{"id":"https://openalex.org/W4403276985","doi":"https://doi.org/10.1109/vdat63601.2024.10705694","title":"Classification Algorithm for VLSI Test Cost Reduction","display_name":"Classification Algorithm for VLSI Test Cost Reduction","publication_year":2024,"publication_date":"2024-09-01","ids":{"openalex":"https://openalex.org/W4403276985","doi":"https://doi.org/10.1109/vdat63601.2024.10705694"},"language":"en","primary_location":{"id":"doi:10.1109/vdat63601.2024.10705694","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vdat63601.2024.10705694","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 28th International Symposium on VLSI Design and Test (VDAT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108183858","display_name":"Farook Basha Shaik","orcid":null},"institutions":[{"id":"https://openalex.org/I91277730","display_name":"Maulana Azad National Institute of Technology","ror":"https://ror.org/026vtd268","country_code":"IN","type":"education","lineage":["https://openalex.org/I91277730"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Farook Basha Shaik","raw_affiliation_strings":["Maulana Azad National Institute of Technology,Department of Electronics and Communication Engineering,Bhopal,India"],"affiliations":[{"raw_affiliation_string":"Maulana Azad National Institute of Technology,Department of Electronics and Communication Engineering,Bhopal,India","institution_ids":["https://openalex.org/I91277730"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012487492","display_name":"Manish Kashyap","orcid":"https://orcid.org/0000-0001-6951-8447"},"institutions":[{"id":"https://openalex.org/I91277730","display_name":"Maulana Azad National Institute of Technology","ror":"https://ror.org/026vtd268","country_code":"IN","type":"education","lineage":["https://openalex.org/I91277730"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Manish Kashyap","raw_affiliation_strings":["Maulana Azad National Institute of Technology,Department of Electronics and Communication Engineering,Bhopal,India"],"affiliations":[{"raw_affiliation_string":"Maulana Azad National Institute of Technology,Department of Electronics and Communication Engineering,Bhopal,India","institution_ids":["https://openalex.org/I91277730"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5108183858"],"corresponding_institution_ids":["https://openalex.org/I91277730"],"apc_list":null,"apc_paid":null,"fwci":0.5198,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.6439423,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9873999953269958,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9354000091552734,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/very-large-scale-integration","display_name":"Very-large-scale integration","score":0.8048563003540039},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6666631698608398},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.6494553089141846},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5368919968605042},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.4929828345775604},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.42934781312942505},{"id":"https://openalex.org/keywords/cost-reduction","display_name":"Cost reduction","score":0.4293321669101715},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.3492114841938019},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.1578386425971985},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14983916282653809},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13374894857406616},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.12186658382415771},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.0714239776134491}],"concepts":[{"id":"https://openalex.org/C14580979","wikidata":"https://www.wikidata.org/wiki/Q876049","display_name":"Very-large-scale integration","level":2,"score":0.8048563003540039},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6666631698608398},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.6494553089141846},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5368919968605042},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.4929828345775604},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.42934781312942505},{"id":"https://openalex.org/C2778820799","wikidata":"https://www.wikidata.org/wiki/Q3454688","display_name":"Cost reduction","level":2,"score":0.4293321669101715},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.3492114841938019},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.1578386425971985},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14983916282653809},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13374894857406616},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.12186658382415771},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0714239776134491},{"id":"https://openalex.org/C187736073","wikidata":"https://www.wikidata.org/wiki/Q2920921","display_name":"Management","level":1,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vdat63601.2024.10705694","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vdat63601.2024.10705694","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 28th International Symposium on VLSI Design and Test (VDAT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1592689466","https://openalex.org/W1991391827","https://openalex.org/W2033291878","https://openalex.org/W2085654583","https://openalex.org/W2129892046","https://openalex.org/W2135046866","https://openalex.org/W2152406824","https://openalex.org/W2295544414","https://openalex.org/W2329154899","https://openalex.org/W2737237150","https://openalex.org/W2806040491","https://openalex.org/W2936814106","https://openalex.org/W2960983555","https://openalex.org/W3048751444","https://openalex.org/W3196301423","https://openalex.org/W4283078504","https://openalex.org/W6676078075"],"related_works":["https://openalex.org/W2131559056","https://openalex.org/W4254560580","https://openalex.org/W2127167802","https://openalex.org/W2080984854","https://openalex.org/W4384785625","https://openalex.org/W1627397376","https://openalex.org/W1979716082","https://openalex.org/W4242594920","https://openalex.org/W2812758604","https://openalex.org/W2087637582"],"abstract_inverted_index":{"To":[0],"find":[1],"and":[2,36,52,98,120],"fix":[3],"flaws":[4],"in":[5,68,83,107],"products":[6],"before":[7],"they":[8],"are":[9,28,74,126],"distributed":[10],"to":[11,21,38,46,93,114],"customers,":[12],"Integrated":[13],"Circuits":[14],"(ICs)":[15],"must":[16],"be":[17,112],"tested.":[18],"In":[19,91],"order":[20,92],"accomplish":[22],"this,":[23],"several":[24],"Test":[25,33,55,79,87],"Patterns":[26],"(TP)":[27],"generated":[29],"using":[30,128],"the":[31,64,78,86,95,100],"Automatic":[32],"Pattern":[34],"Generator":[35],"applied":[37],"detect":[39],"errors":[40,60],"or":[41],"defects.":[42],"It":[43],"is":[44],"easy":[45],"implement":[47],"this":[48,108],"classic":[49],"test":[50,71],"approach":[51],"produces":[53],"excellent":[54],"Quality":[56],"(TQ)":[57],"with":[58],"most":[59],"found.":[61],"But":[62],"when":[63],"circuit":[65],"gets":[66],"smaller":[67],"size,":[69],"more":[70],"patterns":[72,97,117],"(TPs)":[73],"needed,":[75],"which":[76],"raises":[77,85],"Time":[80],"(TT)":[81],"and,":[82],"turn,":[84],"Cost":[88],"(TC)":[89],"significantly.":[90],"choose":[94],"valid":[96,119],"reduce":[99],"TT,":[101],"we":[102],"present":[103],"a":[104],"classification":[105],"model":[106],"paper":[109],"that":[110],"can":[111],"utilized":[113],"categorize":[115],"these":[116],"into":[118],"invalid":[121],"patterns.":[122],"Machine":[123],"learning":[124],"algorithms":[125],"written":[127],"scikit-learn":[129],"Python":[130],"library.":[131]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-27T23:08:20.325037","created_date":"2025-10-10T00:00:00"}