{"id":"https://openalex.org/W2147429244","doi":"https://doi.org/10.1109/vecims.2005.1567553","title":"A virtual instrument for estimation of optimal calibration intervals by a decision reliability approach","display_name":"A virtual instrument for estimation of optimal calibration intervals by a decision reliability approach","publication_year":2006,"publication_date":"2006-01-18","ids":{"openalex":"https://openalex.org/W2147429244","doi":"https://doi.org/10.1109/vecims.2005.1567553","mag":"2147429244"},"language":"en","primary_location":{"id":"doi:10.1109/vecims.2005.1567553","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vecims.2005.1567553","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Symposium on Virtual Environments, Human-Computer Interfaces and Measurement Systems, 2005.","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061689098","display_name":"Claudio De Capua","orcid":"https://orcid.org/0000-0002-4322-4923"},"institutions":[{"id":"https://openalex.org/I59725666","display_name":"University of Reggio Calabria","ror":"https://ror.org/041sz8d87","country_code":"IT","type":"education","lineage":["https://openalex.org/I59725666"]}],"countries":["IT"],"is_corresponding":true,"raw_author_name":"C. De Capua","raw_affiliation_strings":["Department of Computer Science and Electrical Technologies, University Mediterranea of Reggio Calabria, Reggio Calabria, Italy","Dept. of Comput. Sci. & Electr. Technol., Reggio Calabria Univ. Mediterranea, Italy"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Electrical Technologies, University Mediterranea of Reggio Calabria, Reggio Calabria, Italy","institution_ids":["https://openalex.org/I59725666"]},{"raw_affiliation_string":"Dept. of Comput. Sci. & Electr. Technol., Reggio Calabria Univ. Mediterranea, Italy","institution_ids":["https://openalex.org/I59725666"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002785840","display_name":"Stefano De Falco","orcid":"https://orcid.org/0000-0002-0440-4411"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"S. De Falco","raw_affiliation_strings":["Department of Electrical Engineering, University of Napoli Federico II, Napoli, Italy","[Department of Electrical Engineering, University of Napoli Federico II, Napoli, Italy]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Napoli Federico II, Napoli, Italy","institution_ids":["https://openalex.org/I71267560"]},{"raw_affiliation_string":"[Department of Electrical Engineering, University of Napoli Federico II, Napoli, Italy]","institution_ids":["https://openalex.org/I71267560"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013549141","display_name":"Annalisa Liccardo","orcid":"https://orcid.org/0000-0003-1270-4948"},"institutions":[{"id":"https://openalex.org/I71267560","display_name":"University of Naples Federico II","ror":"https://ror.org/05290cv24","country_code":"IT","type":"education","lineage":["https://openalex.org/I71267560"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"A. Liccardo","raw_affiliation_strings":["Department of Electrical Engineering, University of Napoli Federico II, Napoli, Italy","[Department of Electrical Engineering, University of Napoli Federico II, Napoli, Italy]"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, University of Napoli Federico II, Napoli, Italy","institution_ids":["https://openalex.org/I71267560"]},{"raw_affiliation_string":"[Department of Electrical Engineering, University of Napoli Federico II, Napoli, Italy]","institution_ids":["https://openalex.org/I71267560"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5053886638","display_name":"Rosario Morello","orcid":"https://orcid.org/0000-0002-1706-5789"},"institutions":[{"id":"https://openalex.org/I59725666","display_name":"University of Reggio Calabria","ror":"https://ror.org/041sz8d87","country_code":"IT","type":"education","lineage":["https://openalex.org/I59725666"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"R. Morello","raw_affiliation_strings":["Department of Computer Science and Electrical Technologies, University Mediterranea of Reggio Calabria, Reggio Calabria, Italy","[Department of Computer Science and Electrical Technologies, University Mediterranea of Reggio Calabria, Reggio Calabria, Italy]"],"affiliations":[{"raw_affiliation_string":"Department of Computer Science and Electrical Technologies, University Mediterranea of Reggio Calabria, Reggio Calabria, Italy","institution_ids":["https://openalex.org/I59725666"]},{"raw_affiliation_string":"[Department of Computer Science and Electrical Technologies, University Mediterranea of Reggio Calabria, Reggio Calabria, Italy]","institution_ids":["https://openalex.org/I59725666"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5061689098"],"corresponding_institution_ids":["https://openalex.org/I59725666"],"apc_list":null,"apc_paid":null,"fwci":1.4957,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.85525795,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"5","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T13928","display_name":"Advanced Sensor Technologies Research","score":0.9975000023841858,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12564","display_name":"Sensor Technology and Measurement Systems","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/calibration","display_name":"Calibration","score":0.7873247265815735},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7786432504653931},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.751015305519104},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6803057789802551},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6478432416915894},{"id":"https://openalex.org/keywords/quality-assurance","display_name":"Quality assurance","score":0.5778936743736267},{"id":"https://openalex.org/keywords/interval","display_name":"Interval (graph theory)","score":0.5602152943611145},{"id":"https://openalex.org/keywords/metrology","display_name":"Metrology","score":0.49132242798805237},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.4897044003009796},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"Measurement uncertainty","score":0.45316874980926514},{"id":"https://openalex.org/keywords/tolerance-interval","display_name":"Tolerance interval","score":0.4255947470664978},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.32054269313812256},{"id":"https://openalex.org/keywords/confidence-interval","display_name":"Confidence interval","score":0.219074547290802},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.19313475489616394},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1883130669593811},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.11116328835487366}],"concepts":[{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.7873247265815735},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7786432504653931},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.751015305519104},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6803057789802551},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6478432416915894},{"id":"https://openalex.org/C106436119","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assurance","level":3,"score":0.5778936743736267},{"id":"https://openalex.org/C2778067643","wikidata":"https://www.wikidata.org/wiki/Q166507","display_name":"Interval (graph theory)","level":2,"score":0.5602152943611145},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.49132242798805237},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.4897044003009796},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.45316874980926514},{"id":"https://openalex.org/C10590107","wikidata":"https://www.wikidata.org/wiki/Q7814221","display_name":"Tolerance interval","level":3,"score":0.4255947470664978},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.32054269313812256},{"id":"https://openalex.org/C44249647","wikidata":"https://www.wikidata.org/wiki/Q208498","display_name":"Confidence interval","level":2,"score":0.219074547290802},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.19313475489616394},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1883130669593811},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.11116328835487366},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C2778618615","wikidata":"https://www.wikidata.org/wiki/Q4008393","display_name":"External quality assessment","level":2,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vecims.2005.1567553","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vecims.2005.1567553","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Symposium on Virtual Environments, Human-Computer Interfaces and Measurement Systems, 2005.","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Peace, Justice and strong institutions","score":0.6399999856948853,"id":"https://metadata.un.org/sdg/16"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W2127613131","https://openalex.org/W2161601226","https://openalex.org/W2182524005","https://openalex.org/W2405419031","https://openalex.org/W2496571228","https://openalex.org/W2505397494","https://openalex.org/W2984718987","https://openalex.org/W4285719527","https://openalex.org/W6685706755"],"related_works":["https://openalex.org/W1998546186","https://openalex.org/W2061967405","https://openalex.org/W2174860717","https://openalex.org/W2392646414","https://openalex.org/W3015838480","https://openalex.org/W1980429525","https://openalex.org/W2479895701","https://openalex.org/W1996186540","https://openalex.org/W1963547111","https://openalex.org/W2387705642"],"abstract_inverted_index":{"This":[0],"paper":[1],"leads":[2],"to":[3,10,16,29,43,47,53,77,117,153],"provide":[4],"a":[5,23,39,88],"methodological":[6],"procedure,":[7],"in":[8,146],"order":[9],"establish":[11],"optimal":[12],"calibration":[13,40,60,79,98,142],"intervals":[14],"according":[15,152],"the":[17,31,36,54,65,82,92,95,102,113,124,129,135,141,148,166,169,172],"reference":[18],"standards.":[19],"At":[20],"this":[21],"aim":[22],"virtual":[24],"instrument":[25],"has":[26],"been":[27],"developed":[28],"perform":[30],"proposed":[32,83,160],"procedure.":[33],"Generally":[34],"speaking,":[35],"goal":[37],"of":[38,72,94,97,140,168,174],"process":[41,99,143],"is":[42,109],"reduce":[44],"out-of-tolerance":[45],"occurrences":[46],"an":[48,69,154],"acceptable":[49,155],"level":[50],"with":[51,165],"respect":[52],"desired":[55,119],"quality":[56,177],"target.":[57,158],"The":[58,105,159],"inevitable":[59],"uncertainty":[61,100],"contributions":[62],"can":[63],"affect":[64],"measurement":[66],"capability,":[67],"and":[68,137,171],"inappropriate":[70],"estimation":[71],"these":[73],"aspects":[74],"could":[75],"lead":[76],"incorrect":[78],"intervals.":[80],"So,":[81],"methods":[84],"base":[85],"themselves":[86],"on":[87,101],"statistical":[89,107,136],"procedure":[90],"for":[91,111,176],"evaluation":[93],"impact":[96],"decision":[103,126,156],"risks.":[104],"adopted":[106],"approach":[108],"suitable":[110],"estimating":[112],"maintenance":[114],"time":[115],"needed":[116],"meet":[118],"reliability":[120,157],"goals.":[121],"By":[122],"evaluating":[123],"erroneous":[125],"probabilities":[127],"regarding":[128],"in-tolerance":[130],"state":[131],"within":[132],"fixed":[133],"limits,":[134],"metrological":[138],"features":[139],"take":[144],"part":[145],"computing":[147],"most":[149],"reliable":[150],"interval":[151],"methodology":[161],"presents":[162],"full":[163],"compliance":[164],"standards":[167],"sector":[170],"guidelines":[173],"ISO-9000":[175],"assurance.":[178]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":1},{"year":2014,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}