{"id":"https://openalex.org/W4403276947","doi":"https://doi.org/10.1109/vdat63601.2024.10705718","title":"Design and Analysis of 8T Radiation Hardened SRAM using 65nm Process","display_name":"Design and Analysis of 8T Radiation Hardened SRAM using 65nm Process","publication_year":2024,"publication_date":"2024-09-01","ids":{"openalex":"https://openalex.org/W4403276947","doi":"https://doi.org/10.1109/vdat63601.2024.10705718"},"language":"en","primary_location":{"id":"doi:10.1109/vdat63601.2024.10705718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vdat63601.2024.10705718","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 28th International Symposium on VLSI Design and Test (VDAT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109295379","display_name":"Hari Shanker Gupta","orcid":null},"institutions":[{"id":"https://openalex.org/I1289461252","display_name":"Indian Space Research Organisation","ror":"https://ror.org/00cwrns71","country_code":"IN","type":"government","lineage":["https://openalex.org/I1289461252","https://openalex.org/I3148377317"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Hari Shanker Gupta","raw_affiliation_strings":["ISRO,Space Applications Centre,Ahmedabad,India"],"affiliations":[{"raw_affiliation_string":"ISRO,Space Applications Centre,Ahmedabad,India","institution_ids":["https://openalex.org/I1289461252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108183844","display_name":"Singh Shruti Satyendra","orcid":null},"institutions":[{"id":"https://openalex.org/I1289461252","display_name":"Indian Space Research Organisation","ror":"https://ror.org/00cwrns71","country_code":"IN","type":"government","lineage":["https://openalex.org/I1289461252","https://openalex.org/I3148377317"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Singh Shruti Satyendra","raw_affiliation_strings":["ISRO,Space Applications Centre,Ahmedabad,India"],"affiliations":[{"raw_affiliation_string":"ISRO,Space Applications Centre,Ahmedabad,India","institution_ids":["https://openalex.org/I1289461252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107198712","display_name":"Bhumika Deo","orcid":null},"institutions":[{"id":"https://openalex.org/I1289461252","display_name":"Indian Space Research Organisation","ror":"https://ror.org/00cwrns71","country_code":"IN","type":"government","lineage":["https://openalex.org/I1289461252","https://openalex.org/I3148377317"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Bhumika Deo","raw_affiliation_strings":["ISRO,Space Applications Centre,Ahmedabad,India"],"affiliations":[{"raw_affiliation_string":"ISRO,Space Applications Centre,Ahmedabad,India","institution_ids":["https://openalex.org/I1289461252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108183845","display_name":"Rane Prathamesh Santosh","orcid":null},"institutions":[{"id":"https://openalex.org/I1289461252","display_name":"Indian Space Research Organisation","ror":"https://ror.org/00cwrns71","country_code":"IN","type":"government","lineage":["https://openalex.org/I1289461252","https://openalex.org/I3148377317"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Rane Prathamesh Santosh","raw_affiliation_strings":["ISRO,Space Applications Centre,Ahmedabad,India"],"affiliations":[{"raw_affiliation_string":"ISRO,Space Applications Centre,Ahmedabad,India","institution_ids":["https://openalex.org/I1289461252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108183846","display_name":"Ritesh Khole","orcid":null},"institutions":[{"id":"https://openalex.org/I1289461252","display_name":"Indian Space Research Organisation","ror":"https://ror.org/00cwrns71","country_code":"IN","type":"government","lineage":["https://openalex.org/I1289461252","https://openalex.org/I3148377317"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Ritesh Khole","raw_affiliation_strings":["ISRO,Space Applications Centre,Ahmedabad,India"],"affiliations":[{"raw_affiliation_string":"ISRO,Space Applications Centre,Ahmedabad,India","institution_ids":["https://openalex.org/I1289461252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5108998723","display_name":"Varun Dev Singh","orcid":null},"institutions":[{"id":"https://openalex.org/I1289461252","display_name":"Indian Space Research Organisation","ror":"https://ror.org/00cwrns71","country_code":"IN","type":"government","lineage":["https://openalex.org/I1289461252","https://openalex.org/I3148377317"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Varun Dev Singh","raw_affiliation_strings":["ISRO,Space Applications Centre,Ahmedabad,India"],"affiliations":[{"raw_affiliation_string":"ISRO,Space Applications Centre,Ahmedabad,India","institution_ids":["https://openalex.org/I1289461252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5112373421","display_name":"Nishant Kumar","orcid":"https://orcid.org/0009-0002-6275-1320"},"institutions":[{"id":"https://openalex.org/I1289461252","display_name":"Indian Space Research Organisation","ror":"https://ror.org/00cwrns71","country_code":"IN","type":"government","lineage":["https://openalex.org/I1289461252","https://openalex.org/I3148377317"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Nishant Kumar","raw_affiliation_strings":["ISRO,Space Applications Centre,Ahmedabad,India"],"affiliations":[{"raw_affiliation_string":"ISRO,Space Applications Centre,Ahmedabad,India","institution_ids":["https://openalex.org/I1289461252"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109798527","display_name":"Krish Prakash","orcid":null},"institutions":[{"id":"https://openalex.org/I876193797","display_name":"Vellore Institute of Technology