometer","display_name":"Optical time-domain reflectometer","score":0.5858700275421143},{"id":"https://openalex.org/keywords/network-analyzer","display_name":"Network analyzer (electrical)","score":0.541172981262207},{"id":"https://openalex.org/keywords/scattering-parameters","display_name":"Scattering parameters","score":0.5366973280906677},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5193977952003479},{"id":"https://openalex.org/keywords/measure","display_name":"Measure (data warehouse)","score":0.5011255741119385},{"id":"https://openalex.org/keywords/simulation-software","display_name":"Simulation software","score":0.46369871497154236},{"id":"https://openalex.org/keywords/system-of-measurement","display_name":"System of measurement","score":0.45828595757484436},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4478040933609009},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4241063594818115},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38518720865249634},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1813352406024933},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.157199889421463},{"id":"https://openalex.org/keywords/optical-fiber","display_name":"Optical fiber","score":0.12309134006500244},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.08918562531471252}],"concepts":[{"id":"https://openalex.org/C41700454","wikidata":"https://www.wikidata.org/wiki/Q1852282","display_name":"Reflection coefficient","level":2,"score":0.8710842728614807},{"id":"https://openalex.org/C65682993","wikidata":"https://www.wikidata.org/wiki/Q1056451","display_name":"Reflection (computer programming)","level":2,"score":0.7353817224502563},{"id":"https://openalex.org/C123657345","wikidata":"https://www.wikidata.org/wiki/Q639055","display_name":"Microstrip","level":2,"score":0.598704993724823},{"id":"https://openalex.org/C187327482","wikidata":"https://www.wikidata.org/wiki/Q580729","display_name":"Optical time-domain reflectometer","level":5,"score":0.5858700275421143},{"id":"https://openalex.org/C99101257","wikidata":"https://www.wikidata.org/wiki/Q1529374","display_name":"Network analyzer (electrical)","level":2,"score":0.541172981262207},{"id":"https://openalex.org/C195266298","wikidata":"https://www.wikidata.org/wiki/Q2165620","display_name":"Scattering parameters","level":2,"score":0.5366973280906677},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5193977952003479},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.5011255741119385},{"id":"https://openalex.org/C91757755","wikidata":"https://www.wikidata.org/wiki/Q11121294","display_name":"Simulation software","level":3,"score":0.46369871497154236},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.45828595757484436},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4478040933609009},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4241063594818115},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38518720865249634},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1813352406024933},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.157199889421463},{"id":"https://openalex.org/C194232370","wikidata":"https://www.wikidata.org/wiki/Q162","display_name":"Optical fiber","level":2,"score":0.12309134006500244},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.08918562531471252},{"id":"https://openalex.org/C113102252","wikidata":"https://www.wikidata.org/wiki/Q5591869","display_name":"Graded-index fiber","level":4,"score":0.0},{"id":"https://openalex.org/C21651689","wikidata":"https://www.wikidata.org/wiki/Q1397427","display_name":"Fiber optic sensor","level":3,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C1276947","wikidata":"https://www.wikidata.org/wiki/Q333","display_name":"Astronomy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vecims.2010.5609339","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vecims.2010.5609339","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 IEEE International Conference on Virtual Environments, Human-Computer Interfaces and Measurement Systems","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1892404517","https://openalex.org/W2078795900","https://openalex.org/W2147955957","https://openalex.org/W2169213177"],"related_works":["https://openalex.org/W2104820912","https://openalex.org/W2003525033","https://openalex.org/W2771182919","https://openalex.org/W2535680364","https://openalex.org/W2150139079","https://openalex.org/W2158451083","https://openalex.org/W2091290925","https://openalex.org/W2044175881","https://openalex.org/W2109804394","https://openalex.org/W2134151099"],"abstract_inverted_index":{"This":[0,16],"technical":[1],"paper":[2],"presents":[3],"a":[4,19,52,84],"simulation":[5,27,46],"of":[6,21,44],"three":[7],"probes":[8],"reflectometer":[9],"system":[10,36],"for":[11],"complex":[12,59],"reflection":[13,60],"coefficient":[14],"measurement.":[15],"involves":[17],"designing":[18],"circuit":[20,54],"Reflectometer":[22,34,93],"using":[23,64],"Genesys":[24],"software.":[25],"The":[26],"results":[28],"and":[29,58,76],"data":[30],"from":[31],"published":[32],"Three-Probe":[33],"measurement":[35],"is":[37],"being":[38],"compared":[39],"to":[40,97],"show":[41],"the":[42,45,49,80],"accuracy":[43],"results.":[47],"Using":[48],"design":[50],"circuit,":[51],"microstrip":[53],"will":[55],"be":[56,95],"fabricated":[57],"coefficients":[61],"were":[62],"measured":[63],"Vector":[65],"Network":[66],"Analyzer":[67],"(VNA).":[68],"A":[69],"comparison":[70],"was":[71],"made":[72],"between":[73,87],"simulations,":[74],"VNA":[75],"publishes":[77],"data.":[78],"From":[79],"comparison,":[81],"it":[82],"shows":[83,90],"close":[85],"agreement":[86],"them.":[88],"It":[89],"that":[91],"Microstrip":[92],"can":[94],"used":[96],"measure":[98],"Complex":[99],"Reflection":[100],"Coefficient.":[101]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}