{"id":"https://openalex.org/W2114350776","doi":"https://doi.org/10.1109/tvt.2010.2089998","title":"Outage Probability for Dual-Hop Relaying Systems With Multiple Interferers Over Rayleigh Fading Channels","display_name":"Outage Probability for Dual-Hop Relaying Systems With Multiple Interferers Over Rayleigh Fading Channels","publication_year":2010,"publication_date":"2010-11-09","ids":{"openalex":"https://openalex.org/W2114350776","doi":"https://doi.org/10.1109/tvt.2010.2089998","mag":"2114350776"},"language":"en","primary_location":{"id":"doi:10.1109/tvt.2010.2089998","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvt.2010.2089998","pdf_url":null,"source":{"id":"https://openalex.org/S10936095","display_name":"IEEE Transactions on Vehicular Technology","issn_l":"0018-9545","issn":["0018-9545","1939-9359"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Vehicular Technology","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100640624","display_name":"Dongwoo Lee","orcid":"https://orcid.org/0000-0001-7186-9772"},"institutions":[{"id":"https://openalex.org/I118373667","display_name":"Seoul National University of Science and Technology","ror":"https://ror.org/00chfja07","country_code":"KR","type":"education","lineage":["https://openalex.org/I118373667"]},{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Dongwoo Lee","raw_affiliation_strings":["Department of Electrical Engineering and Institute of New Media and Communications, Seoul National University of Technology, Seoul, South Korea","Dept. of Electr. Eng., Seoul Nat. Univ., Seoul, South Korea#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Institute of New Media and Communications, Seoul National University of Technology, Seoul, South Korea","institution_ids":["https://openalex.org/I118373667"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Seoul Nat. Univ., Seoul, South Korea#TAB#","institution_ids":["https://openalex.org/I139264467"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100705624","display_name":"Jaehong Lee","orcid":"https://orcid.org/0000-0002-5056-829X"},"institutions":[{"id":"https://openalex.org/I118373667","display_name":"Seoul National University of Science and Technology","ror":"https://ror.org/00chfja07","country_code":"KR","type":"education","lineage":["https://openalex.org/I118373667"]},{"id":"https://openalex.org/I139264467","display_name":"Seoul National University","ror":"https://ror.org/04h9pn542","country_code":"KR","type":"education","lineage":["https://openalex.org/I139264467"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jae Hong Lee","raw_affiliation_strings":["Department of Electrical Engineering and Institute of New Media and Communications, Seoul National University of Technology, Seoul, South Korea","Dept. of Electr. Eng., Seoul Nat. Univ., Seoul, South Korea#TAB#"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering and Institute of New Media and Communications, Seoul National University of Technology, Seoul, South Korea","institution_ids":["https://openalex.org/I118373667"]},{"raw_affiliation_string":"Dept. of Electr. Eng., Seoul Nat. Univ., Seoul, South Korea#TAB#","institution_ids":["https://openalex.org/I139264467"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":24.1288,"has_fulltext":false,"cited_by_count":132,"citation_normalized_percentile":{"value":0.99708898,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":100},"biblio":{"volume":"60","issue":"1","first_page":"333","last_page":"338"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10796","display_name":"Cooperative Communication and Network Coding","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10796","display_name":"Cooperative Communication and Network Coding","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12791","display_name":"Full-Duplex Wireless Communications","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11458","display_name":"Advanced Wireless Communication Technologies","score":0.9922000169754028,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/rayleigh-fading","display_name":"Rayleigh fading","score":0.8420307636260986},{"id":"https://openalex.org/keywords/outage-probability","display_name":"Outage probability","score":0.6758548617362976},{"id":"https://openalex.org/keywords/fading","display_name":"Fading","score":0.6544883251190186},{"id":"https://openalex.org/keywords/hop","display_name":"Hop (telecommunications)","score":0.5940124988555908},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5747775435447693},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.5631985068321228},{"id":"https://openalex.org/keywords/weibull-fading","display_name":"Weibull fading","score":0.5420646667480469},{"id":"https://openalex.org/keywords/dual","display_name":"Dual (grammatical number)","score":0.44947168231010437},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.43633538484573364},{"id":"https://openalex.org/keywords/spread-spectrum","display_name":"Spread spectrum","score":0.4162848889827728},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.40348076820373535},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.356711208820343},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3212006688117981},{"id":"https://openalex.org/keywords/channel","display_name":"Channel (broadcasting)","score":0.28348684310913086},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2785909175872803},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2354101836681366},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.20392000675201416},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.13288530707359314}],"concepts":[{"id":"https://openalex.org/C56985126","wikidata":"https://www.wikidata.org/wiki/Q854039","display_name":"Rayleigh fading","level":4,"score":0.8420307636260986},{"id":"https://openalex.org/C2778258436","wikidata":"https://www.wikidata.org/wiki/Q30672262","display_name":"Outage probability","level":4,"score":0.6758548617362976},{"id":"https://openalex.org/C81978471","wikidata":"https://www.wikidata.org/wiki/Q1196572","display_name":"Fading","level":3,"score":0.6544883251190186},{"id":"https://openalex.org/C25906391","wikidata":"https://www.wikidata.org/wiki/Q1432381","display_name":"Hop (telecommunications)","level":2,"score":0.5940124988555908},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5747775435447693},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.5631985068321228},{"id":"https://openalex.org/C64834810","wikidata":"https://www.wikidata.org/wiki/Q7979802","display_name":"Weibull fading","level":5,"score":0.5420646667480469},{"id":"https://openalex.org/C2780980858","wikidata":"https://www.wikidata.org/wiki/Q110022","display_name":"Dual (grammatical number)","level":2,"score":0.44947168231010437},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43633538484573364},{"id":"https://openalex.org/C105344744","wikidata":"https://www.wikidata.org/wiki/Q958957","display_name":"Spread spectrum","level":3,"score":0.4162848889827728},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.40348076820373535},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.356711208820343},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3212006688117981},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.28348684310913086},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2785909175872803},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2354101836681366},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.20392000675201416},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.13288530707359314},{"id":"https://openalex.org/C124952713","wikidata":"https://www.wikidata.org/wiki/Q8242","display_name":"Literature","level":1,"score":0.0},{"id":"https://openalex.org/C142362112","wikidata":"https://www.wikidata.org/wiki/Q735","display_name":"Art","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tvt.2010.2089998","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tvt.2010.2089998","pdf_url":null,"source":{"id":"https://openalex.org/S10936095","display_name":"IEEE Transactions on Vehicular Technology","issn_l":"0018-9545","issn":["0018-9545","1939-9359"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Vehicular Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W604181985","https://openalex.org/W1522045078","https://openalex.org/W1972485395","https://openalex.org/W1987058923","https://openalex.org/W2046245205","https://openalex.org/W2120448104","https://openalex.org/W2124994726","https://openalex.org/W2126349519","https://openalex.org/W2133149827","https://openalex.org/W2137965246","https://openalex.org/W2139825184","https://openalex.org/W2148963518","https://openalex.org/W2150079203","https://openalex.org/W2152121970","https://openalex.org/W2152205538","https://openalex.org/W2170422354","https://openalex.org/W2171743949","https://openalex.org/W2493309683","https://openalex.org/W2801179766","https://openalex.org/W4300223101"],"related_works":["https://openalex.org/W135017867","https://openalex.org/W2054938695","https://openalex.org/W2042719834","https://openalex.org/W2383712747","https://openalex.org/W2000785219","https://openalex.org/W1971142975","https://openalex.org/W2245051870","https://openalex.org/W2156975859","https://openalex.org/W4210382895","https://openalex.org/W2114350776"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"analyze":[4],"the":[5,26,30,48,62,66],"dual-hop":[6,31,67],"amplify-and-forward":[7],"(AF)":[8],"and":[9,33,60,69],"decode-and-forward":[10],"(DF)":[11],"relaying":[12,35,71],"systems":[13,36,72],"with":[14,37,56,73],"multiple":[15,38,74],"interferers":[16],"over":[17],"Rayleigh":[18],"fading":[19],"channels.":[20],"We":[21],"derive":[22],"closed-form":[23],"expressions":[24],"for":[25],"outage":[27,63],"probability":[28],"of":[29,50,65],"AF":[32,68],"DF":[34,70],"interferers,":[39],"which":[40],"have":[41],"arbitrary":[42],"transmit":[43],"power.":[44],"Numerical":[45],"results":[46],"verify":[47],"validity":[49],"our":[51],"theoretical":[52],"analysis":[53],"by":[54],"comparison":[55],"Monte":[57],"Carlo":[58],"simulations":[59],"compare":[61],"probabilities":[64],"interferers.":[75]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2019,"cited_by_count":4},{"year":2018,"cited_by_count":2},{"year":2017,"cited_by_count":8},{"year":2016,"cited_by_count":6},{"year":2015,"cited_by_count":13},{"year":2014,"cited_by_count":22},{"year":2013,"cited_by_count":22},{"year":2012,"cited_by_count":30}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}