University","ror":"https://ror.org/00qzypv28","country_code":"IN","type":"education","lineage":["https://openalex.org/I876193797"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Krish Prakash","raw_affiliation_strings":["Vellore Institute of Technology Engineering,Vellore,India"],"affiliations":[{"raw_affiliation_string":"Vellore Institute of Technology Engineering,Vellore,India","institution_ids":["https://openalex.org/I876193797"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5109295379"],"corresponding_institution_ids":["https://openalex.org/I1289461252"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15469436,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9919999837875366,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.980400025844574,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9072999954223633,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.6433236002922058},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6231935024261475},{"id":"https://openalex.org/keywords/radiation","display_name":"Radiation","score":0.4387744069099426},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41592156887054443},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.326659619808197},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14974069595336914},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.11835142970085144},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08287584781646729},{"id":"https://openalex.org/keywords/nuclear-physics","display_name":"Nuclear physics","score":0.07487750053405762},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.060299962759017944}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.6433236002922058},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6231935024261475},{"id":"https://openalex.org/C153385146","wikidata":"https://www.wikidata.org/wiki/Q18335","display_name":"Radiation","level":2,"score":0.4387744069099426},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41592156887054443},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.326659619808197},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14974069595336914},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.11835142970085144},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08287584781646729},{"id":"https://openalex.org/C185544564","wikidata":"https://www.wikidata.org/wiki/Q81197","display_name":"Nuclear physics","level":1,"score":0.07487750053405762},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.060299962759017944}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vdat63601.2024.10705718","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vdat63601.2024.10705718","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 28th International Symposium on VLSI Design and Test (VDAT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1969065337","https://openalex.org/W2060447964","https://openalex.org/W2315752188","https://openalex.org/W2906257809","https://openalex.org/W3005230093","https://openalex.org/W3113402283","https://openalex.org/W3157381594","https://openalex.org/W3159287959","https://openalex.org/W4310475701","https://openalex.org/W4312705369","https://openalex.org/W4320031927","https://openalex.org/W4394625161"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W4392590355","https://openalex.org/W3151633427","https://openalex.org/W2212894501","https://openalex.org/W2793465010","https://openalex.org/W3024050170","https://openalex.org/W2109451123","https://openalex.org/W4378977321","https://openalex.org/W1976168335"],"abstract_inverted_index":{"Radiation":[0,61],"hardening":[1,22],"is":[2,23,106],"a":[3,47,86,169],"critical":[4],"consideration":[5],"in":[6,89,119,130,153],"the":[7,27,31,51,101,110,113,131],"design":[8,29,118,146],"of":[9,20,30,53,103,115,155],"reliable":[10],"SRAM":[11,45],"for":[12,172],"space":[13],"and":[14,39,71,77,92,135,164],"other":[15],"high-radiation":[16],"environments.":[17],"The":[18,59,96,144],"effectiveness":[19],"radiation":[21,54,66,83,104,148],"heavily":[24],"dependent":[25],"on":[26,37,56],"layout":[28,57,75,117,133,137],"memory":[32,175],"cells.":[33],"This":[34],"study":[35],"focuses":[36],"designing":[38],"analysing":[40],"an":[41],"8T":[42],"radiation-hardened":[43,120,174],"dual-port":[44],"using":[46],"65nm":[48],"process,":[49],"emphasising":[50],"dependency":[52],"effect":[55],"design.":[58],"Cogenda":[60],"Effect":[62],"Testing":[63],"Tool":[64],"evaluated":[65],"tolerance,":[67,84],"providing":[68],"robust":[69],"simulation":[70,97],"testing":[72],"capabilities.":[73],"Various":[74],"designs":[76],"techniques":[78],"were":[79,126,142],"explored":[80],"to":[81],"enhance":[82],"showing":[85],"substantial":[87],"reduction":[88],"error":[90],"rates":[91],"improved":[93],"reliability":[94],"metrics.":[95],"results":[98],"imply":[99],"that":[100],"performance":[102,152],"tolerance":[105],"predominantly":[107],"governed":[108],"by":[109],"layout,":[111],"highlighting":[112],"importance":[114],"meticulous":[116],"SRAM.":[121],"At":[122],"100":[123],"MeV,":[124],"there":[125],"30":[127],"data":[128,140],"flips":[129,141],"initial":[132],"design,":[134],"after":[136],"optimisation,":[138],"3":[139],"achieved.":[143],"optimised":[145],"regarding":[147],"effects":[149],"exhibits":[150],"superior":[151],"terms":[154],"speed":[156],"with":[157],"less":[158],"than":[159],"5ns":[160],"read-out":[161],"access":[162],"time":[163],"area":[165],"efficiency,":[166],"making":[167],"it":[168],"viable":[170],"solution":[171],"next-generation":[173],"applications.":[176]},"counts_by_year":[],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}