{"id":"https://openalex.org/W2767118521","doi":"https://doi.org/10.1109/tvt.2017.2765670","title":"Analytical and Experimental Evaluation of SiC-Inverter Nonlinearities for Traction Drives Used in Electric Vehicles","display_name":"Analytical and Experimental Evaluation of SiC-Inverter Nonlinearities for Traction Drives Used in Electric Vehicles","publication_year":2017,"publication_date":"2017-10-23","ids":{"openalex":"https://openalex.org/W2767118521","doi":"https://doi.org/10.1109/tvt.2017.2765670","mag":"2767118521"},"language":"en","primary_location":{"id":"doi:10.1109/tvt.2017.2765670","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvt.2017.2765670","pdf_url":null,"source":{"id":"https://openalex.org/S10936095","display_name":"IEEE Transactions on Vehicular Technology","issn_l":"0018-9545","issn":["0018-9545","1939-9359"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Vehicular Technology","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://dspace.lib.cranfield.ac.uk/handle/1826/13124","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5075349146","display_name":"Xiaofeng Ding","orcid":"https://orcid.org/0000-0003-1116-0678"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiaofeng Ding","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-1116-0678","affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103271705","display_name":"Min Du","orcid":"https://orcid.org/0000-0003-2939-0703"},"institutions":[{"id":"https://openalex.org/I15089104","display_name":"China Aerospace Science and Industry Corporation (China)","ror":"https://ror.org/0523vvf33","country_code":"CN","type":"company","lineage":["https://openalex.org/I15089104"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Min Du","raw_affiliation_strings":["Servo Technology Institute of China Aerospace Science and Industry Corporation, Nanjing Chenguang Group Company, Ltd., Nanjing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Servo Technology Institute of China Aerospace Science and Industry Corporation, Nanjing Chenguang Group Company, Ltd., Nanjing, China","institution_ids":["https://openalex.org/I15089104"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011709217","display_name":"Chongwei Duan","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chongwei Duan","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068159119","display_name":"Hong Guo","orcid":"https://orcid.org/0000-0002-9798-520X"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong Guo","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041924424","display_name":"Rui Xiong","orcid":"https://orcid.org/0000-0003-4608-7597"},"institutions":[{"id":"https://openalex.org/I125839683","display_name":"Beijing Institute of Technology","ror":"https://ror.org/01skt4w74","country_code":"CN","type":"education","lineage":["https://openalex.org/I125839683","https://openalex.org/I890469752"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rui Xiong","raw_affiliation_strings":["National Engineering Laboratory for Electric Vehicles, Beijing Institute of Technology, Beijing, China"],"raw_orcid":"https://orcid.org/0000-0003-4608-7597","affiliations":[{"raw_affiliation_string":"National Engineering Laboratory for Electric Vehicles, Beijing Institute of Technology, Beijing, China","institution_ids":["https://openalex.org/I125839683"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100416694","display_name":"Jinquan Xu","orcid":"https://orcid.org/0000-0003-3278-9395"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinquan Xu","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5088769817","display_name":"Jiawei Cheng","orcid":"https://orcid.org/0000-0003-4445-2642"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiawei Cheng","raw_affiliation_strings":["School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5006692139","display_name":"P.C.K. Luk","orcid":"https://orcid.org/0000-0002-0459-7081"},"institutions":[{"id":"https://openalex.org/I82284825","display_name":"Cranfield University","ror":"https://ror.org/05cncd958","country_code":"GB","type":"education","lineage":["https://openalex.org/I82284825"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Patrick Chi kwong Luk","raw_affiliation_strings":["Power Engineering Centre, Cranfield University, Cranfield, U.K"],"raw_orcid":"https://orcid.org/0000-0002-0459-7081","affiliations":[{"raw_affiliation_string":"Power Engineering Centre, Cranfield University, Cranfield, U.K","institution_ids":["https://openalex.org/I82284825"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":8,"corresponding_author_ids":["https://openalex.org/A5075349146"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":7.4528,"has_fulltext":false,"cited_by_count":135,"citation_normalized_percentile":{"value":0.97716178,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":99,"max":100},"biblio":{"volume":"67","issue":"1","first_page":"146","last_page":"159"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10175","display_name":"Advanced