{"id":"https://openalex.org/W4403277393","doi":"https://doi.org/10.1109/vdat63601.2024.10705736","title":"Surface Drift Debris Segmentation and Visualization through YCbCr Colour Space Thresholding using Low Power FPGA","display_name":"Surface Drift Debris Segmentation and Visualization through YCbCr Colour Space Thresholding using Low Power FPGA","publication_year":2024,"publication_date":"2024-09-01","ids":{"openalex":"https://openalex.org/W4403277393","doi":"https://doi.org/10.1109/vdat63601.2024.10705736"},"language":"en","primary_location":{"id":"doi:10.1109/vdat63601.2024.10705736","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vdat63601.2024.10705736","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 28th International Symposium on VLSI Design and Test (VDAT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108998732","display_name":"Sarath Kumar K","orcid":null},"institutions":[{"id":"https://openalex.org/I876193797","display_name":"Vellore Institute of Technology University","ror":"https://ror.org/00qzypv28","country_code":"IN","type":"education","lineage":["https://openalex.org/I876193797"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Sarath Kumar K","raw_affiliation_strings":["VIT University,School of Electronics Engineering,Vellore,India"],"affiliations":[{"raw_affiliation_string":"VIT University,School of Electronics Engineering,Vellore,India","institution_ids":["https://openalex.org/I876193797"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111048441","display_name":"Akash Iyer","orcid":null},"institutions":[{"id":"https://openalex.org/I876193797","display_name":"Vellore Institute of Technology University","ror":"https://ror.org/00qzypv28","country_code":"IN","type":"education","lineage":["https://openalex.org/I876193797"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Akash Iyer","raw_affiliation_strings":["VIT University,School of Electronics Engineering,Vellore,India"],"affiliations":[{"raw_affiliation_string":"VIT University,School of Electronics Engineering,Vellore,India","institution_ids":["https://openalex.org/I876193797"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113426361","display_name":"Swastik Raj Behera","orcid":null},"institutions":[{"id":"https://openalex.org/I876193797","display_name":"Vellore Institute of Technology University","ror":"https://ror.org/00qzypv28","country_code":"IN","type":"education","lineage":["https://openalex.org/I876193797"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Swastik Raj Behera","raw_affiliation_strings":["VIT University,School of Electronics Engineering,Vellore,India"],"affiliations":[{"raw_affiliation_string":"VIT University,School of Electronics Engineering,Vellore,India","institution_ids":["https://openalex.org/I876193797"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5015077962","display_name":"K. Sivasankaran","orcid":null},"institutions":[{"id":"https://openalex.org/I876193797","display_name":"Vellore Institute of Technology University","ror":"https://ror.org/00qzypv28","country_code":"IN","type":"education","lineage":["https://openalex.org/I876193797"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"K Sivasankaran","raw_affiliation_strings":["VIT University,School of Electronics Engineering,Vellore,India"],"affiliations":[{"raw_affiliation_string":"VIT University,School of Electronics Engineering,Vellore,India","institution_ids":["https://openalex.org/I876193797"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5108998732"],"corresponding_institution_ids":["https://openalex.org/I876193797"],"apc_list":null,"apc_paid":null,"fwci":0.4449,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.63776373,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9787999987602234,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9787999987602234,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9761000275611877,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11301","display_name":"Advanced Surface Polishing Techniques","score":0.9745000004768372,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thresholding","display_name":"Thresholding","score":0.856772780418396},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.6969935297966003},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6331962943077087},{"id":"https://openalex.org/keywords/segmentation","display_name":"Segmentation","score":0.6290512084960938},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6218257546424866},{"id":"https://openalex.org/keywords/ycbcr","display_name":"YCbCr","score":0.6184296607971191},{"id":"https://openalex.org/keywords/visualization","display_name":"Visualization","score":0.6179796457290649},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.5804619193077087},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.5097123980522156},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.41794461011886597},{"id":"https://openalex.org/keywords/space","display_name":"Space (punctuation)","score":0.41120392084121704},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.1859777867794037},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.16384953260421753},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.14593738317489624}],"concepts":[{"id":"https://openalex.org/C191178318","wikidata":"https://www.wikidata.org/wiki/Q2256906","display_name":"Thresholding","level":3,"score":0.856772780418396},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.6969935297966003},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6331962943077087},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.6290512084960938},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6218257546424866},{"id":"https://openalex.org/C2779407163","wikidata":"https://www.wikidata.org/wiki/Q1189998","display_name":"YCbCr","level":5,"score":0.6184296607971191},{"id":"https://openalex.org/C36464697","wikidata":"https://www.wikidata.org/wiki/Q451553","display_name":"Visualization","level":2,"score":0.6179796457290649},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.5804619193077087},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.5097123980522156},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.41794461011886597},{"id":"https://openalex.org/C2778572836","wikidata":"https://www.wikidata.org/wiki/Q380933","display_name":"Space (punctuation)","level":2,"score":0.41120392084121704},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.1859777867794037},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.16384953260421753},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.14593738317489624},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C142616399","wikidata":"https://www.wikidata.org/wiki/Q5148604","display_name":"Color image","level":4,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vdat63601.2024.10705736","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vdat63601.2024.10705736","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 28th International Symposium on VLSI Design and Test (VDAT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1603257402","https://openalex.org/W1969029054","https://openalex.org/W1972544340","https://openalex.org/W2008043556","https://openalex.org/W2077375588","https://openalex.org/W2092572597","https://openalex.org/W2121189958","https://openalex.org/W2613808092","https://openalex.org/W2767045712","https://openalex.org/W2895805893","https://openalex.org/W3004529745","https://openalex.org/W3017097154","https://openalex.org/W3080909375","https://openalex.org/W3124299955","https://openalex.org/W3155448416","https://openalex.org/W3160293551","https://openalex.org/W3163142908","https://openalex.org/W3205096974","https://openalex.org/W4297905664","https://openalex.org/W4312204225","https://openalex.org/W4379031122","https://openalex.org/W4386378026","https://openalex.org/W4387803659","https://openalex.org/W6635332139","https://openalex.org/W6855034547"],"related_works":["https://openalex.org/W2138983844","https://openalex.org/W1968965685","https://openalex.org/W2012792772","https://openalex.org/W2356573839","https://openalex.org/W2111883783","https://openalex.org/W2009028679","https://openalex.org/W2357424838","https://openalex.org/W2327601824","https://openalex.org/W4237142086","https://openalex.org/W2161102362"],"abstract_inverted_index":{"The":[0,120,145,159,186,213],"accumulation":[1],"of":[2,8,150],"oceanic":[3],"debris":[4,26,222],"is":[5,16,104,109,143,154],"a":[6,164,183],"matter":[7],"increasing":[9],"concern":[10],"in":[11,27,99,123,219],"today\u2019s":[12],"world.":[13],"Thus,":[14],"it":[15],"crucial":[17],"to":[18,44,49,65,68,87,130,156,200,216],"develop":[19],"an":[20,95,132,246],"autonomous":[21],"solution":[22],"that":[23,53,84],"can":[24,54],"segment":[25],"real-time":[28],"and":[29,39,51,106,116,177,194],"at":[30,58],"high":[31],"speeds":[32],"while":[33,137],"maintaining":[34],"cost-effectiveness,":[35],"low":[36],"power":[37],"consumption,":[38],"scalability.":[40],"FPGAs":[41],"are":[42,85,128],"well-known":[43],"be":[45,56,66,157,217],"low-power,":[46],"high-speed":[47],"alternatives":[48],"CPUs":[50],"GPUs":[52],"also":[55],"reprogrammed":[57],"the":[59,69,100,125,138,151,175,178,206,210,231,242],"user\u2019s":[60],"convenience,":[61],"allowing":[62],"for":[63,204],"improvements":[64],"made":[67],"system":[70],"easily.":[71],"However,":[72,227],"segmentation":[73],"algorithms":[74,83],"typically":[75],"utilize":[76],"complex":[77],"machine":[78],"learning":[79],"or":[80,240],"image":[81,243],"processing":[82],"difficult":[86],"implement":[88],"effectively":[89],"on":[90,163,174,182],"hardware.":[91],"In":[92],"this":[93],"work,":[94],"algorithm":[96,160,214],"using":[97,111],"thresholding":[98],"YCbCr":[101],"colour":[102,233],"space":[103],"proposed":[105],"its":[107,237],"accuracy":[108,228],"evaluated":[110],"Entropy,":[112],"True":[113,117,140,147],"Positive":[114,141],"Rate,":[115],"Negative":[118,148],"Rate.":[119],"segmented":[121,152],"regions":[122,153],"all":[124],"test":[126],"images":[127],"found":[129,155],"have":[131],"entropy":[133],"greater":[134],"than":[135],"7":[136],"average":[139,146],"Rate":[142,149],"91.14%.":[144],"93.8%.":[158],"was":[161,172,180,189,244],"deployed":[162],"Cyclone":[165],"IV-E":[166],"FPGA":[167,176],"wherein":[168],"live":[169],"camera":[170,207],"feed":[171,208],"processed":[173],"output":[179],"visualized":[181],"VGA":[184,211],"monitor.":[185,212],"overall":[187],"performance":[188],"satisfactory,":[190],"although":[191],"some":[192],"glitches":[193],"jitters":[195],"were":[196],"observed,":[197],"likely":[198],"due":[199],"post-processing":[201],"steps":[202],"required":[203],"integrating":[205],"with":[209],"proved":[215],"robust":[218],"segmenting":[220],"ocean":[221,232],"under":[223],"good":[224],"lighting":[225],"conditions.":[226],"decreased":[229],"when":[230,241],"significantly":[234],"deviated":[235],"from":[236],"expected":[238],"blue":[239],"not":[245],"aerial":[247],"view.":[248]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2025-12-22T23:10:17.713674","created_date":"2025-10-10T00:00:00"}