{"id":"https://openalex.org/W4406860685","doi":"https://doi.org/10.1109/vcip63160.2024.10849909","title":"KonIQ-10k-LT: Overcoming Score Priors in Blind Image Quality Assessment Under Imbalanced Distributions","display_name":"KonIQ-10k-LT: Overcoming Score Priors in Blind Image Quality Assessment Under Imbalanced Distributions","publication_year":2024,"publication_date":"2024-12-08","ids":{"openalex":"https://openalex.org/W4406860685","doi":"https://doi.org/10.1109/vcip63160.2024.10849909"},"language":"en","primary_location":{"id":"doi:10.1109/vcip63160.2024.10849909","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vcip63160.2024.10849909","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Visual Communications and Image Processing (VCIP)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5081609627","display_name":"Desen Yuan","orcid":null},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Desen Yuan","raw_affiliation_strings":["University of Electronic Science and Technology of China"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100435921","display_name":"Lei Wang","orcid":"https://orcid.org/0000-0002-4230-9490"},"institutions":[{"id":"https://openalex.org/I150229711","display_name":"University of Electronic Science and Technology of China","ror":"https://ror.org/04qr3zq92","country_code":"CN","type":"education","lineage":["https://openalex.org/I150229711"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lei Wang","raw_affiliation_strings":["University of Electronic Science and Technology of China"],"affiliations":[{"raw_affiliation_string":"University of Electronic Science and Technology of China","institution_ids":["https://openalex.org/I150229711"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5081609627"],"corresponding_institution_ids":["https://openalex.org/I150229711"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.39485153,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9914000034332275,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10688","display_name":"Image and Signal Denoising Methods","score":0.9887999892234802,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11165","display_name":"Image and Video Quality Assessment","score":0.9847999811172485,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/prior-probability","display_name":"Prior probability","score":0.8273614048957825},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5850210189819336},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.5599981546401978},{"id":"https://openalex.org/keywords/image-quality","display_name":"Image quality","score":0.5490713715553284},{"id":"https://openalex.org/keywords/quality-score","display_name":"Quality Score","score":0.5166616439819336},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.5081143379211426},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4703279435634613},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.4552236795425415},{"id":"https://openalex.org/keywords/quality-assessment","display_name":"Quality assessment","score":0.4120733141899109},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.3605495095252991},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3437519073486328},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.29533651471138},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.20266857743263245},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.1200094223022461},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.08421891927719116},{"id":"https://openalex.org/keywords/evaluation-methods","display_name":"Evaluation methods","score":0.08278676867485046},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.07253715395927429}],"concepts":[{"id":"https://openalex.org/C177769412","wikidata":"https://www.wikidata.org/wiki/Q278090","display_name":"Prior probability","level":3,"score":0.8273614048957825},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5850210189819336},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.5599981546401978},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.5490713715553284},{"id":"https://openalex.org/C2779346075","wikidata":"https://www.wikidata.org/wiki/Q7268763","display_name":"Quality Score","level":3,"score":0.5166616439819336},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.5081143379211426},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4703279435634613},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.4552236795425415},{"id":"https://openalex.org/C3020001037","wikidata":"https://www.wikidata.org/wiki/Q836575","display_name":"Quality assessment","level":3,"score":0.4120733141899109},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.3605495095252991},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3437519073486328},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.29533651471138},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.20266857743263245},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.1200094223022461},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08421891927719116},{"id":"https://openalex.org/C3018395757","wikidata":"https://www.wikidata.org/wiki/Q1379672","display_name":"Evaluation methods","level":2,"score":0.08278676867485046},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.07253715395927429},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vcip63160.2024.10849909","is_oa":false,"landing_page_url":"https://doi.org/10.1109/vcip63160.2024.10849909","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2024 IEEE International Conference on Visual Communications and Image Processing (VCIP)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W1555168845","https://openalex.org/W1574447377","https://openalex.org/W1903029394","https://openalex.org/W1977725648","https://openalex.org/W2051596736","https://openalex.org/W2129644086","https://openalex.org/W2162692770","https://openalex.org/W2194775991","https://openalex.org/W2754213847","https://openalex.org/W2768340063","https://openalex.org/W2905544033","https://openalex.org/W3002992380","https://openalex.org/W3022710784","https://openalex.org/W3034882073","https://openalex.org/W3047945973","https://openalex.org/W3194280054","https://openalex.org/W4224267514","https://openalex.org/W4392903172","https://openalex.org/W4392910311","https://openalex.org/W4393078930","https://openalex.org/W4403791637","https://openalex.org/W4406612399","https://openalex.org/W6637373629","https://openalex.org/W6743767099","https://openalex.org/W6859221037"],"related_works":["https://openalex.org/W3194862240","https://openalex.org/W4206325381","https://openalex.org/W2804751933","https://openalex.org/W2295706819","https://openalex.org/W2245293081","https://openalex.org/W2161907179","https://openalex.org/W2043597472","https://openalex.org/W54224318","https://openalex.org/W1973829424","https://openalex.org/W2466958844"],"abstract_inverted_index":{"Blind":[0],"Image":[1],"Quality":[2],"Assessment":[3],"(BIQA)":[4],"is":[5],"essential":[6],"in":[7,31,75,90,97],"computational":[8],"vision":[9],"for":[10],"predicting":[11],"the":[12,34,54,65,76,84,91,98,112,117,121,125,146,158,163],"visual":[13],"quality":[14,39,69,88],"of":[15,37,67,86,108,151,167],"digital":[16],"images":[17],"without":[18],"reference":[19],"counterparts.":[20],"Despite":[21],"advancements":[22],"through":[23],"convolutional":[24],"neural":[25],"networks":[26],"(CNNs),":[27],"a":[28,104,134,141],"significant":[29,105],"challenge":[30,122],"BIQA":[32,109,152,168],"remains":[33],"long-tail":[35,126],"distribution":[36,66],"image":[38,68],"scores,":[40],"leading":[41],"to":[42,57,71,116,144],"biased":[43],"training":[44,77,92],"and":[45,78,148,165],"reduced":[46],"model":[47],"generalization.":[48],"To":[49,128],"address":[50],"this,":[51],"we":[52,132],"restructured":[53],"KonIQ-10k":[55],"dataset":[56,114],"create":[58],"an":[59],"imbalanced":[60],"version":[61],"named":[62],"KonIQ-10k-LT,":[63],"manipulating":[64],"scores":[70,89],"have":[72],"opposing":[73],"distributions":[74],"validation":[79,99],"sets.":[80],"This":[81],"restructuring":[82],"increases":[83],"proportion":[85],"certain":[87],"set":[93],"while":[94],"decreasing":[95],"them":[96],"set.":[100],"Experimental":[101],"results":[102],"show":[103],"performance":[106,164],"decline":[107],"models":[110,169],"on":[111],"KonIQ-10k-LT":[113],"compared":[115],"original":[118],"KonIQ-10k,":[119],"highlighting":[120],"posed":[123],"by":[124],"distribution.":[127],"mitigate":[129],"this":[130],"issue,":[131],"propose":[133],"Proportion":[135],"Weighted":[136],"Balancing":[137],"(PWB)":[138],"method":[139,161],"as":[140],"baseline,":[142],"designed":[143],"enhance":[145],"robustness":[147],"generalization":[149],"ability":[150],"models.":[153],"Our":[154],"findings":[155],"demonstrate":[156],"that":[157],"proposed":[159],"WB":[160],"improves":[162],"reliability":[166],"under":[170],"these":[171],"challenging":[172],"conditions.":[173]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}