{"id":"https://openalex.org/W4385270528","doi":"https://doi.org/10.1109/uv56588.2022.10185477","title":"Research and Development of Intelligent Tests and a Process Design System for Complex and Precision Parts of Electronic Products","display_name":"Research and Development of Intelligent Tests and a Process Design System for Complex and Precision Parts of Electronic Products","publication_year":2022,"publication_date":"2022-10-22","ids":{"openalex":"https://openalex.org/W4385270528","doi":"https://doi.org/10.1109/uv56588.2022.10185477"},"language":"en","primary_location":{"id":"doi:10.1109/uv56588.2022.10185477","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/uv56588.2022.10185477","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 6th International Conference on Universal Village (UV)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100411112","display_name":"Ling Chen","orcid":"https://orcid.org/0000-0002-4595-6028"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Ling Chen","raw_affiliation_strings":["School of Mechanical Engineering Sichuan Universuty,Chengdu,China","School of Mechanical Engineering Sichuan Universuty, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering Sichuan Universuty,Chengdu,China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"School of Mechanical Engineering Sichuan Universuty, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028190003","display_name":"Yaman Wang","orcid":null},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yaman Wang","raw_affiliation_strings":["School of Mechanical Engineering Sichuan Universuty,Chengdu,China","School of Mechanical Engineering Sichuan Universuty, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering Sichuan Universuty,Chengdu,China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"School of Mechanical Engineering Sichuan Universuty, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020684165","display_name":"Yuchen Long","orcid":null},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yuchen Long","raw_affiliation_strings":["School of Mechanical Engineering Sichuan Universuty,Chengdu,China","School of Mechanical Engineering Sichuan Universuty, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering Sichuan Universuty,Chengdu,China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"School of Mechanical Engineering Sichuan Universuty, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074008658","display_name":"Zengfeng Duan","orcid":null},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zengfeng Duan","raw_affiliation_strings":["Sichuan University,School of Mechanical Engineering,Chengdu,China","School of Mechanical Engineering, Sichuan University, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"Sichuan University,School of Mechanical Engineering,Chengdu,China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"School of Mechanical Engineering, Sichuan University, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100324124","display_name":"Yanyan Li","orcid":"https://orcid.org/0000-0002-1784-9735"},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yanyan Li","raw_affiliation_strings":["School of Mechanical Engineering Sichuan Universuty,Chengdu,China","School of Mechanical Engineering Sichuan Universuty, Chengdu, China"],"affiliations":[{"raw_affiliation_string":"School of Mechanical Engineering Sichuan Universuty,Chengdu,China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"School of Mechanical Engineering Sichuan Universuty, Chengdu, China","institution_ids":["https://openalex.org/I24185976"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100411112"],"corresponding_institution_ids":["https://openalex.org/I24185976"],"apc_list":null,"apc_paid":null,"fwci":0.1353,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.58179327,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9890000224113464,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9861999750137329,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6448257565498352},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.6346030235290527},{"id":"https://openalex.org/keywords/xml","display_name":"XML","score":0.5823804140090942},{"id":"https://openalex.org/keywords/table","display_name":"Table (database)","score":0.5479698777198792},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.48840707540512085},{"id":"https://openalex.org/keywords/manufacturing-engineering","display_name":"Manufacturing engineering","score":0.38472995162010193},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.37677115201950073},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3446611762046814},{"id":"https://openalex.org/keywords/database","display_name":"Database","score":0.2886080741882324},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.22707459330558777},{"id":"https://openalex.org/keywords/world-wide-web","display_name":"World