DC-DC Converters","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.738052487373352},{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.7085840702056885},{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.637704610824585},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5786372423171997},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5624661445617676},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.5041667222976685},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5015614032745361},{"id":"https://openalex.org/keywords/voltage-drop","display_name":"Voltage drop","score":0.5015134811401367},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.4495696425437927},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43670719861984253},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.4246552288532257},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.41788449883461},{"id":"https://openalex.org/keywords/pulse-width-modulation","display_name":"Pulse-width modulation","score":0.4117138385772705},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.289411336183548},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.094032883644104}],"concepts":[{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.738052487373352},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.7085840702056885},{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.637704610824585},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5786372423171997},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5624661445617676},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5041667222976685},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5015614032745361},{"id":"https://openalex.org/C82178898","wikidata":"https://www.wikidata.org/wiki/Q166839","display_name":"Voltage drop","level":3,"score":0.5015134811401367},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.4495696425437927},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43670719861984253},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.4246552288532257},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.41788449883461},{"id":"https://openalex.org/C92746544","wikidata":"https://www.wikidata.org/wiki/Q585184","display_name":"Pulse-width modulation","level":3,"score":0.4117138385772705},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.289411336183548},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.094032883644104},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/tvt.2017.2765670","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvt.2017.2765670","pdf_url":null,"source":{"id":"https://openalex.org/S10936095","display_name":"IEEE Transactions on Vehicular Technology","issn_l":"0018-9545","issn":["0018-9545","1939-9359"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Vehicular Technology","raw_type":"journal-article"},{"id":"pmh:oai:dspace.lib.cranfield.ac.uk:1826/13124","is_oa":true,"landing_page_url":"http://dspace.lib.cranfield.ac.uk/handle/1826/13124","pdf_url":null,"source":{"id":"https://openalex.org/S4306401778","display_name":"CERES (Cranfield University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I82284825","host_organization_name":"Cranfield University","host_organization_lineage":["https://openalex.org/I82284825"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":{"id":"pmh:oai:dspace.lib.cranfield.ac.uk:1826/13124","is_oa":true,"landing_page_url":"http://dspace.lib.cranfield.ac.uk/handle/1826/13124","pdf_url":null,"source":{"id":"https://openalex.org/S4306401778","display_name":"CERES (Cranfield University)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I82284825","host_organization_name":"Cranfield University","host_organization_lineage":["https://openalex.org/I82284825"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc","license_id":"https://openalex.org/licenses/cc-by-nc","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"},"sustainable_development_goals":[{"score":0.8299999833106995,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[{"id":"https://openalex.org/G21564512","display_name":null,"funder_award_id":"51407004","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G5081899566","display_name":null,"funder_award_id":"20162851016","funder_id":"https://openalex.org/F4320322857","funder_display_name":"Aeronautical Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320320343","display_name":"Cranfield University","ror":"https://ror.org/05cncd958"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321125","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56"},{"id":"https://openalex.org/F4320322857","display_name":"Aeronautical Science Foundation of China","ror":"https://ror.org/02wq41p38"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":40,"referenced_works":["https://openalex.org/W1531122334","https://openalex.org/W1962222009","https://openalex.org/W1964535485","https://openalex.org/W1975722594","https://openalex.org/W1981431838","https://openalex.org/W1989151762","https://openalex.org/W2000042776","https://openalex.org/W2000444945","https://openalex.org/W2022004297","https://openalex.org/W2022924319","https://openalex.org/W2026373241","https://openalex.org/W2029424205","https://openalex.org/W2045887335","https://openalex.org/W2055531267","https://openalex.org/W2075651883","https://openalex.org/W2077717608","https://openalex.org/W2087881916","https://openalex.org/W2087948710","https://openalex.org/W2089358609","https://openalex.org/W2096760328","https://openalex.org/W2136220673","https://openalex.org/W2142785957","https://openalex.org/W2147283595","https://openalex.org/W2150276919","https://openalex.org/W2155645544","https://openalex.org/W2159537490","https://openalex.org/W2160656970","https://openalex.org/W2167359475","https://openalex.org/W2170737699","https://openalex.org/W2174456835","https://openalex.org/W2180449530","https://openalex.org/W2217723108","https://openalex.org/W2219501311","https://openalex.org/W2261452446","https://openalex.org/W2333091939","https://openalex.org/W2472698299","https://openalex.org/W2560912739","https://openalex.org/W2592024364","https://openalex.org/W6641237028","https://openalex.org/W6734465828"],"related_works":["https://openalex.org/W2187095416","https://openalex.org/W2123056991","https://openalex.org/W1548482929","https://openalex.org/W3113574893","https://openalex.org/W1918297947","https://openalex.org/W3095945597","https://openalex.org/W1541648135","https://openalex.org/W2992708993","https://openalex.org/W2527190599","https://openalex.org/W2718041186"],"abstract_inverted_index":{"This":[0],"paper":[1],"investigates":[2],"the":[3,40,64,72,83,98,104,113,123,127,133,140,146,151,156,169,178,201,206],"inverter":[4,41,117],"nonlinearities":[5],"in":[6,71,112,132],"a":[7,34,75,78,183,197],"drive":[8,135,171,181,208],"system":[9,136],"based":[10],"on":[11],"silicon":[12,27],"carbide":[13],"metal-oxide-semiconductor":[14],"field-effect":[15],"transistor":[16,30],"(SiC-mosfets)":[17],"and":[18,52,60,88,110,129,158,190],"compares":[19],"its":[20,166,186,210],"performance":[21,142,218],"with":[22],"that":[23,122],"of":[24,39,63,82,97,107,126,154,185,205],"an":[25],"equivalent":[26],"insulated-gate":[28],"bipolar":[29],"(Si-IGBT)":[31],"system.":[32],"Initially,":[33],"novel":[35],"comprehensive":[36,217],"analytical":[37],"model":[38,76,148],"voltage":[42,48,61,86,174,192],"distortion":[43,175],"is":[44,89,143,213],"developed.":[45],"Not":[46],"only":[47],"drops,":[49],"dead":[50],"time,":[51],"output":[53,85],"capacitance,":[54],"but":[55],"also":[56],"switching":[57,105,141,188],"delay":[58],"times":[59,189],"overshoot":[62],"power":[65],"devices":[66,131],"are":[67,118,137],"taken":[68],"into":[69,145],"account":[70],"model.":[73],"Such":[74],"yields":[77],"more":[79],"accurate":[80],"prediction":[81],"inverter's":[84],"distortion,":[87],"validated":[90],"by":[91,216],"experimentation.":[92],"Due":[93],"to":[94,149,177],"inherent":[95],"shortcomings":[96],"commonly":[99],"used":[100],"double":[101],"pulse":[102,114],"test,":[103],"characteristics":[106],"both":[108,155],"SiC-mosfets":[109],"Si-IGBTs":[111],"width":[115],"modulation":[116],"tested":[119],"instead,":[120],"such":[121],"actual":[124],"performances":[125],"SiC":[128],"Si":[130],"motor":[134],"examined.":[138],"Then,":[139],"incorporated":[144],"physical":[147],"quantify":[150],"distorted":[152],"voltages":[153],"SiC-based":[157,170,207],"Si-based":[159,180,211],"systems.":[160],"The":[161],"results":[162],"show":[163],"that,":[164],"despite":[165],"existing":[167],"nonlinearities,":[168],"has":[172],"lower":[173],"compared":[176],"conventional":[179],"as":[182,194,196],"result":[184],"shorter":[187],"smaller":[191],"drop,":[193],"well":[195],"higher":[198],"efficiency.":[199],"Finally,":[200],"overriding":[202],"operational":[203],"advantages":[204],"over":[209],"counterpart":[212],"fully":[214],"demonstrated":[215],"comparisons.":[219]},"counts_by_year":[{"year":2026,"cited_by_count":5},{"year":2025,"cited_by_count":11},{"year":2024,"cited_by_count":16},{"year":2023,"cited_by_count":19},{"year":2022,"cited_by_count":15},{"year":2021,"cited_by_count":18},{"year":2020,"cited_by_count":23},{"year":2019,"cited_by_count":12},{"year":2018,"cited_by_count":16}],"updated_date":"2026-05-22T09:01:20.584952","created_date":"2025-10-10T00:00:00"}