Wide Web","score":0.10148468613624573}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6448257565498352},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.6346030235290527},{"id":"https://openalex.org/C8797682","wikidata":"https://www.wikidata.org/wiki/Q2115","display_name":"XML","level":2,"score":0.5823804140090942},{"id":"https://openalex.org/C45235069","wikidata":"https://www.wikidata.org/wiki/Q278425","display_name":"Table (database)","level":2,"score":0.5479698777198792},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.48840707540512085},{"id":"https://openalex.org/C117671659","wikidata":"https://www.wikidata.org/wiki/Q11049265","display_name":"Manufacturing engineering","level":1,"score":0.38472995162010193},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.37677115201950073},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3446611762046814},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.2886080741882324},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.22707459330558777},{"id":"https://openalex.org/C136764020","wikidata":"https://www.wikidata.org/wiki/Q466","display_name":"World Wide Web","level":1,"score":0.10148468613624573},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/uv56588.2022.10185477","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/uv56588.2022.10185477","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2022 6th International Conference on Universal Village (UV)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.6100000143051147,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W2001967228","https://openalex.org/W2016747596","https://openalex.org/W2017637081","https://openalex.org/W2025763227","https://openalex.org/W2042566747","https://openalex.org/W2048366052","https://openalex.org/W2520345362","https://openalex.org/W2754430901","https://openalex.org/W2789535851","https://openalex.org/W2804237162","https://openalex.org/W2895800622","https://openalex.org/W2950211799","https://openalex.org/W3003952471","https://openalex.org/W3035503619","https://openalex.org/W3036558612","https://openalex.org/W3047423625","https://openalex.org/W3128434951","https://openalex.org/W3134839980","https://openalex.org/W4200401030","https://openalex.org/W6662609112"],"related_works":["https://openalex.org/W4394360958","https://openalex.org/W2948670949","https://openalex.org/W4288047943","https://openalex.org/W4394193569","https://openalex.org/W1797990060","https://openalex.org/W4232484699","https://openalex.org/W2473636215","https://openalex.org/W4242025311","https://openalex.org/W2990655940","https://openalex.org/W2478535484"],"abstract_inverted_index":{"Complex":[0],"precision":[1],"parts":[2],"of":[3,57,149,168,171],"electronic":[4,22,60,161],"products":[5,23,61,162,174],"are":[6],"essential":[7],"to":[8,26,33,77,92],"defense":[9],"information":[10],"technology":[11,148],"equipment":[12],"and":[13,37,48,51,71,73,104,137,165],"the":[14,55,94,108,119,123,129,146,154,166,190],"manufacturing":[15],"industry.":[16],"The":[17,97,185],"workshop":[18,198],"testing":[19],"process":[20,42,56,65,88,95,151,157],"for":[21,142,159,196],"is":[24,30,44,69,75,90,152,163,180],"crucial":[25],"ensuring":[27],"their":[28],"quality":[29],"qualified.":[31],"Due":[32],"its":[34,40],"multi-breed,":[35],"multi-batch,":[36],"complex":[38,52,59,160],"structure,":[39],"experimental":[41],"design":[43],"challenged":[45],"by":[46,80,189],"more":[47,49],"indicators":[50,103,121],"processes.":[53],"Currently,":[54],"detecting":[58],"still":[62],"adopts":[63],"manual":[64,81],"document":[66],"design,":[67],"which":[68],"inefficient":[70],"inconsistent,":[72],"it":[74],"difficult":[76],"guarantee":[78],"accuracy":[79],"experience.":[82],"Therefore,":[83],"a":[84,176],"new":[85],"intelligent":[86,155],"test":[87,102,120,124,130,140,156,186],"method":[89,98],"designed":[91],"complete":[93],"design.":[96],"first":[99],"automatically":[100,117,127],"extracts":[101],"related":[105],"parameters":[106,131],"from":[107],"imported":[109],"unstructured":[110],"technical":[111],"files":[112],"or":[113],"sop":[114],"files,":[115],"then":[116,126,135],"matches":[118],"with":[122],"table,":[125],"fills":[128],"under":[132],"each":[133,143,150],"index,":[134],"clusters":[136],"outputs":[138],"XML":[139],"procedures":[141],"indicator.":[144],"Moreover,":[145],"key":[147],"studied,":[153],"system":[158,191],"developed,":[164],"application":[167],"one":[169],"model":[170],"microwave":[172],"component":[173],"in":[175],"military":[177],"industry":[178],"enterprise":[179],"used":[181,195],"as":[182],"an":[183],"example.":[184],"program":[187],"generated":[188],"can":[192],"be":[193],"directly":[194],"subsequent":[197],"machine":[199],"execution.":[200]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-03-25T13:04:00.132906","created_date":"2025-10-10T00:00:00"}